{"id":"https://openalex.org/W2076334307","doi":"https://doi.org/10.1109/tim.2009.2023148","title":"Probe Characterization for Electromagnetic Near-Field Studies","display_name":"Probe Characterization for Electromagnetic Near-Field Studies","publication_year":2009,"publication_date":"2009-09-04","ids":{"openalex":"https://openalex.org/W2076334307","doi":"https://doi.org/10.1109/tim.2009.2023148","mag":"2076334307"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2009.2023148","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2023148","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036870899","display_name":"Sylvie Jarrix","orcid":null},"institutions":[{"id":"https://openalex.org/I4210134800","display_name":"Institut d'\u00c9lectronique et des Syst\u00e8mes","ror":"https://ror.org/0431hh004","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210095849","https://openalex.org/I4210134800"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"S. Jarrix","raw_affiliation_strings":["Institut d'Electronique du Sud, Universit\u00e9 Montpellier, Montpellier, France","Institut d\u2019Electronique et des Syst\u00e8mes","Radiations et composants"],"affiliations":[{"raw_affiliation_string":"Institut d'Electronique du Sud, Universit\u00e9 Montpellier, Montpellier, France","institution_ids":["https://openalex.org/I4210134800","https://openalex.org/I19894307"]},{"raw_affiliation_string":"Institut d\u2019Electronique et des Syst\u00e8mes","institution_ids":["https://openalex.org/I4210134800"]},{"raw_affiliation_string":"Radiations et composants","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082951822","display_name":"Tristan Dubois","orcid":"https://orcid.org/0000-0002-2495-2976"},"institutions":[{"id":"https://openalex.org/I4210134800","display_name":"Institut d'\u00c9lectronique et des Syst\u00e8mes","ror":"https://ror.org/0431hh004","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210095849","https://openalex.org/I4210134800"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"T. Dubois","raw_affiliation_strings":["Institut d'Electronique du Sud, Universit\u00e9 Montpellier, Montpellier, France","Institut d\u2019Electronique et des Syst\u00e8mes"],"affiliations":[{"raw_affiliation_string":"Institut d'Electronique du Sud, Universit\u00e9 Montpellier, Montpellier, France","institution_ids":["https://openalex.org/I4210134800","https://openalex.org/I19894307"]},{"raw_affiliation_string":"Institut d\u2019Electronique et des Syst\u00e8mes","institution_ids":["https://openalex.org/I4210134800"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037560768","display_name":"R. Adam","orcid":"https://orcid.org/0000-0001-8150-729X"},"institutions":[{"id":"https://openalex.org/I4210134800","display_name":"Institut d'\u00c9lectronique et des Syst\u00e8mes","ror":"https://ror.org/0431hh004","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210095849","https://openalex.org/I4210134800"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"R. Adam","raw_affiliation_strings":["Institut d'Electronique du Sud, Universit\u00e9 Montpellier, Montpellier, France","Institut d\u2019Electronique et des Syst\u00e8mes"],"affiliations":[{"raw_affiliation_string":"Institut d'Electronique du Sud, Universit\u00e9 Montpellier, Montpellier, France","institution_ids":["https://openalex.org/I4210134800","https://openalex.org/I19894307"]},{"raw_affiliation_string":"Institut d\u2019Electronique et des Syst\u00e8mes","institution_ids":["https://openalex.org/I4210134800"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062970941","display_name":"P. Nouvel","orcid":"https://orcid.org/0000-0003-1039-5432"},"institutions":[{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210134800","display_name":"Institut d'\u00c9lectronique et des Syst\u00e8mes","ror":"https://ror.org/0431hh004","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210095849","https://openalex.org/I4210134800"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"P. Nouvel","raw_affiliation_strings":["Institut d'Electronique du Sud, Universit\u00e9 Montpellier, Montpellier, France","T\u00e9rahertz, hyperfr\u00e9quence et optique","Institut d\u2019Electronique et des Syst\u00e8mes"],"affiliations":[{"raw_affiliation_string":"Institut d'Electronique du Sud, Universit\u00e9 Montpellier, Montpellier, France","institution_ids":["https://openalex.org/I4210134800","https://openalex.org/I19894307"]},{"raw_affiliation_string":"T\u00e9rahertz, hyperfr\u00e9quence et optique","institution_ids":[]},{"raw_affiliation_string":"Institut d\u2019Electronique et des Syst\u00e8mes","institution_ids":["https://openalex.org/I4210134800"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012645438","display_name":"B. Aza\u00efs","orcid":null},"institutions":[{"id":"https://openalex.org/I4210094417","display_name":"CEA Gramat","ror":"https://ror.org/00j8epd55","country_code":"FR","type":"government","lineage":["https://openalex.org/I4210094417","https://openalex.org/I4210101455"]},{"id":"https://openalex.org/I95583923","display_name":"Direction G\u00e9n\u00e9rale de l'Armement","ror":"https://ror.org/04wsqd844","country_code":"FR","type":"funder","lineage":["https://openalex.org/I2799681489","https://openalex.org/I2802818602","https://openalex.org/I95583923"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"B. Azais","raw_affiliation_strings":["D\u00e9l\u00e9gation G\u00e9n\u00e9rale de lArmement, Centre d'Etudes de Gramat, Gramat, France","Direction g\u00e9n\u00e9rale de l'armement [Bagneux]"],"affiliations":[{"raw_affiliation_string":"D\u00e9l\u00e9gation G\u00e9n\u00e9rale de lArmement, Centre d'Etudes de Gramat, Gramat, France","institution_ids":["https://openalex.org/I4210094417"]},{"raw_affiliation_string":"Direction g\u00e9n\u00e9rale de l'armement [Bagneux]","institution_ids":["https://openalex.org/I95583923"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027923051","display_name":"D. Gasquet","orcid":null},"institutions":[{"id":"https://openalex.org/I4210134800","display_name":"Institut d'\u00c9lectronique et des Syst\u00e8mes","ror":"https://ror.org/0431hh004","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210095849","https://openalex.org/I4210134800"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"D. Gasquet","raw_affiliation_strings":["Institut d'Electronique du Sud, Universit\u00e9 Montpellier, Montpellier, France","Institut d\u2019Electronique