{"id":"https://openalex.org/W2133668280","doi":"https://doi.org/10.1109/tim.2009.2027780","title":"Depth Evaluation of Shallow Surface Cracks in Metals Using Rectangular Waveguides at Millimeter-Wave Frequencies","display_name":"Depth Evaluation of Shallow Surface Cracks in Metals Using Rectangular Waveguides at Millimeter-Wave Frequencies","publication_year":2009,"publication_date":"2009-10-08","ids":{"openalex":"https://openalex.org/W2133668280","doi":"https://doi.org/10.1109/tim.2009.2027780","mag":"2133668280"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2009.2027780","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2027780","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057912138","display_name":"Andrew McClanahan","orcid":null},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"A McClanahan","raw_affiliation_strings":["Applied Microwave Nondestructive Testing Laboratory, Electrical and Computer Engineering Department, Missouri University of Science and Technology, Rolla, MO, USA","Electr. & Comput. Eng. Dept., Missouri Univ. of Sci. & Technol., Rolla, MO, USA"],"affiliations":[{"raw_affiliation_string":"Applied Microwave Nondestructive Testing Laboratory, Electrical and Computer Engineering Department, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]},{"raw_affiliation_string":"Electr. & Comput. Eng. Dept., Missouri Univ. of Sci. & Technol., Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110194289","display_name":"S. Kharkovsky","orcid":null},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S Kharkovsky","raw_affiliation_strings":["Applied Microwave Nondestructive Testing Laboratory, Electrical and Computer Engineering Department, Missouri University of Science and Technology, Rolla, MO, USA","Electr. & Comput. Eng. Dept., Missouri Univ. of Sci. & Technol., Rolla, MO, USA"],"affiliations":[{"raw_affiliation_string":"Applied Microwave Nondestructive Testing Laboratory, Electrical and Computer Engineering Department, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]},{"raw_affiliation_string":"Electr. & Comput. Eng. Dept., Missouri Univ. of Sci. & Technol., Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022701374","display_name":"A. R. Maxon","orcid":null},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A R Maxon","raw_affiliation_strings":["Applied Microwave Nondestructive Testing Laboratory, Electrical and Computer Engineering Department, Missouri University of Science and Technology, Rolla, MO, USA","Electr. & Comput. Eng. Dept., Missouri Univ. of Sci. & Technol., Rolla, MO, USA"],"affiliations":[{"raw_affiliation_string":"Applied Microwave Nondestructive Testing Laboratory, Electrical and Computer Engineering Department, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]},{"raw_affiliation_string":"Electr. & Comput. Eng. Dept., Missouri Univ. of Sci. & Technol., Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088505165","display_name":"Reza Zoughi","orcid":"https://orcid.org/0000-0001-9421-1551"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R Zoughi","raw_affiliation_strings":["Applied Microwave Nondestructive Testing Laboratory, Electrical and Computer Engineering Department, Missouri University of Science and Technology, Rolla, MO, USA","Electr. & Comput. Eng. Dept., Missouri Univ. of Sci. & Technol., Rolla, MO, USA"],"affiliations":[{"raw_affiliation_string":"Applied Microwave Nondestructive Testing Laboratory, Electrical and Computer Engineering Department, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]},{"raw_affiliation_string":"Electr. & Comput. Eng. Dept., Missouri Univ. of Sci. & Technol., Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017193554","display_name":"D. D. Palmer","orcid":null},"institutions":[{"id":"https://openalex.org/I1295339012","display_name":"Boeing (United States)","ror":"https://ror.org/04sm5zn07","country_code":"US","type":"company","lineage":["https://openalex.org/I1295339012"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D D Palmer","raw_affiliation_strings":["Phantom Works Division, Boeing Aerospace Company, Saint Louis, MO, USA","Phantom Works Div., Boeing Co., St. Louis, MO, USA"],"affiliations":[{"raw_affiliation_string":"Phantom