{"id":"https://openalex.org/W2137300256","doi":"https://doi.org/10.1109/tim.2009.2032884","title":"Approach to Fault Identification for Electronic Products Using Mahalanobis Distance","display_name":"Approach to Fault Identification for Electronic Products Using Mahalanobis Distance","publication_year":2009,"publication_date":"2009-11-03","ids":{"openalex":"https://openalex.org/W2137300256","doi":"https://doi.org/10.1109/tim.2009.2032884","mag":"2137300256"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2009.2032884","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2032884","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090774290","display_name":"Sachin Kumar","orcid":"https://orcid.org/0000-0003-1517-7450"},"institutions":[{"id":"https://openalex.org/I4210156197","display_name":"Life Cycle Engineering (United States)","ror":"https://ror.org/056hm0802","country_code":"US","type":"company","lineage":["https://openalex.org/I4210156197"]},{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S Kumar","raw_affiliation_strings":["Prognostics and Health Management Laboratory, Center of Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Prognostics and Health Management Laboratory, Center of Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, MD, USA","institution_ids":["https://openalex.org/I4210156197","https://openalex.org/I66946132"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050716572","display_name":"Tommy W. S. Chow","orcid":"https://orcid.org/0000-0001-7051-0434"},"institutions":[{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"T W S Chow","raw_affiliation_strings":["Prognostics and Health Management Laboratory, Center of Advanced Life Cycle Engineering (CALCE), City University of Hong Kong, Hong Kong, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Prognostics and Health Management Laboratory, Center of Advanced Life Cycle Engineering (CALCE), City University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I168719708"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013287421","display_name":"Michael Pecht","orcid":"https://orcid.org/0000-0003-1126-8662"},"institutions":[{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]},{"id":"https://openalex.org/I4210156197","display_name":"Life Cycle Engineering (United States)","ror":"https://ror.org/056hm0802","country_code":"US","type":"company","lineage":["https://openalex.org/I4210156197"]},{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["HK","US"],"is_corresponding":false,"raw_author_name":"M Pecht","raw_affiliation_strings":["Prognostics and Health Management Laboratory, Center of Advanced Life Cycle Engineering (CALCE), City University of Hong Kong, Hong Kong, China","Prognostics and Health Management Laboratory, Center of Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Prognostics and Health Management Laboratory, Center of Advanced Life Cycle Engineering (CALCE), City University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I168719708"]},{"raw_affiliation_string":"Prognostics and Health Management Laboratory, Center of Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, MD, USA","institution_ids":["https://openalex.org/I4210156197","https://openalex.org/I66946132"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":13.0919,"has_fulltext":false,"cited_by_count":103,"citation_normalized_percentile":{"value":0.98609068,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":"59","issue":"8","first_page":"2055","last_page":"2064"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9933000206947327,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9933000206947327,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9729999899864197,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9690999984741211,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mahalanobis-distance","display_name":"Mahalanobis distance","score":0.9736282825469971},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7404590845108032},{"id":"https://openalex.org/keywords/control-chart","display_name":"Control chart","score":0.6050862073898315},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.5721506476402283},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5615071654319763},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.5192951560020447},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.5062021613121033},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4915226399898529},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.48161786794662476},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.4684683680534363},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.4313862919807434},{"id":"https://openalex.org/keywords/chart","display_name":"Chart","score":0.42831045389175415},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3638181686401367},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.35271263122558594},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.34637632966041565},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.31467562913894653},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2788783609867096},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.09932759404182434}],"concepts":[{"id":"https://openalex.org/C1921717","wikidata":"https://www.wikidata.org/wiki/Q1334846","display_name":"Mahalanobis