{"id":"https://openalex.org/W2168091584","doi":"https://doi.org/10.1109/tim.2009.2025467","title":"Regression Analysis of Automatic Measurement Systems","display_name":"Regression Analysis of Automatic Measurement Systems","publication_year":2009,"publication_date":"2009-08-25","ids":{"openalex":"https://openalex.org/W2168091584","doi":"https://doi.org/10.1109/tim.2009.2025467","mag":"2168091584"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2009.2025467","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2025467","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000363788","display_name":"Mathew Flynn","orcid":"https://orcid.org/0000-0001-7087-0165"},"institutions":[{"id":"https://openalex.org/I2801056593","display_name":"Naval Air Systems Command","ror":"https://ror.org/054ajk512","country_code":"US","type":"funder","lineage":["https://openalex.org/I1330347796","https://openalex.org/I2801056593","https://openalex.org/I3130687028"]},{"id":"https://openalex.org/I4389425451","display_name":"Naval Air Warfare Center Aircraft Division","ror":"https://ror.org/01zj39k81","country_code":null,"type":"government","lineage":["https://openalex.org/I1330347796","https://openalex.org/I2801056593","https://openalex.org/I3130687028","https://openalex.org/I4389425451"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"M.J. Flynn","raw_affiliation_strings":["Naval Air Warfare Center Aircraft Division, Patuxent River, MD, USA"],"affiliations":[{"raw_affiliation_string":"Naval Air Warfare Center Aircraft Division, Patuxent River, MD, USA","institution_ids":["https://openalex.org/I2801056593","https://openalex.org/I4389425451"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109336689","display_name":"Shahram Sarkani","orcid":null},"institutions":[{"id":"https://openalex.org/I193531525","display_name":"George Washington University","ror":"https://ror.org/00y4zzh67","country_code":"US","type":"education","lineage":["https://openalex.org/I193531525"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Sarkani","raw_affiliation_strings":["George Washington University, Washington D.C., DC, USA"],"affiliations":[{"raw_affiliation_string":"George Washington University, Washington D.C., DC, USA","institution_ids":["https://openalex.org/I193531525"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050432319","display_name":"Thomas A. Mazzuchi","orcid":"https://orcid.org/0000-0002-4584-4018"},"institutions":[{"id":"https://openalex.org/I193531525","display_name":"George Washington University","ror":"https://ror.org/00y4zzh67","country_code":"US","type":"education","lineage":["https://openalex.org/I193531525"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T.A. Mazzuchi","raw_affiliation_strings":["George Washington University, Washington D.C., DC, USA"],"affiliations":[{"raw_affiliation_string":"George Washington University, Washington D.C., DC, USA","institution_ids":["https://openalex.org/I193531525"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5000363788"],"corresponding_institution_ids":["https://openalex.org/I2801056593","https://openalex.org/I4389425451"],"apc_list":null,"apc_paid":null,"fwci":0.5638,"has_fulltext":false,"cited_by_count":21,"citation_normalized_percentile":{"value":0.77232851,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"58","issue":"10","first_page":"3373","last_page":"3379"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9939000010490417,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.5471370220184326},{"id":"https://openalex.org/keywords/regression-analysis","display_name":"Regression analysis","score":0.5348236560821533},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.5119186639785767},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5085095167160034},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.49988460540771484},{"id":"https://openalex.org/keywords/system-testing","display_name":"System testing","score":0.46546483039855957},{"id":"https://openalex.org/keywords/regression-testing","display_name":"Regression testing","score":0.45182886719703674},{"id":"https://openalex.org/keywords/linear-regression","display_name":"Linear regression","score":0.4209591746330261},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.41657644510269165},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3363589644432068},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.2766554355621338},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.17710146307945251},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.12363249063491821},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.11691120266914368},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.11271870136260986},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.08065459132194519},{"id":"https://openalex.org/keywords/software-system","display_name":"Software system","score":0.07702812552452087}],"concepts":[{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.5471370220184326},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.5348236560821533},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.5119186639785767},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5085095167160034},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.49988460540771484},{"id":"https://openalex.org/C7166840","wikidata":"https://www.wikidata.org/wiki/Q1199682","display_name":"System testing","level":2,"score":0.46546483039855957},{"id":"https://openalex.org/C161821725","wikidata":"https://www.wikidata.org/wiki/Q917415","display_name":"Regression testing","level":5,"score":0.45182886719703674},{"id":"https://openalex.org/C48921125","wikidata":"https://www.wikidata.org/wiki/Q10861030","display_name":"Linear regression","level":2,"score":0.4209591746330261},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.41657644510269165},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3363589644432068},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.2766554355621338},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17710146307945251},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.12363249063491821},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.11691120266914368},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.11271870136260986},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.08065459132194519},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.07702812552452087},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2009.2025467","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2025467","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1566641586","https://openalex.org/W1997960054","https://openalex.org/W2015554878","https://openalex.org/W2044382751","https://openalex.org/W2068026461","https://openalex.org/W2077300292","https://openalex.org/W2083693898","https://openalex.org/W2083922075","https://openalex.org/W2109514141","https://openalex.org/W2120614393","https://openalex.org/W2130682156","https://openalex.org/W2130921328","https://openalex.org/W2149507315","https://openalex.org/W2152177230","https://openalex.org/W2155147652","https://openalex.org/W2508530573","https://openalex.org/W2543716663","https://openalex.org/W2798802466","https://openalex.org/W3024574697","https://openalex.org/W4241716993"],"related_works":["https://openalex.org/W2326770010","https://openalex.org/W3049121420","https://openalex.org/W2374263760","https://openalex.org/W4255647936","https://openalex.org/W1486069742","https://openalex.org/W2461589354","https://openalex.org/W4293868501","https://openalex.org/W3128781877","https://openalex.org/W2886943583","https://openalex.org/W1993178475"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"regression":[3],"analysis":[4],"is":[5,49,55,71,85],"presented":[6,50],"to":[7,51,72,93],"analyze":[8],"the":[9,33,74,89],"comparative":[10],"performance":[11],"capability":[12],"between":[13,60],"two":[14,61],"functionally":[15,62],"equivalent":[16,63],"but":[17],"technologically":[18],"different":[19],"automatic":[20,64],"measurement":[21,65,91,96],"systems":[22],"for":[23],"acceptance":[24],"testing":[25],"of":[26,36,69,77],"a":[27,37,47,56,83],"unit":[28],"under":[29],"test":[30],"(UUT).":[31],"Since":[32],"pass/fail":[34],"criteria":[35],"UUT":[38,84],"are":[39],"contingent":[40],"upon":[41],"repeatable":[42],"and":[43],"reproducible":[44],"accurate":[45],"measurements,":[46],"methodology":[48],"examine":[52],"if":[53],"there":[54],"statistically":[57],"significant":[58],"difference":[59],"systems.":[66],"The":[67],"purpose":[68],"which":[70],"reduce":[73],"technical":[75],"risk":[76],"transportability":[78],"issues":[79],"that":[80],"occur":[81],"when":[82],"in":[86],"transition":[87],"from":[88],"legacy":[90],"system":[92],"an":[94],"emerging":[95],"system.":[97]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}