{"id":"https://openalex.org/W2151382730","doi":"https://doi.org/10.1109/tim.2009.2038031","title":"Broadband Dielectric Measurements on Highly Scattering Materials","display_name":"Broadband Dielectric Measurements on Highly Scattering Materials","publication_year":2010,"publication_date":"2010-04-08","ids":{"openalex":"https://openalex.org/W2151382730","doi":"https://doi.org/10.1109/tim.2009.2038031","mag":"2151382730"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2009.2038031","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2038031","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079300387","display_name":"Zijing Li","orcid":null},"institutions":[{"id":"https://openalex.org/I121934306","display_name":"Tufts University","ror":"https://ror.org/05wvpxv85","country_code":"US","type":"education","lineage":["https://openalex.org/I121934306"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Zijing Li","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Tufts University, Medford, MA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Tufts University, Medford, MA, USA","institution_ids":["https://openalex.org/I121934306"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011648196","display_name":"Anjali Sharma","orcid":"https://orcid.org/0000-0001-5915-9516"},"institutions":[{"id":"https://openalex.org/I121934306","display_name":"Tufts University","ror":"https://ror.org/05wvpxv85","country_code":"US","type":"education","lineage":["https://openalex.org/I121934306"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Anjali Sharma","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Tufts University, Medford, MA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Tufts University, Medford, MA, USA","institution_ids":["https://openalex.org/I121934306"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102225305","display_name":"Ana I. Medina Ayala","orcid":null},"institutions":[{"id":"https://openalex.org/I121934306","display_name":"Tufts University","ror":"https://ror.org/05wvpxv85","country_code":"US","type":"education","lineage":["https://openalex.org/I121934306"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ana I. Medina Ayala","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Tufts University, Medford, MA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Tufts University, Medford, MA, USA","institution_ids":["https://openalex.org/I121934306"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101825678","display_name":"Mohammed N. Afsar","orcid":"https://orcid.org/0000-0003-2527-369X"},"institutions":[{"id":"https://openalex.org/I121934306","display_name":"Tufts University","ror":"https://ror.org/05wvpxv85","country_code":"US","type":"education","lineage":["https://openalex.org/I121934306"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mohammed N. Afsar","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Tufts University, Medford, MA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Tufts University, Medford, MA, USA","institution_ids":["https://openalex.org/I121934306"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022656800","display_name":"Konstantin A. Korolev","orcid":"https://orcid.org/0000-0003-1031-3767"},"institutions":[{"id":"https://openalex.org/I121934306","display_name":"Tufts University","ror":"https://ror.org/05wvpxv85","country_code":"US","type":"education","lineage":["https://openalex.org/I121934306"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Konstantin A. Korolev","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Tufts University, Medford, MA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Tufts University, Medford, MA, USA","institution_ids":["https://openalex.org/I121934306"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5079300387"],"corresponding_institution_ids":["https://openalex.org/I121934306"],"apc_list":null,"apc_paid":null,"fwci":0.5773,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.73622754,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"59","issue":"5","first_page":"1397","last_page":"1405"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13493","display_name":"Optical and Acousto-Optic Technologies","score":0.9828000068664551,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.9685999751091003,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7338951826095581},{"id":"https://openalex.org/keywords/permittivity","display_name":"Permittivity","score":0.7105994820594788},{"id":"https://openalex.org/keywords/scattering","display_name":"Scattering","score":0.7074293494224548},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.6697068810462952},{"id":"https://openalex.org/keywords/transmittance","display_name":"Transmittance","score":0.654802680015564},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.6231739521026611},{"id":"https://openalex.org/keywords/scattering-parameters","display_name":"Scattering parameters","score":0.5773817896842957},{"id":"https://openalex.org/keywords/refractive-index","display_name":"Refractive