{"id":"https://openalex.org/W2101916945","doi":"https://doi.org/10.1109/tim.2010.2045255","title":"Electrical Capacitance Tomography for Sensors of Square Cross Sections Using Calderon's Method","display_name":"Electrical Capacitance Tomography for Sensors of Square Cross Sections Using Calderon's Method","publication_year":2011,"publication_date":"2011-01-03","ids":{"openalex":"https://openalex.org/W2101916945","doi":"https://doi.org/10.1109/tim.2010.2045255","mag":"2101916945"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2010.2045255","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2045255","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100635854","display_name":"Zhang Cao","orcid":"https://orcid.org/0000-0003-3649-9512"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhang Cao","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","[Sch. of Instrum. & Opto-Electron. Eng., Beihang Univ., Beijing, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"[Sch. of Instrum. & Opto-Electron. Eng., Beihang Univ., Beijing, China]","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043551995","display_name":"Lijun Xu","orcid":"https://orcid.org/0000-0003-0488-9604"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lijun Xu","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","[Sch. of Instrum. & Opto-Electron. Eng., Beihang Univ., Beijing, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"[Sch. of Instrum. & Opto-Electron. Eng., Beihang Univ., Beijing, China]","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048227952","display_name":"Wenru Fan","orcid":"https://orcid.org/0000-0002-4979-2542"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenru Fan","raw_affiliation_strings":["School of Electrical Engineering and Automation, Tianjin University, TJU, Tianjin, China","[Sch. of Electr. Eng. & Autom., Tianjin Univ., Tianjin, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Tianjin University, TJU, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]},{"raw_affiliation_string":"[Sch. of Electr. Eng. & Autom., Tianjin Univ., Tianjin, China]","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060150695","display_name":"Huaxiang Wang","orcid":"https://orcid.org/0000-0003-1584-6925"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huaxiang Wang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Tianjin University, TJU, Tianjin, China","[Sch. of Electr. Eng. & Autom., Tianjin Univ., Tianjin, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Tianjin University, TJU, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]},{"raw_affiliation_string":"[Sch. of Electr. Eng. & Autom., Tianjin Univ., Tianjin, China]","institution_ids":["https://openalex.org/I162868743"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.994,"has_fulltext":false,"cited_by_count":61,"citation_normalized_percentile":{"value":0.94074996,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"60","issue":"3","first_page":"900","last_page":"907"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9908000230789185,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10572","display_name":"Geophysical and Geoelectrical Methods","score":0.9865000247955322,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-capacitance-tomography","display_name":"Electrical capacitance tomography","score":0.8000962734222412},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.7419542074203491},{"id":"https://openalex.org/keywords/conformal-map","display_name":"Conformal map","score":0.6976016759872437},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.5528200268745422},{"id":"https://openalex.org/keywords/square","display_name":"Square (algebra)","score":0.5484840869903564},{"id":"https://openalex.org/keywords/cross-section","display_name":"Cross section (physics)","score":0.5022554397583008},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.5006868839263916},{"id":"https://openalex.org/keywords/legendre-polynomials","display_name":"Legendre polynomials","score":0.4894775152206421},{"id":"https://openalex.org/keywords/quadrature","display_name":"Quadrature (astronomy)","score":0.47523167729377747},{"id":"https://openalex.org/keywords/iterative-method","display_name":"Iterative method","score":0.4711405634880066},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.4447682499885559},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.4352450370788574},{"id":"https://openalex.org/keywords/transformation","display_name":"Transformation (genetics)","score":0.431963711977005},{"id":"https://openalex.org/keywords/scattering","display_name":"Scattering","score":0.4243814945220947},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.40956783294677734},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.39836621284484863},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.32246577739715576},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.31986409425735474},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.25065743923187256},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.17501887679100037}],"concepts":[{"id":"https://openalex.org/C2777418626","wikidata":"https://www.wikidata.org/wiki/Q2584887","display_name":"Electrical capacitance