et des Syst\u00e8mes"],"affiliations":[{"raw_affiliation_string":"Institut d'Electronique du Sud, Universit\u00e9 Montpellier, Montpellier, France","institution_ids":["https://openalex.org/I4210134800","https://openalex.org/I19894307"]},{"raw_affiliation_string":"Institut d\u2019Electronique et des Syst\u00e8mes","institution_ids":["https://openalex.org/I4210134800"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5036870899"],"corresponding_institution_ids":["https://openalex.org/I19894307","https://openalex.org/I4210134800"],"apc_list":null,"apc_paid":null,"fwci":3.5889,"has_fulltext":false,"cited_by_count":67,"citation_normalized_percentile":{"value":0.92876231,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"59","issue":"2","first_page":"292","last_page":"300"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromagnetic-field","display_name":"Electromagnetic field","score":0.7014832496643066},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.6912478804588318},{"id":"https://openalex.org/keywords/microstrip","display_name":"Microstrip","score":0.6306542158126831},{"id":"https://openalex.org/keywords/electric-field","display_name":"Electric field","score":0.5760976672172546},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.5479469299316406},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.5169650912284851},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4877406060695648},{"id":"https://openalex.org/keywords/resolution","display_name":"Resolution (logic)","score":0.4496932923793793},{"id":"https://openalex.org/keywords/biomagnetism","display_name":"Biomagnetism","score":0.4284900426864624},{"id":"https://openalex.org/keywords/nuclear-magnetic-resonance","display_name":"Nuclear magnetic resonance","score":0.3892567455768585},{"id":"https://openalex.org/keywords/computational-physics","display_name":"Computational physics","score":0.3355419933795929},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2850496172904968},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2336406111717224},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07038843631744385},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.07012000679969788}],"concepts":[{"id":"https://openalex.org/C28843909","wikidata":"https://www.wikidata.org/wiki/Q177625","display_name":"Electromagnetic field","level":2,"score":0.7014832496643066},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.6912478804588318},{"id":"https://openalex.org/C123657345","wikidata":"https://www.wikidata.org/wiki/Q639055","display_name":"Microstrip","level":2,"score":0.6306542158126831},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.5760976672172546},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5479469299316406},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.5169650912284851},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4877406060695648},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.4496932923793793},{"id":"https://openalex.org/C78902741","wikidata":"https://www.wikidata.org/wiki/Q4915071","display_name":"Biomagnetism","level":3,"score":0.4284900426864624},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.3892567455768585},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.3355419933795929},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2850496172904968},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2336406111717224},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07038843631744385},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07012000679969788},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2009.2023148","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2023148","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-01632350v1","is_oa":false,"landing_page_url":"https://hal.science/hal-01632350","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement, 2010, 59 (2), pp.292 - 300. &#x27E8;10.1109/TIM.2009.2023148&#x27E9;","raw_type":"Journal articles"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions","score":0.5400000214576721},{"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities","score":0.4699999988079071}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W791709684","https://openalex.org/W1662343162","https://openalex.org/W1840136919","https://openalex.org/W2011848514","https://openalex.org/W2082402215","https://openalex.org/W2090688202","https://openalex.org/W2098372710","https://openalex.org/W2111156423","https://openalex.org/W2116285442","https://openalex.org/W2125230693","https://openalex.org/W2129549095","https://openalex.org/W2135632680","https://openalex.org/W2149719573","https://openalex.org/W2463405736","https://openalex.org/W6622630792"],"related_works":["https://openalex.org/W4366829084","https://openalex.org/W612834876","https://openalex.org/W99975761","https://openalex.org/W2362645459","https://openalex.org/W3129131408","https://openalex.org/W4377941396","https://openalex.org/W4388427673","https://openalex.org/W2997244960","https://openalex.org/W2368942544","https://openalex.org/W1984794374"],"abstract_inverted_index":{"<para":[0],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[1],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[2],"Probes":[3],"used":[4],"for":[5,34,44,64],"contactless":[6],"electromagnetic":[7],"field":[8,47,86],"capture":[9,87],"or":[10,25],"injection":[11],"are":[12,61],"characterized.":[13],"Depending":[14],"on":[15],"the":[16,23,32,45,52,55,74,85],"probe":[17,48],"structure,":[18],"they":[19],"interact":[20],"preferentially":[21],"with":[22,82],"electric":[24,69],"magnetic":[26,46,71],"field.":[27],"The":[28],"optimal":[29],"size":[30,53],"of":[31,77,88],"probes":[33],"broad-frequency-band":[35],"measurements":[36,79],"is":[37,41,80],"investigated.":[38],"However,":[39],"it":[40],"shown":[42],"particularly":[43],"that":[49],"considerations":[50],"about":[51],"and":[54,70],"structures":[56],"presented":[57],"in":[58],"this":[59],"paper":[60],"not":[62],"sufficient":[63],"a":[65,89],"good":[66],"discrimination":[67],"between":[68],"fields.":[72],"Then,":[73],"space":[75],"resolution":[76],"near-field":[78],"discussed,":[81],"application":[83],"to":[84],"microstrip":[90],"line":[91],"under":[92],"operation.":[93],"</para>":[94]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":13},{"year":2023,"cited_by_count":12},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}