{"id":"https://openalex.org/W2163386336","doi":"https://doi.org/10.1109/tim.2010.2045934","title":"Wet Gas Metering Using a Revised Venturi Meter and Soft-Computing Approximation Techniques","display_name":"Wet Gas Metering Using a Revised Venturi Meter and Soft-Computing Approximation Techniques","publication_year":2011,"publication_date":"2011-01-03","ids":{"openalex":"https://openalex.org/W2163386336","doi":"https://doi.org/10.1109/tim.2010.2045934","mag":"2163386336"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2010.2045934","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2045934","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043551995","display_name":"Lijun Xu","orcid":"https://orcid.org/0000-0003-0488-9604"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lijun Xu","raw_affiliation_strings":["School of Instrument Science and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Instrument Science and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066611468","display_name":"Wanlu Zhou","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wanlu Zhou","raw_affiliation_strings":["School of Instrument Science and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Instrument Science and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101635377","display_name":"Xiaomin Li","orcid":"https://orcid.org/0000-0001-7202-6865"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaomin Li","raw_affiliation_strings":["School of Chemistry and Environment, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Chemistry and Environment, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049221109","display_name":"Shaliang Tang","orcid":null},"institutions":[{"id":"https://openalex.org/I2800970254","display_name":"State Intellectual Property Office","ror":"https://ror.org/00zrjgm10","country_code":"CN","type":"government","lineage":["https://openalex.org/I2800970254"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shaliang Tang","raw_affiliation_strings":["Patent Examination Cooperation Center, State Intellectual Property Office, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Patent Examination Cooperation Center, State Intellectual Property Office, Beijing, China","institution_ids":["https://openalex.org/I2800970254"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.3125,"has_fulltext":false,"cited_by_count":57,"citation_normalized_percentile":{"value":0.93410368,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"60","issue":"3","first_page":"947","last_page":"956"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11220","display_name":"Water Systems and Optimization","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/venturi-effect","display_name":"Venturi effect","score":0.9387515783309937},{"id":"https://openalex.org/keywords/metering-mode","display_name":"Metering mode","score":0.611640214920044},{"id":"https://openalex.org/keywords/wet-gas","display_name":"Wet gas","score":0.4638206362724304},{"id":"https://openalex.org/keywords/flow-measurement","display_name":"Flow measurement","score":0.45703259110450745},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3505755364894867},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3113998770713806},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.2811737060546875},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.24344074726104736},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23781853914260864},{"id":"https://openalex.org/keywords/mechanics","display_name":"Mechanics","score":0.22856637835502625}],"concepts":[{"id":"https://openalex.org/C21423434","wikidata":"https://www.wikidata.org/wiki/Q725699","display_name":"Venturi effect","level":3,"score":0.9387515783309937},{"id":"https://openalex.org/C30905978","wikidata":"https://www.wikidata.org/wiki/Q815598","display_name":"Metering mode","level":2,"score":0.611640214920044},{"id":"https://openalex.org/C170977613","wikidata":"https://www.wikidata.org/wiki/Q7990014","display_name":"Wet gas","level":2,"score":0.4638206362724304},{"id":"https://openalex.org/C16302685","wikidata":"https://www.wikidata.org/wiki/Q15091623","display_name":"Flow measurement","level":2,"score":0.45703259110450745},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3505755364894867},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3113998770713806},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.2811737060546875},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.24344074726104736},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23781853914260864},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.22856637835502625},{"id":"https://openalex.org/C201289731","wikidata":"https://www.wikidata.org/wiki/Q1172599","display_name":"Inlet","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2010.2045934","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2045934","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1563088657","https://openalex.org/W1602878425","https://openalex.org/W1923199176","https://openalex.org/W1973538748","https://openalex.org/W1975375657","https://openalex.org/W1986693304","https://openalex.org/W1987345571","https://openalex.org/W2002509590","https://openalex.org/W2011230380","https://openalex.org/W2017222247","https://openalex.org/W2035173428","https://openalex.org/W2038956554","https://openalex.org/W2040187035","https://openalex.org/W2044441209","https://openalex.org/W2052623596","https://openalex.org/W2055571659","https://openalex.org/W2058797908","https://openalex.org/W2076703302","https://openalex.org/W2098324282","https://openalex.org/W2153635508","https://openalex.org/W2170938240","https://openalex.org/W2577383146","https://openalex.org/W6636153159"],"related_works":["https://openalex.org/W2273878258","https://openalex.org/W2040187035","https://openalex.org/W2372097265","https://openalex.org/W103191185","https://openalex.org/W2391727779","https://openalex.org/W1518678420","https://openalex.org/W2943718173","https://openalex.org/W1981693650","https://openalex.org/W2396677880","https://openalex.org/W2031362611"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"a":[3,17,168,183],"novel":[4],"approach":[5],"is":[6,46,104,167],"presented":[7],"to":[8,50,56,173],"the":[9,36,44,51,57,61,66,69,74,80,87,93,97,107,175],"measurement":[10],"of":[11,39,60,73,101,109,132,139,151,177],"wet":[12,40,102,178],"gas":[13,41,103,135,179],"flows":[14],"by":[15,28,181],"using":[16,29],"throat-extended":[18],"Venturi":[19,75,88,185],"meter":[20,186],"(TEVM)":[21],"and":[22,68,83,96,116,146,170,187],"soft-computing":[23,188],"approximation":[24,121,189],"techniques.":[25,122,190],"Results":[26],"obtained":[27],"an":[30],"industrial-scale":[31],"test":[32,125],"rig":[33],"suggest":[34],"that":[35,165],"flow":[37,99,136,148],"rate":[38,137,149],"flowing":[42],"in":[43],"TEVM":[45],"related":[47],"not":[48],"only":[49],"static":[52,81,129],"features":[53,59,95],"but":[54],"also":[55],"dynamic":[58],"differential":[62],"pressures":[63],"(DPs)":[64],"across":[65],"converging":[67],"extended":[70],"throat":[71],"sections":[72],"meter,":[76],"as":[77,79],"well":[78],"pressure":[82,130],"temperature":[84],"signals":[85],"within":[86,128],"meter.":[89],"The":[90,123],"relation":[91],"between":[92],"signal":[94],"gas/liquid":[98],"rates":[100],"established":[105],"through":[106],"use":[108],"backpropagation":[110],"(BP)":[111],"artificial":[112],"neural":[113],"network":[114],"(ANN)":[115],"support":[117],"vector":[118],"machine":[119],"(SVM)":[120],"experimental":[124],"carried":[126],"out":[127],"range":[131,138,150],"0.3-0.8":[133],"MPa,":[134],"0.0139-0.0444":[140],"m":[141,159],"<sup":[142,155,160],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[143,156,161],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">3</sup>":[144,162],"/s,":[145],"liquid":[147],"3.0556":[152],"\u00d7":[153],"10":[154],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-4</sup>":[157],"-0.0015":[158],"/s":[163],"suggested":[164],"it":[166],"cost-effective":[169],"viable":[171],"method":[172],"solve":[174],"problem":[176],"metering":[180],"combining":[182],"revised":[184]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":9},{"year":2021,"cited_by_count":10},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}
