{"id":"https://openalex.org/W2162164654","doi":"https://doi.org/10.1109/tim.2009.2025988","title":"A Temperature Compensation Circuit for Thermal Flow Sensors Operated in Constant-Temperature-Difference Mode","display_name":"A Temperature Compensation Circuit for Thermal Flow Sensors Operated in Constant-Temperature-Difference Mode","publication_year":2010,"publication_date":"2010-04-07","ids":{"openalex":"https://openalex.org/W2162164654","doi":"https://doi.org/10.1109/tim.2009.2025988","mag":"2162164654"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2009.2025988","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2025988","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037168679","display_name":"C. Sosna","orcid":null},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Christoph Sosna","raw_affiliation_strings":["Institute for Microsensors, -actuators, and -systems, Microsystems Center Bremen, University of Bremen, Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"Institute for Microsensors, -actuators, and -systems, Microsystems Center Bremen, University of Bremen, Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084587587","display_name":"Rainer Buchner","orcid":null},"institutions":[{"id":"https://openalex.org/I4210132714","display_name":"Danfoss (Germany)","ror":"https://ror.org/03cbf2j49","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210117054","https://openalex.org/I4210132714"]},{"id":"https://openalex.org/I4210087480","display_name":"First Sensor (Germany)","ror":"https://ror.org/0063wfd54","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210087480"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Rainer Buchner","raw_affiliation_strings":["Danfoss IXA Sensor Technologies, Nordborg, Germany"],"affiliations":[{"raw_affiliation_string":"Danfoss IXA Sensor Technologies, Nordborg, Germany","institution_ids":["https://openalex.org/I4210087480","https://openalex.org/I4210132714"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077352854","display_name":"Walter Lang","orcid":"https://orcid.org/0000-0002-9813-5231"},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Walter Lang","raw_affiliation_strings":["Institute for Microsensors, -actuators, and -systems, Microsystems Center Bremen, University of Bremen, Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"Institute for Microsensors, -actuators, and -systems, Microsystems Center Bremen, University of Bremen, Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5037168679"],"corresponding_institution_ids":["https://openalex.org/I180437899"],"apc_list":null,"apc_paid":null,"fwci":5.3418,"has_fulltext":false,"cited_by_count":76,"citation_normalized_percentile":{"value":0.96122716,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"59","issue":"6","first_page":"1715","last_page":"1721"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9908000230789185,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9908000230789185,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9810000061988831,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9745000004768372,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wheatstone-bridge","display_name":"Wheatstone bridge","score":0.8612149357795715},{"id":"https://openalex.org/keywords/temperature-coefficient","display_name":"Temperature coefficient","score":0.7254207134246826},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7119333744049072},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.6477331519126892},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.5747330188751221},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.5562140941619873},{"id":"https://openalex.org/keywords/thermal-resistance","display_name":"Thermal resistance","score":0.522418737411499},{"id":"https://openalex.org/keywords/resistance-thermometer","display_name":"Resistance thermometer","score":0.5040932893753052},{"id":"https://openalex.org/keywords/temperature-control","display_name":"Temperature control","score":0.45459771156311035},{"id":"https://openalex.org/keywords/thermistor","display_name":"Thermistor","score":0.45339515805244446},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.44223421812057495},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.37841805815696716},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3725493550300598},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.3638024926185608},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.254805326461792},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.21701830625534058},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.20786252617835999},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1681773066520691},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.16150125861167908},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10364207625389099}],"concepts":[{"id":"https://openalex.org/C104713690","wikidata":"https://www.wikidata.org/wiki/Q245133","display_name":"Wheatstone