index","score":0.5302098989486694},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.4847126007080078},{"id":"https://openalex.org/keywords/light-scattering","display_name":"Light scattering","score":0.46027493476867676},{"id":"https://openalex.org/keywords/reflection","display_name":"Reflection (computer programming)","score":0.44824135303497314},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.36654922366142273},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1675432026386261},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12213605642318726},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.056549906730651855}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7338951826095581},{"id":"https://openalex.org/C168651791","wikidata":"https://www.wikidata.org/wiki/Q211569","display_name":"Permittivity","level":3,"score":0.7105994820594788},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.7074293494224548},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.6697068810462952},{"id":"https://openalex.org/C150493377","wikidata":"https://www.wikidata.org/wiki/Q1427863","display_name":"Transmittance","level":2,"score":0.654802680015564},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.6231739521026611},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.5773817896842957},{"id":"https://openalex.org/C42067758","wikidata":"https://www.wikidata.org/wiki/Q174102","display_name":"Refractive index","level":2,"score":0.5302098989486694},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.4847126007080078},{"id":"https://openalex.org/C120456961","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Light scattering","level":3,"score":0.46027493476867676},{"id":"https://openalex.org/C65682993","wikidata":"https://www.wikidata.org/wiki/Q1056451","display_name":"Reflection (computer programming)","level":2,"score":0.44824135303497314},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.36654922366142273},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1675432026386261},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12213605642318726},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.056549906730651855},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2009.2038031","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2038031","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W211346643","https://openalex.org/W564100251","https://openalex.org/W1971885473","https://openalex.org/W1987264996","https://openalex.org/W2003001693","https://openalex.org/W2033350670","https://openalex.org/W2037778251","https://openalex.org/W2045276693","https://openalex.org/W2059715317","https://openalex.org/W2073182742","https://openalex.org/W2073613815","https://openalex.org/W2091020479","https://openalex.org/W2096678748","https://openalex.org/W2102087142","https://openalex.org/W2112703961","https://openalex.org/W2124692022","https://openalex.org/W2124832229","https://openalex.org/W2132854763","https://openalex.org/W2151224241","https://openalex.org/W2154682424","https://openalex.org/W2175282456","https://openalex.org/W2229329335","https://openalex.org/W2293775899","https://openalex.org/W2988805500","https://openalex.org/W3039083618","https://openalex.org/W6643194445"],"related_works":["https://openalex.org/W1623591443","https://openalex.org/W1506814581","https://openalex.org/W2045577588","https://openalex.org/W2608117473","https://openalex.org/W2018139810","https://openalex.org/W2165585480","https://openalex.org/W2794932361","https://openalex.org/W4321376593","https://openalex.org/W2034633965","https://openalex.org/W2006415218"],"abstract_inverted_index":{"Dielectric":[0],"properties":[1],"of":[2,72,78,81,106,116],"highly":[3,82],"scattering":[4,83,90,94],"dyed":[5,84],"corn":[6,85,98],"meal":[7,86,99],"have":[8,55,101],"been":[9,33,56,102,121],"studied":[10],"in":[11],"broadband":[12,50],"microwave":[13],"and":[14,23,41,52,62,65,69,92],"millimeter-wave":[15],"frequency":[16],"ranges":[17],"from":[18,24],"3.95":[19],"to":[20,26,58,112],"12.4":[21],"GHz":[22],"34":[25],"120":[27],"GHz.":[28],"Complex":[29],"dielectric":[30,73],"permittivity":[31,80],"has":[32,119],"obtained":[34],"using":[35],"a":[36,42,97],"free-space":[37],"quasi-optical":[38],"spectroscopy":[39],"technique":[40],"standard":[43],"waveguide":[44],"transmission/reflection":[45],"(T/R)":[46],"calibration":[47],"method.":[48],"The":[49,75],"transmittance":[51],"reflectance":[53],"spectra":[54],"recorded":[57],"yield":[59],"the":[60,67,93,114],"refractive":[61],"absorption":[63],"index":[64],"calculate":[66],"real":[68],"imaginary":[70],"parts":[71],"permittivity.":[74],"density":[76],"dependence":[77],"complex":[79],"is":[87],"presented.":[88],"Different":[89],"mechanisms":[91],"model":[95],"for":[96],"material":[100],"discussed.":[103],"Detailed":[104],"analysis":[105],"measurement":[107],"uncertainties,":[108],"including":[109],"instrumentation":[110],"errors,":[111],"manifest":[113],"accuracy":[115],"both":[117],"techniques,":[118],"also":[120],"performed.":[122]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}