Works Division, Boeing Aerospace Company, Saint Louis, MO, USA","institution_ids":["https://openalex.org/I1295339012"]},{"raw_affiliation_string":"Phantom Works Div., Boeing Co., St. Louis, MO, USA","institution_ids":["https://openalex.org/I1295339012"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5057912138"],"corresponding_institution_ids":["https://openalex.org/I20382870"],"apc_list":null,"apc_paid":null,"fwci":4.5722,"has_fulltext":false,"cited_by_count":55,"citation_normalized_percentile":{"value":0.94824664,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"59","issue":"6","first_page":"1693","last_page":"1704"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6758995652198792},{"id":"https://openalex.org/keywords/reflection-coefficient","display_name":"Reflection coefficient","score":0.6627156734466553},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.6214195489883423},{"id":"https://openalex.org/keywords/millimeter","display_name":"Millimeter","score":0.5796351432800293},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.5500786900520325},{"id":"https://openalex.org/keywords/waveguide","display_name":"Waveguide","score":0.549333930015564},{"id":"https://openalex.org/keywords/reflection","display_name":"Reflection (computer programming)","score":0.544897198677063},{"id":"https://openalex.org/keywords/wavelength","display_name":"Wavelength","score":0.4955662488937378},{"id":"https://openalex.org/keywords/aperture","display_name":"Aperture (computer memory)","score":0.4691765606403351},{"id":"https://openalex.org/keywords/surface-wave","display_name":"Surface wave","score":0.42876705527305603},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.4215385913848877},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4208357334136963},{"id":"https://openalex.org/keywords/sizing","display_name":"Sizing","score":0.41873475909233093},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.147340327501297},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12661537528038025},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12107235193252563}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6758995652198792},{"id":"https://openalex.org/C41700454","wikidata":"https://www.wikidata.org/wiki/Q1852282","display_name":"Reflection coefficient","level":2,"score":0.6627156734466553},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.6214195489883423},{"id":"https://openalex.org/C109792285","wikidata":"https://www.wikidata.org/wiki/Q174789","display_name":"Millimeter","level":2,"score":0.5796351432800293},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5500786900520325},{"id":"https://openalex.org/C200687136","wikidata":"https://www.wikidata.org/wiki/Q11233438","display_name":"Waveguide","level":2,"score":0.549333930015564},{"id":"https://openalex.org/C65682993","wikidata":"https://www.wikidata.org/wiki/Q1056451","display_name":"Reflection (computer programming)","level":2,"score":0.544897198677063},{"id":"https://openalex.org/C6260449","wikidata":"https://www.wikidata.org/wiki/Q41364","display_name":"Wavelength","level":2,"score":0.4955662488937378},{"id":"https://openalex.org/C78336883","wikidata":"https://www.wikidata.org/wiki/Q4779385","display_name":"Aperture (computer memory)","level":2,"score":0.4691765606403351},{"id":"https://openalex.org/C84174578","wikidata":"https://www.wikidata.org/wiki/Q889796","display_name":"Surface wave","level":2,"score":0.42876705527305603},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.4215385913848877},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4208357334136963},{"id":"https://openalex.org/C2777767291","wikidata":"https://www.wikidata.org/wiki/Q1080291","display_name":"Sizing","level":2,"score":0.41873475909233093},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.147340327501297},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12661537528038025},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12107235193252563},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2009.2027780","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2027780","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/11","display_name":"Sustainable