{"id":"https://openalex.org/W2099383324","doi":"https://doi.org/10.1109/tim.2009.2025068","title":"A New Neural-Network-Based Fault Diagnosis Approach for Analog Circuits by Using Kurtosis and Entropy as a Preprocessor","display_name":"A New Neural-Network-Based Fault Diagnosis Approach for Analog Circuits by Using Kurtosis and Entropy as a Preprocessor","publication_year":2009,"publication_date":"2009-09-24","ids":{"openalex":"https://openalex.org/W2099383324","doi":"https://doi.org/10.1109/tim.2009.2025068","mag":"2099383324"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2009.2025068","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2025068","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100390892","display_name":"Lifen Yuan","orcid":"https://orcid.org/0000-0002-6460-1978"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]},{"id":"https://openalex.org/I173759888","display_name":"Hunan Normal University","ror":"https://ror.org/053w1zy07","country_code":"CN","type":"education","lineage":["https://openalex.org/I173759888"]},{"id":"https://openalex.org/I3130607311","display_name":"Changsha Normal University","ror":"https://ror.org/02sqk3z62","country_code":"CN","type":"education","lineage":["https://openalex.org/I3130607311"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lifen Yuan","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China","College of Physics and Information Sciences, Hunan Normal University, Changsha, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]},{"raw_affiliation_string":"College of Physics and Information Sciences, Hunan Normal University, Changsha, China","institution_ids":["https://openalex.org/I3130607311","https://openalex.org/I173759888"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020019416","display_name":"Yigang He","orcid":"https://orcid.org/0000-0002-6642-0740"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yigang He","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102820647","display_name":"Jiaoying Huang","orcid":"https://orcid.org/0000-0002-2739-376X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiaoying Huang","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beijing Aeronautics and Astronautics University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beijing Aeronautics and Astronautics University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5020364531","display_name":"Yichuang Sun","orcid":"https://orcid.org/0000-0001-8352-2119"},"institutions":[{"id":"https://openalex.org/I141584323","display_name":"University of Hertfordshire","ror":"https://ror.org/0267vjk41","country_code":"GB","type":"education","lineage":["https://openalex.org/I141584323"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Yichuang Sun","raw_affiliation_strings":["School of Electronic, Communication and Electrical Engineering, University of Herfordshire, Hatfield, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic, Communication and Electrical Engineering, University of Herfordshire, Hatfield, UK","institution_ids":["https://openalex.org/I141584323"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":7.0202,"has_fulltext":false,"cited_by_count":205,"citation_normalized_percentile":{"value":0.97263168,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":100},"biblio":{"volume":"59","issue":"3","first_page":"586","last_page":"595"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.7130028605461121},{"id":"https://openalex.org/keywords/kurtosis","display_name":"Kurtosis","score":0.6252208948135376},{"id":"https://openalex.org/keywords/preprocessor","display_name":"Preprocessor","score":0.5544669032096863},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5538347363471985},{"id":"https://openalex.org/keywords/entropy","display_name":"Entropy (arrow of time)","score":0.544105052947998},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.519832193851471},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.47850361466407776},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4671076536178589},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.46349525451660156},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4535471200942993},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.43837684392929077},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.40667951107025146},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3922913670539856},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.35420334339141846},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27641788125038147},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.23066818714141846},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.10658964514732361}],"concepts":[{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.7130028605461121},{"id":"https://openalex.org/C166963901","wikidata":"https://www.wikidata.org/wiki/Q287251","display_name":"Kurtosis","level":2,"score":0.6252208948135376},{"id":"https://openalex.org/C34736171","wikidata":"https://www.wikidata.org/wiki/Q918333","display_name":"Preprocessor","level":2,"score":0.5544669032096863},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5538347363471985},{"id":"https://openalex.org/C106301342","wikidata":"https://www.wikidata.org/wiki/Q4117933","display_name":"Entropy (arrow of