tomography","level":4,"score":0.8000962734222412},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.7419542074203491},{"id":"https://openalex.org/C98214594","wikidata":"https://www.wikidata.org/wiki/Q850275","display_name":"Conformal map","level":2,"score":0.6976016759872437},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.5528200268745422},{"id":"https://openalex.org/C135692309","wikidata":"https://www.wikidata.org/wiki/Q111124","display_name":"Square (algebra)","level":2,"score":0.5484840869903564},{"id":"https://openalex.org/C52234038","wikidata":"https://www.wikidata.org/wiki/Q17128025","display_name":"Cross section (physics)","level":2,"score":0.5022554397583008},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.5006868839263916},{"id":"https://openalex.org/C111458787","wikidata":"https://www.wikidata.org/wiki/Q215405","display_name":"Legendre polynomials","level":2,"score":0.4894775152206421},{"id":"https://openalex.org/C62869609","wikidata":"https://www.wikidata.org/wiki/Q28137","display_name":"Quadrature (astronomy)","level":2,"score":0.47523167729377747},{"id":"https://openalex.org/C159694833","wikidata":"https://www.wikidata.org/wiki/Q2321565","display_name":"Iterative method","level":2,"score":0.4711405634880066},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.4447682499885559},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4352450370788574},{"id":"https://openalex.org/C204241405","wikidata":"https://www.wikidata.org/wiki/Q461499","display_name":"Transformation (genetics)","level":3,"score":0.431963711977005},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.4243814945220947},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.40956783294677734},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.39836621284484863},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.32246577739715576},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.31986409425735474},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.25065743923187256},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.17501887679100037},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2010.2045255","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2045255","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11","score":0.6700000166893005}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W293134060","https://openalex.org/W1539023944","https://openalex.org/W1561072951","https://openalex.org/W1964406344","https://openalex.org/W1967026935","https://openalex.org/W1970258005","https://openalex.org/W1973645318","https://openalex.org/W1979724394","https://openalex.org/W2000241688","https://openalex.org/W2005007987","https://openalex.org/W2021662804","https://openalex.org/W2035142958","https://openalex.org/W2049772201","https://openalex.org/W2051007404","https://openalex.org/W2054192842","https://openalex.org/W2071548265","https://openalex.org/W2073138109","https://openalex.org/W2088751297","https://openalex.org/W2138248326","https://openalex.org/W2149516019","https://openalex.org/W2153527995","https://openalex.org/W2164021019","https://openalex.org/W2166828770","https://openalex.org/W2169573886","https://openalex.org/W2335426297","https://openalex.org/W2489460495","https://openalex.org/W2798922842","https://openalex.org/W3038515387"],"related_works":["https://openalex.org/W2170544729","https://openalex.org/W2090093661","https://openalex.org/W2031832834","https://openalex.org/W2097442821","https://openalex.org/W2157674401","https://openalex.org/W1974104633","https://openalex.org/W1519688086","https://openalex.org/W2021076685","https://openalex.org/W2058033086","https://openalex.org/W2045604881"],"abstract_inverted_index":{"Calderon's":[0,55,104,137],"method":[1,56,105,138],"was":[2,68,114],"generalized":[3],"to":[4,70,78,116],"electrical":[5],"capacitance":[6],"tomography":[7],"(ECT)":[8],"for":[9,36,57,84],"sensors":[10],"of":[11,23,47,87,98,132,136,144],"square":[12,88],"cross":[13,60,89,146],"sections":[14],"in":[15,45,103,139],"this":[16],"paper.":[17],"It":[18],"is":[19,34],"a":[20,48,58,72,75,79,85,118,142],"direct":[21],"algorithm":[22],"image":[24,37,122],"reconstruction,":[25],"as":[26],"neither":[27],"matrix":[28],"inversion":[29],"nor":[30],"an":[31],"iterative":[32],"process":[33],"required":[35,53],"reconstruction.":[38,123],"Since":[39],"the":[40,93,99,128,133],"major":[41],"calculations":[42,52],"are":[43,62],"implemented":[44],"terms":[46],"circular":[49,76],"region,":[50],"complicated":[51],"by":[54,91],"noncircular":[59,145],"section":[61,90],"avoided.":[63],"A":[64],"unique":[65],"conformal":[66,94],"transformation":[67],"used":[69,102],"establish":[71],"map":[73],"from":[74],"region":[77],"square.":[80],"Results":[81],"were":[82,106],"obtained":[83],"sensor":[86,143],"using":[92],"transformation.":[95],"Two":[96],"approximations":[97],"scattering":[100],"transform":[101],"compared":[107],"with":[108,141],"simulated":[109],"data.":[110],"The":[111,124],"Gauss-Legendre":[112],"quadrature":[113],"applied":[115],"provide":[117],"fast-speed":[119],"and":[120,130],"high-quality":[121],"reconstructed":[125],"results":[126],"validated":[127],"feasibility":[129],"effectiveness":[131],"proposed":[134],"treatment":[135],"ECT":[140],"section.":[147]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":12},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":5},{"year":2013,"cited_by_count":6},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}