cities and communities","score":0.47999998927116394}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W57310610","https://openalex.org/W142655506","https://openalex.org/W221096519","https://openalex.org/W394514966","https://openalex.org/W1494814217","https://openalex.org/W1971910471","https://openalex.org/W1992895044","https://openalex.org/W2001226739","https://openalex.org/W2008530458","https://openalex.org/W2017763340","https://openalex.org/W2021181629","https://openalex.org/W2025568046","https://openalex.org/W2025804814","https://openalex.org/W2032111570","https://openalex.org/W2035473487","https://openalex.org/W2065689967","https://openalex.org/W2093736937","https://openalex.org/W2103519635","https://openalex.org/W2115709373","https://openalex.org/W2123317277","https://openalex.org/W2139650339","https://openalex.org/W2145850560","https://openalex.org/W2147133550","https://openalex.org/W2150566744","https://openalex.org/W2150751743","https://openalex.org/W2155567358","https://openalex.org/W2160800888","https://openalex.org/W2161668661","https://openalex.org/W2175203936","https://openalex.org/W2472921269","https://openalex.org/W4229594554","https://openalex.org/W4240440932","https://openalex.org/W4249660204","https://openalex.org/W4285719527","https://openalex.org/W6602344763","https://openalex.org/W6605756587","https://openalex.org/W6629727791","https://openalex.org/W6720792631"],"related_works":["https://openalex.org/W2375311683","https://openalex.org/W2366062860","https://openalex.org/W2373777250","https://openalex.org/W2353956655","https://openalex.org/W2020653254","https://openalex.org/W2010454064","https://openalex.org/W2352072014","https://openalex.org/W3126829207","https://openalex.org/W4234983648","https://openalex.org/W2172229259"],"abstract_inverted_index":{"This":[0,172,189],"paper":[1,190],"presents":[2,57,191],"a":[3,46,52,67,74,81,100,121,134,146,175],"resonant":[4,59,97],"technique,":[5],"which":[6,34,56,126,162],"is":[7,118,127,163],"founded":[8],"on":[9,13,103],"previous":[10],"extensive":[11],"work":[12],"millimeter-wave":[14,198],"surface":[15,29],"crack":[16,44,76,101,112,115,187],"detection":[17],"and":[18,27,90,113,137,205],"sizing,":[19],"for":[20],"the":[21,70,104,108,111,114,130,141,156,159,170,185,192],"accurate":[22],"depth":[23,64,94],"evaluation":[24],"of":[25,69,99,107,124,158,177,194],"long":[26],"shallow":[28,75,186],"damages":[30],"(scratches":[31],"or":[32],"cracks),":[33],"are":[35],"represented":[36],"as":[37,174],"rectangular":[38,54,148],"slots,":[39],"in":[40,45,140],"metal":[41,47],"plates.":[42],"A":[43],"plate":[48],"may":[49,77,179],"be":[50,78,181],"considered":[51],"short-circuited":[53],"waveguide,":[55],"certain":[58],"characteristics":[60],"when":[61],"its":[62,93],"electrical":[63],"coincides":[65],"with":[66,80,129,201],"quarter":[68],"operating":[71],"wavelength.":[72],"Furthermore,":[73],"filled":[79],"dielectric":[82,105,131],"material":[83,109],"to":[84,167,183],"electromagnetically":[85],"make":[86],"it":[87],"appear":[88],"deeper":[89],"hence":[91],"facilitate":[92],"evaluation.":[95],"The":[96],"properties":[98,106],"depend":[102],"filling":[110],"dimensions.":[116],"It":[117],"shown":[119],"that":[120],"slight":[122],"amount":[123],"loss,":[125],"associated":[128],"material,":[132],"causes":[133],"relatively":[135],"significant":[136],"characteristic":[138],"change":[139,154],"reflection":[142,160],"coefficient":[143],"measured":[144],"using":[145],"probing":[147],"waveguide":[149],"aperture.":[150],"In":[151],"particular,":[152],"this":[153,195],"affects":[155],"magnitude":[157],"coefficient,":[161],"an":[164],"easier":[165],"parameter":[166],"measure":[168],"than":[169],"phase.":[171],"information,":[173],"function":[176],"frequency,":[178],"then":[180],"used":[182],"determine":[184],"depth.":[188],"foundation":[193],"technique":[196],"at":[197],"frequencies,":[199],"along":[200],"supporting":[202],"electromagnetic":[203],"simulations":[204],"experimental":[206],"results.":[207]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":7},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":7}],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2025-10-10T00:00:00"}