{"id":"https://openalex.org/W2143244737","doi":"https://doi.org/10.1109/tim.2009.2034582","title":"A Fully Integrated Built-In Self-Test $\\Sigma{-}\\Delta$ ADC Based on the Modified Controlled Sine-Wave Fitting Procedure","display_name":"A Fully Integrated Built-In Self-Test $\\Sigma{-}\\Delta$ ADC Based on the Modified Controlled Sine-Wave Fitting Procedure","publication_year":2009,"publication_date":"2009-12-16","ids":{"openalex":"https://openalex.org/W2143244737","doi":"https://doi.org/10.1109/tim.2009.2034582","mag":"2143244737"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2009.2034582","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2034582","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108047268","display_name":"Hao-Chiao Hong","orcid":"https://orcid.org/0000-0003-0757-1001"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Hao-Chiao Hong","raw_affiliation_strings":["Department of Electrical Engineering, National Chiao Tung University, Hsinchu, Taiwan","Dept. of Electr. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan#TAB#","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111953273","display_name":"Fang-Yi Su","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Fang-Yi Su","raw_affiliation_strings":["Department of Electrical Engineering, National Chiao Tung University, Hsinchu, Taiwan","Dept. of Electr. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan#TAB#","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033074945","display_name":"Shao-Feng Hung","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shao-Feng Hung","raw_affiliation_strings":["Department of Electrical Engineering, National Chiao Tung University, Hsinchu, Taiwan","Dept. of Electr. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan#TAB#","institution_ids":["https://openalex.org/I148366613"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5108047268"],"corresponding_institution_ids":["https://openalex.org/I148366613"],"apc_list":null,"apc_paid":null,"fwci":0.667,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.73012859,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"59","issue":"9","first_page":"2334","last_page":"2344"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.701399564743042},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6530348658561707},{"id":"https://openalex.org/keywords/delta-sigma-modulation","display_name":"Delta-sigma modulation","score":0.6425049901008606},{"id":"https://openalex.org/keywords/fast-fourier-transform","display_name":"Fast Fourier transform","score":0.5235821008682251},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5074664950370789},{"id":"https://openalex.org/keywords/sine-wave","display_name":"Sine wave","score":0.4982011318206787},{"id":"https://openalex.org/keywords/decimation","display_name":"Decimation","score":0.4648175835609436},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.4427226185798645},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.4405054450035095},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3445138931274414},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.3089842200279236},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19928288459777832},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.16094356775283813},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.1553744673728943}],"concepts":[{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.701399564743042},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6530348658561707},{"id":"https://openalex.org/C68754193","wikidata":"https://www.wikidata.org/wiki/Q1184820","display_name":"Delta-sigma modulation","level":3,"score":0.6425049901008606},{"id":"https://openalex.org/C75172450","wikidata":"https://www.wikidata.org/wiki/Q623950","display_name":"Fast Fourier transform","level":2,"score":0.5235821008682251},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5074664950370789},{"id":"https://openalex.org/C66907618","wikidata":"https://www.wikidata.org/wiki/Q207527","display_name":"Sine wave","level":3,"score":0.4982011318206787},{"id":"https://openalex.org/C173642442","wikidata":"https://www.wikidata.org/wiki/Q1253346","display_name":"Decimation","level":3,"score":0.4648175835609436},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.4427226185798645},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.4405054450035095},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3445138931274414},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.3089842200279236},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19928288459777832},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.16094356775283813},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.1553744673728943},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2009.2034582","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2034582","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320323092","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W140525707","https://openalex.org/W1503450335","https://openalex.org/W1516585181","https://openalex.org/W1531446014","https://openalex.org/W1964080183","https://openalex.org/W1978376323","https://openalex.org/W2014022260","https://openalex.org/W2071628448","https://openalex.org/W2078335310","https://openalex.org/W2084128131","https://openalex.org/W2107555964","https://openalex.org/W2108748450","https://openalex.org/W2119042407","https://openalex.org/W2121068966","https://openalex.org/W2124517079","https://openalex.org/W2130752264","https://openalex.org/W2136100286","https://openalex.org/W2137700685","https://openalex.org/W2137740093","https://openalex.org/W2142590167","https://openalex.org/W2145197148","https://openalex.org/W2147292717","https://openalex.org/W2151874577","https://openalex.org/W2157812013","https://openalex.org/W2158254213","https://openalex.org/W2160322785","https://openalex.org/W2167930416","https://openalex.org/W2988055886","https://openalex.org/W4250742633","https://openalex.org/W4252688384","https://openalex.org/W6679945778"],"related_works":["https://openalex.org/W2351093380","https://openalex.org/W4391878374","https://openalex.org/W1961964945","https://openalex.org/W2038930425","https://openalex.org/W2120581025","https://openalex.org/W2793288183","https://openalex.org/W2132077760","https://openalex.org/W2151826803","https://openalex.org/W2366223053","https://openalex.org/W1541221476"],"abstract_inverted_index":{"This":[0],"paper":[1],"demonstrates":[2],"the":[3,16,45,49,52,55,59,67,76,81,87,97,112,116,127,132,137,173,178],"first":[4],"fully":[5],"integrated":[6],"built-in":[7],"self-test":[8],"(BIST)":[9],"\u03a3-\u0394":[10,30,159],"analog-to-digital":[11],"converter":[12],"(ADC)":[13],"chip":[14],"to":[15,74,172],"best":[17],"of":[18,58,96,131,177],"our":[19],"knowledge.":[20],"The":[21,36,61,92,105,147,157],"ADC":[22,160],"under":[23],"test":[24,155,164],"(AUT)":[25],"comprises":[26],"a":[27,33,162],"second-order":[28],"design-for-digital-testability":[29],"modulator":[31],"and":[32,54,85,136,143],"decimation":[34],"filter.":[35],"purely":[37],"digital":[38,163],"BIST":[39,62,99,113,134,158],"circuitry":[40,100],"conducts":[41],"single-tone":[42],"tests":[43],"for":[44,89],"signal-to-noise-and-distortion":[46],"ratio":[47],"(SNDR),":[48],"dynamic":[50],"range,":[51],"offset,":[53],"gain":[56],"error":[57],"AUT.":[60,179],"design":[63,114,135],"is":[64,101,108,151],"based":[65],"on":[66],"proposed":[68,133],"modified":[69],"controlled":[70],"sine-wave":[71],"fitting":[72],"procedure":[73],"address":[75],"component":[77],"overload":[78],"issues,":[79],"reduce":[80],"setup":[82],"parameter":[83],"numbers,":[84],"eliminate":[86],"need":[88],"parallel":[90],"multipliers.":[91],"total":[93],"gate":[94],"count":[95],"whole":[98],"only":[102],"13":[103],"300.":[104],"hardware":[106],"overhead":[107],"much":[109],"less":[110],"than":[111,167],"using":[115],"traditional":[117],"fast":[118],"Fourier":[119],"transform":[120],"(FFT)":[121],"analysis.":[122],"Measurement":[123],"results":[124,130],"show":[125],"that":[126],"peak":[128],"SNDR":[129,149],"conventional":[138],"FFT":[139],"analysis":[140],"are":[141],"75.5":[142],"75.3":[144],"dB,":[145],"respectively.":[146],"subtle":[148],"difference":[150],"already":[152],"within":[153],"analog":[154],"uncertainty.":[156],"achieves":[161],"bandwidth":[165,176],"higher":[166],"17":[168],"kHz,":[169],"very":[170],"close":[171],"rated":[174],"20-kHz":[175]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}