bridge","level":4,"score":0.8612149357795715},{"id":"https://openalex.org/C16643434","wikidata":"https://www.wikidata.org/wiki/Q898642","display_name":"Temperature coefficient","level":2,"score":0.7254207134246826},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7119333744049072},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.6477331519126892},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.5747330188751221},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.5562140941619873},{"id":"https://openalex.org/C137693562","wikidata":"https://www.wikidata.org/wiki/Q899628","display_name":"Thermal resistance","level":3,"score":0.522418737411499},{"id":"https://openalex.org/C144086978","wikidata":"https://www.wikidata.org/wiki/Q848041","display_name":"Resistance thermometer","level":3,"score":0.5040932893753052},{"id":"https://openalex.org/C536315585","wikidata":"https://www.wikidata.org/wiki/Q7698332","display_name":"Temperature control","level":2,"score":0.45459771156311035},{"id":"https://openalex.org/C66726788","wikidata":"https://www.wikidata.org/wiki/Q175973","display_name":"Thermistor","level":2,"score":0.45339515805244446},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.44223421812057495},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.37841805815696716},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3725493550300598},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.3638024926185608},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.254805326461792},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.21701830625534058},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.20786252617835999},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1681773066520691},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.16150125861167908},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10364207625389099},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2009.2025988","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2025988","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.6499999761581421,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1595407518","https://openalex.org/W1718510237","https://openalex.org/W1990291609","https://openalex.org/W2019349221","https://openalex.org/W2028666462","https://openalex.org/W2044085968","https://openalex.org/W2050126765","https://openalex.org/W2051793518","https://openalex.org/W2145624561","https://openalex.org/W2152549847","https://openalex.org/W2167811980","https://openalex.org/W4246512412"],"related_works":["https://openalex.org/W2360917112","https://openalex.org/W2087352711","https://openalex.org/W2081910589","https://openalex.org/W4214519631","https://openalex.org/W2380510760","https://openalex.org/W1669291913","https://openalex.org/W1965705171","https://openalex.org/W2942230276","https://openalex.org/W2093727924","https://openalex.org/W785777991"],"abstract_inverted_index":{"This":[0,139],"paper":[1],"presents":[2],"a":[3,16,23,31,38,52,59,112,179],"new":[4],"temperature":[5,40,47,69,74,81,104,123,127,137,164],"compensation":[6,93],"technique":[7],"for":[8,132,136,162],"thermal":[9,32,180],"flow":[10,33,181],"sensors":[11],"that":[12,114],"are":[13],"operated":[14],"in":[15,61,152],"constant-temperature-difference":[17],"(CTD)":[18],"mode":[19],"by":[20,97],"means":[21],"of":[22,30,43,51,58,66,100,117,121,129,157,167,178],"simple":[24],"analog":[25],"circuit.":[26,55],"The":[27,106],"resistive":[28,103],"heater":[29,68,177],"sensor":[34,85,124],"is":[35,70,115],"maintained":[36],"at":[37],"constant":[39],"some":[41],"tens":[42],"Kelvins":[44],"above":[45],"fluid":[46],"with":[48,77,173],"the":[49,67,73,80,84,98,119,122,141,163,176],"help":[50],"Wheatstone":[53],"bridge":[54],"In":[56],"case":[57],"change":[60],"media":[62],"temperature,":[63],"an":[64,101,133,155],"adjustment":[65,135],"necessary;":[71],"otherwise,":[72],"difference":[75],"falls/rises":[76],"respect":[78,174],"to":[79,143,175],"change,":[82],"and":[83,125,159,171],"output":[86],"signal":[87],"deviates":[88],"from":[89],"its":[90,126,168],"calibration.":[91],"Temperature":[92],"can":[94],"be":[95],"performed":[96],"use":[99,144],"additional":[102],"sensor.":[105,182],"circuit":[107],"design":[108],"presented":[109],"here":[110],"includes":[111],"potentiometer":[113],"capable":[116],"changing":[118],"resistance":[120,130,169],"coefficient":[128],"(TCR)":[131],"easy":[134],"compensation.":[138],"gives":[140],"freedom":[142],"any":[145],"material":[146],"such":[147],"as":[148],"platinum,":[149],"aluminum,":[150],"or,":[151],"our":[153],"case,":[154],"alloy":[156],"tungsten":[158],"titanium":[160],"(WTi)":[161],"sensor,":[165],"regardless":[166],"value":[170],"TCR":[172]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":7},{"year":2014,"cited_by_count":7},{"year":2012,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}