distance","level":2,"score":0.9736282825469971},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7404590845108032},{"id":"https://openalex.org/C196985124","wikidata":"https://www.wikidata.org/wiki/Q1369242","display_name":"Control chart","level":3,"score":0.6050862073898315},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.5721506476402283},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5615071654319763},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.5192951560020447},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.5062021613121033},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4915226399898529},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.48161786794662476},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.4684683680534363},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.4313862919807434},{"id":"https://openalex.org/C190812933","wikidata":"https://www.wikidata.org/wiki/Q28923","display_name":"Chart","level":2,"score":0.42831045389175415},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3638181686401367},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.35271263122558594},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.34637632966041565},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.31467562913894653},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2788783609867096},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.09932759404182434},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2009.2032884","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2032884","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W129305155","https://openalex.org/W1951765992","https://openalex.org/W1967897059","https://openalex.org/W2028068584","https://openalex.org/W2047481433","https://openalex.org/W2059688441","https://openalex.org/W2068302187","https://openalex.org/W2087658093","https://openalex.org/W2100365983","https://openalex.org/W2102969258","https://openalex.org/W2109561169","https://openalex.org/W2116870707","https://openalex.org/W2119964954","https://openalex.org/W2137252928","https://openalex.org/W2145754627","https://openalex.org/W2150917855","https://openalex.org/W2162673254","https://openalex.org/W2166854300","https://openalex.org/W2169407215","https://openalex.org/W2170012787","https://openalex.org/W2491646000","https://openalex.org/W2541059480","https://openalex.org/W2546735869","https://openalex.org/W2597484800","https://openalex.org/W2895550934","https://openalex.org/W2914073730","https://openalex.org/W4229680264","https://openalex.org/W4248564984","https://openalex.org/W4250837161","https://openalex.org/W4300066526"],"related_works":["https://openalex.org/W4382795578","https://openalex.org/W2355463328","https://openalex.org/W1431147547","https://openalex.org/W2402648945","https://openalex.org/W2053213469","https://openalex.org/W2055761197","https://openalex.org/W2927068219","https://openalex.org/W3094086031","https://openalex.org/W2911502181","https://openalex.org/W4380272213"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,12,20,41,85,88,95],"Mahalanobis":[4],"distance":[5],"(MD)":[6],"based":[7],"diagnostic":[8,122],"approach":[9,14],"that":[10,76,94],"employs":[11],"probabilistic":[13],"to":[15,18,73,115],"establish":[16],"thresholds":[17],"classify":[19],"product":[21,86],"as":[22],"being":[23],"healthy":[24],"or":[25],"unhealthy.":[26],"A":[27,107],"technique":[28],"for":[29,44],"detecting":[30],"trends":[31],"and":[32,64],"biasness":[33],"in":[34,81],"system":[35],"health":[36,69],"is":[37,113],"presented":[38,114],"by":[39,102],"constructing":[40],"control":[42],"chart":[43],"the":[45,54,57,65,82,117],"MD":[46,98],"value.":[47],"The":[48],"performance":[49],"parameters'":[50],"residuals,":[51],"which":[52],"are":[53,71],"differences":[55],"between":[56],"estimated":[58],"values":[59,67],"(from":[60,68],"an":[61,104],"empirical":[62],"model)":[63],"observed":[66],"monitoring),":[70],"used":[72],"isolate":[74],"parameters":[75],"exhibit":[77],"faults.":[78],"To":[79],"aid":[80],"qualification":[83],"of":[84,119],"against":[87],"specific":[89],"known":[90],"fault,":[91],"we":[92],"suggest":[93],"fault-specific":[96],"threshold":[97],"value":[99],"be":[100],"defined":[101],"minimizing":[103],"error":[105],"function.":[106],"case":[108],"study":[109],"on":[110],"notebook":[111],"computers":[112],"demonstrate":[116],"applicability":[118],"this":[120],"proposed":[121],"approach.":[123]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":9},{"year":2022,"cited_by_count":8},{"year":2021,"cited_by_count":8},{"year":2020,"cited_by_count":13},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":8},{"year":2017,"cited_by_count":9},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":8},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":8},{"year":2012,"cited_by_count":10}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}