time)","level":2,"score":0.544105052947998},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.519832193851471},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.47850361466407776},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4671076536178589},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.46349525451660156},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4535471200942993},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.43837684392929077},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.40667951107025146},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3922913670539856},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.35420334339141846},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27641788125038147},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.23066818714141846},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10658964514732361},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2009.2025068","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2025068","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:uhra.herts.ac.uk:2299/9553","is_oa":false,"landing_page_url":"http://hdl.handle.net/2299/9553","pdf_url":null,"source":{"id":"https://openalex.org/S4306400241","display_name":"University of Hertfordshire Research Archive (University of Hertfordshire)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I141584323","host_organization_name":"University of Hertfordshire","host_organization_lineage":["https://openalex.org/I141584323"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W623552506","https://openalex.org/W656787519","https://openalex.org/W1532286644","https://openalex.org/W1548552866","https://openalex.org/W1548802052","https://openalex.org/W1572919062","https://openalex.org/W1981297107","https://openalex.org/W2027960842","https://openalex.org/W2030563088","https://openalex.org/W2035530690","https://openalex.org/W2046245205","https://openalex.org/W2088576840","https://openalex.org/W2099111195","https://openalex.org/W2101550795","https://openalex.org/W2108921639","https://openalex.org/W2110895713","https://openalex.org/W2113423548","https://openalex.org/W2121821621","https://openalex.org/W2121851502","https://openalex.org/W2165628269","https://openalex.org/W2274587946","https://openalex.org/W2504593202","https://openalex.org/W3151894820","https://openalex.org/W4205778870","https://openalex.org/W4300356733"],"related_works":["https://openalex.org/W4381516319","https://openalex.org/W1506384729","https://openalex.org/W2037499216","https://openalex.org/W4225568567","https://openalex.org/W4286378979","https://openalex.org/W2075698830","https://openalex.org/W3127045225","https://openalex.org/W3216026256","https://openalex.org/W2203433402","https://openalex.org/W2059891554"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,29,61],"new":[4],"fault":[5,68,181],"diagnosis":[6],"method":[7,13,72,168,214],"for":[8,66,94,106,169],"analog":[9,81],"circuits.":[10,96],"The":[11,53,70,126],"proposed":[12,71],"extracts":[14],"the":[15,19,23,35,40,47,51,100,107,112,116,121,124,133,136,143,157,161,175,179,199,206,213],"original":[16],"signals":[17,105],"from":[18,128,148],"output":[20,86],"terminals":[21],"of":[22,39,50,104,123,135,178],"circuits":[24],"under":[25],"test":[26],"(CUTs)":[27],"by":[28,83],"data":[30,192],"acquisition":[31],"board":[32],"and":[33,37,55,75,91,102,119,138,172,211],"finds":[34],"kurtoses":[36,56,139],"entropies":[38,54,137],"signals,":[41],"which":[42],"are":[43,57,189],"used":[44],"to":[45,60,150,202],"measure":[46],"high-order":[48],"statistics":[49],"signals.":[52],"then":[58],"fed":[59],"neural":[62,108],"network":[63,109,113],"as":[64],"inputs":[65],"further":[67],"classification.":[69],"can":[73,154,215],"detect":[74],"identify":[76,156],"faulty":[77,144,158,207],"components":[78,159],"in":[79],"an":[80],"circuit":[82],"analyzing":[84],"its":[85],"signal":[87],"with":[88],"high":[89],"accuracy":[90,177],"is":[92,140,183,195,209],"suitable":[93],"nonlinear":[95,173],"Preprocessing":[97],"based":[98],"on":[99],"kurtosis":[101],"entropy":[103],"classifier":[110],"simplifies":[111],"architecture,":[114],"reduces":[115],"training":[117],"time,":[118],"improves":[120],"performance":[122],"network.":[125],"results":[127],"our":[129],"examples":[130],"showed":[131],"that":[132],"trochoid":[134],"unique":[141],"when":[142,160,193,205],"component's":[145],"value":[146],"varies":[147],"zero":[149],"infinity;":[151],"thus,":[152,212],"we":[153],"correctly":[155],"responses":[162],"do":[163],"not":[164,217],"overlap.":[165],"Applying":[166],"this":[167],"three":[170],"linear":[171],"circuits,":[174],"average":[176],"achieved":[180],"recognition":[182],"more":[184],"than":[185],"99%,":[186],"although":[187],"there":[188],"some":[190],"overlapping":[191],"tolerance":[194],"considered.":[196],"Moreover,":[197],"all":[198],"trochoids":[200],"converge":[201],"one":[203],"point":[204],"component":[208],"open-circuited,":[210],"classify":[216],"only":[218],"soft":[219],"faults":[220],"but":[221],"also":[222],"hard":[223],"faults.":[224]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":17},{"year":2021,"cited_by_count":14},{"year":2020,"cited_by_count":29},{"year":2019,"cited_by_count":17},{"year":2018,"cited_by_count":21},{"year":2017,"cited_by_count":17},{"year":2016,"cited_by_count":17},{"year":2015,"cited_by_count":14},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":9},{"year":2012,"cited_by_count":9}],"updated_date":"2026-06-19T17:40:00.097472","created_date":"2025-10-10T00:00:00"}