{"id":"https://openalex.org/W2140969587","doi":"https://doi.org/10.1109/tim.2009.2030920","title":"Strong Attenuation of the Transients' Effect in Square Waves Synthesized With a Programmable Josephson Voltage Standard","display_name":"Strong Attenuation of the Transients' Effect in Square Waves Synthesized With a Programmable Josephson Voltage Standard","publication_year":2009,"publication_date":"2009-10-08","ids":{"openalex":"https://openalex.org/W2140969587","doi":"https://doi.org/10.1109/tim.2009.2030920","mag":"2140969587"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2009.2030920","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2030920","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014516061","display_name":"B. Jeanneret","orcid":"https://orcid.org/0000-0003-1113-5253"},"institutions":[{"id":"https://openalex.org/I4210103407","display_name":"Swiss Federal Institute of Metrology","ror":"https://ror.org/0115xv923","country_code":"CH","type":"government","lineage":["https://openalex.org/I4210103407"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Blaise Jeanneret","raw_affiliation_strings":["Federal Office of Metrology (METAS), Bern, Switzerland","Fed. Office of Metrol. (METAS), Bern-Wabern, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Federal Office of Metrology (METAS), Bern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]},{"raw_affiliation_string":"Fed. Office of Metrol. (METAS), Bern-Wabern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054781013","display_name":"F. Overney","orcid":null},"institutions":[{"id":"https://openalex.org/I4210103407","display_name":"Swiss Federal Institute of Metrology","ror":"https://ror.org/0115xv923","country_code":"CH","type":"government","lineage":["https://openalex.org/I4210103407"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Fr\u00e9d\u00e9ric Overney","raw_affiliation_strings":["Federal Office of Metrology (METAS), Bern, Switzerland","Fed. Office of Metrol. (METAS), Bern-Wabern, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Federal Office of Metrology (METAS), Bern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]},{"raw_affiliation_string":"Fed. Office of Metrol. (METAS), Bern-Wabern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015731532","display_name":"Alain R\u00fcfenacht","orcid":"https://orcid.org/0000-0002-1579-9738"},"institutions":[{"id":"https://openalex.org/I4210103407","display_name":"Swiss Federal Institute of Metrology","ror":"https://ror.org/0115xv923","country_code":"CH","type":"government","lineage":["https://openalex.org/I4210103407"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Alain Rufenacht","raw_affiliation_strings":["Federal Office of Metrology (METAS), Bern, Switzerland","Fed. Office of Metrol. (METAS), Bern-Wabern, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Federal Office of Metrology (METAS), Bern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]},{"raw_affiliation_string":"Fed. Office of Metrol. (METAS), Bern-Wabern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015551748","display_name":"J. Nissil\u00e4","orcid":"https://orcid.org/0000-0001-9370-1866"},"institutions":[{"id":"https://openalex.org/I133698016","display_name":"National metrology institute VTT MIKES","ror":"https://ror.org/0398a1r53","country_code":"FI","type":"facility","lineage":["https://openalex.org/I133698016","https://openalex.org/I4210089493","https://openalex.org/I87653560"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Jaani Nissila","raw_affiliation_strings":["Center of Metrology and Accreditation (MIKES), Espoo, Finland","Center for Metrol. & Accreditation (MIKES), Espoo, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Metrology and Accreditation (MIKES), Espoo, Finland","institution_ids":["https://openalex.org/I133698016"]},{"raw_affiliation_string":"Center for Metrol. & Accreditation (MIKES), Espoo, Finland","institution_ids":["https://openalex.org/I133698016"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.0517,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.91691115,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"59","issue":"7","first_page":"1894","last_page":"1899"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":0.9743000268936157,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9358000159263611,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.8059715628623962},{"id":"https://openalex.org/keywords/josephson-effect","display_name":"Josephson effect","score":0.7763794660568237},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6739020943641663},{"id":"https://openalex.org/keywords/square-wave","display_name":"Square wave","score":0.5967370271682739},{"id":"https://openalex.org/keywords/attenuation","display_name":"Attenuation","score":0.5740175247192383},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.5479774475097656},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.48407259583473206},{"id":"https://openalex.org/keywords/square","display_name":"Square (algebra)","score":0.4440239369869232},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.4344519376754761},{"id":"https://openalex.org/keywords/pi-josephson-junction","display_name":"Pi Josephson junction","score":0.42182207107543945},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.32705220580101013},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.24735555052757263},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.2339576780796051},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21275770664215088},{"id":"https://openalex.org/keywords/superconductivity","display_name":"Superconductivity","score":0.20529884099960327},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10267901420593262}],"concepts":[{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.8059715628623962},{"id":"https://openalex.org/C12038964","wikidata":"https://www.wikidata.org/wiki/Q764228","display_name":"Josephson effect","level":3,"score":0.7763794660568237},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6739020943641663},{"id":"https://openalex.org/C96352100","wikidata":"https://www.wikidata.org/wiki/Q1136640","display_name":"Square wave","level":3,"score":0.5967370271682739},{"id":"https://openalex.org/C184652730","wikidata":"https://www.wikidata.org/wiki/Q2357982","display_name":"Attenuation","level":2,"score":0.5740175247192383},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5479774475097656},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.48407259583473206},{"id":"https://openalex.org/C135692309","wikidata":"https://www.wikidata.org/wiki/Q111124","display_name":"Square (algebra)","level":2,"score":0.4440239369869232},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.4344519376754761},{"id":"https://openalex.org/C180349316","wikidata":"https://www.wikidata.org/wiki/Q7189956","display_name":"Pi Josephson junction","level":4,"score":0.42182207107543945},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.32705220580101013},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.24735555052757263},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.2339576780796051},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21275770664215088},{"id":"https://openalex.org/C54101563","wikidata":"https://www.wikidata.org/wiki/Q124131","display_name":"Superconductivity","level":2,"score":0.20529884099960327},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10267901420593262},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2009.2030920","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2030920","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320332178","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1979514275","https://openalex.org/W2031821198","https://openalex.org/W2031839987","https://openalex.org/W2046302477","https://openalex.org/W2056065340","https://openalex.org/W2058191924","https://openalex.org/W2098827896","https://openalex.org/W2101272815","https://openalex.org/W2107304301","https://openalex.org/W2128269426","https://openalex.org/W2137624056","https://openalex.org/W2146107278","https://openalex.org/W2150018203","https://openalex.org/W2154544822","https://openalex.org/W2165751916","https://openalex.org/W2167465161"],"related_works":["https://openalex.org/W2107363207","https://openalex.org/W2134128150","https://openalex.org/W2003102171","https://openalex.org/W2150997828","https://openalex.org/W1977410726","https://openalex.org/W2066515429","https://openalex.org/W2102470243","https://openalex.org/W2039321566","https://openalex.org/W2357241914","https://openalex.org/W1999045657"],"abstract_inverted_index":{"This":[0,102],"paper":[1],"addresses":[2],"the":[3,8,30,34,43,49,53,58,62,73,84,87,111],"effect":[4,28,85],"of":[5,10,29,86,113,117],"transients":[6,31,88],"on":[7,48],"operation":[9],"a":[11,66,77,93,108,114],"1-V":[12],"programmable":[13],"Josephson":[14,45],"voltage":[15,38,46,74],"standard":[16,68],"for":[17],"frequencies":[18],"ranging":[19],"between":[20,36],"125":[21],"Hz":[22],"and":[23],"4":[24],"kHz.":[25],"A":[26],"detrimental":[27],"occurring":[32],"during":[33],"transition":[35],"different":[37],"steps":[39,75],"is":[40,98],"to":[41,71,92,107],"make":[42],"ac":[44],"dependent":[47],"bias":[50],"current":[51,59],"in":[52,110],"junctions.":[54],"In":[55],"other":[56],"words,":[57],"margins":[60],"where":[61,95],"array":[63],"behaves":[64],"as":[65],"quantum":[67],"are":[69],"reduced":[70,91],"zero:":[72],"have":[76],"slope.":[78],"However,":[79],"by":[80],"using":[81],"square":[82],"waveforms,":[83],"can":[89],"be":[90],"level":[94],"this":[96],"slope":[97],"no":[99],"longer":[100],"measurable.":[101],"observation":[103],"will":[104],"probably":[105],"lead":[106],"simplification":[109],"development":[112],"new":[115],"type":[116],"high-precision":[118],"Josephson-based":[119],"waveform":[120],"synthesizer.":[121]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2012,"cited_by_count":5}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}