{"id":"https://openalex.org/W2123497713","doi":"https://doi.org/10.1109/tim.2009.2020837","title":"A Precise Analysis of the IEC Flickermeter When Subject to Rectangular Voltage Fluctuations","display_name":"A Precise Analysis of the IEC Flickermeter When Subject to Rectangular Voltage Fluctuations","publication_year":2009,"publication_date":"2009-07-30","ids":{"openalex":"https://openalex.org/W2123497713","doi":"https://doi.org/10.1109/tim.2009.2020837","mag":"2123497713"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2009.2020837","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2020837","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102027711","display_name":"Jes\u00fas Ruiz","orcid":"https://orcid.org/0000-0002-9481-742X"},"institutions":[{"id":"https://openalex.org/I169108374","display_name":"University of the Basque Country","ror":"https://ror.org/000xsnr85","country_code":"ES","type":"education","lineage":["https://openalex.org/I169108374"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"J. Ruiz","raw_affiliation_strings":["Electronics and Telecommunications Department, University of Basque Country (UPV-EHU), Bilbao, Spain","Electron. & Telecommun. Dept., Univ. of the Basque Country, Bilbao, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Telecommunications Department, University of Basque Country (UPV-EHU), Bilbao, Spain","institution_ids":["https://openalex.org/I169108374"]},{"raw_affiliation_string":"Electron. & Telecommun. Dept., Univ. of the Basque Country, Bilbao, Spain","institution_ids":["https://openalex.org/I169108374"]}]},{"author_position":"middle","author":{"id":null,"display_name":"J.J. Gutierrez","orcid":null},"institutions":[{"id":"https://openalex.org/I169108374","display_name":"University of the Basque Country","ror":"https://ror.org/000xsnr85","country_code":"ES","type":"education","lineage":["https://openalex.org/I169108374"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"J.J. Gutierrez","raw_affiliation_strings":["Electronics and Telecommunications Department, University of Basque Country (UPV-EHU), Bilbao, Spain","Electron. & Telecommun. Dept., Univ. of the Basque Country, Bilbao, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Telecommunications Department, University of Basque Country (UPV-EHU), Bilbao, Spain","institution_ids":["https://openalex.org/I169108374"]},{"raw_affiliation_string":"Electron. & Telecommun. Dept., Univ. of the Basque Country, Bilbao, Spain","institution_ids":["https://openalex.org/I169108374"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020779678","display_name":"Unai Irusta","orcid":"https://orcid.org/0000-0001-9521-1852"},"institutions":[{"id":"https://openalex.org/I169108374","display_name":"University of the Basque Country","ror":"https://ror.org/000xsnr85","country_code":"ES","type":"education","lineage":["https://openalex.org/I169108374"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"U. Irusta","raw_affiliation_strings":["Electronics and Telecommunications Department, University of Basque Country (UPV-EHU), Bilbao, Spain","Electron. & Telecommun. Dept., Univ. of the Basque Country, Bilbao, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Telecommunications Department, University of Basque Country (UPV-EHU), Bilbao, Spain","institution_ids":["https://openalex.org/I169108374"]},{"raw_affiliation_string":"Electron. & Telecommun. Dept., Univ. of the Basque Country, Bilbao, Spain","institution_ids":["https://openalex.org/I169108374"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030747980","display_name":"A. Lazkano","orcid":"https://orcid.org/0000-0001-7506-0890"},"institutions":[{"id":"https://openalex.org/I169108374","display_name":"University of the Basque Country","ror":"https://ror.org/000xsnr85","country_code":"ES","type":"education","lineage":["https://openalex.org/I169108374"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"A. Lazkano","raw_affiliation_strings":["Electronics and Telecommunications Department, University of Basque Country (UPV-EHU), Bilbao, Spain","Electron. & Telecommun. Dept., Univ. of the Basque Country, Bilbao, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Telecommunications Department, University of Basque Country (UPV-EHU), Bilbao, Spain","institution_ids":["https://openalex.org/I169108374"]},{"raw_affiliation_string":"Electron. & Telecommun. Dept., Univ. of the Basque Country, Bilbao, Spain","institution_ids":["https://openalex.org/I169108374"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I169108374"],"apc_list":null,"apc_paid":null,"fwci":1.1748,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.77944862,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"58","issue":"11","first_page":"3839","last_page":"3846"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11449","display_name":"Mechanical and Optical Resonators","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11449","display_name":"Mechanical and Optical Resonators","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11230","display_name":"Innovative Energy Harvesting Technologies","score":0.9868000149726868,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/classification-of-discontinuities","display_name":"Classification of discontinuities","score":0.8011670112609863},{"id":"https://openalex.org/keywords/flicker","display_name":"Flicker","score":0.6350862979888916},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5711904168128967},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5314643979072571},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.43028131127357483},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.33645111322402954},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.33380836248397827},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2472781538963318},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.1563243567943573},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.15517181158065796}],"concepts":[{"id":"https://openalex.org/C15627037","wikidata":"https://www.wikidata.org/wiki/Q541961","display_name":"Classification of discontinuities","level":2,"score":0.8011670112609863},{"id":"https://openalex.org/C19743564","wikidata":"https://www.wikidata.org/wiki/Q25378119","display_name":"Flicker","level":2,"score":0.6350862979888916},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5711904168128967},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5314643979072571},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.43028131127357483},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.33645111322402954},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.33380836248397827},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2472781538963318},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.1563243567943573},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.15517181158065796},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2009.2020837","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2020837","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.550000011920929,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W251391660","https://openalex.org/W1986727005","https://openalex.org/W1989186135","https://openalex.org/W2021545947","https://openalex.org/W2034841108","https://openalex.org/W2035231347","https://openalex.org/W2050293604","https://openalex.org/W2116812861","https://openalex.org/W2117800490","https://openalex.org/W2138338085","https://openalex.org/W2542652612","https://openalex.org/W2547489794","https://openalex.org/W2985846083","https://openalex.org/W6609497277"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W1972096828","https://openalex.org/W2529137940","https://openalex.org/W4302048708","https://openalex.org/W2359913921","https://openalex.org/W2393542839","https://openalex.org/W2461212857","https://openalex.org/W2608689891","https://openalex.org/W4205298958","https://openalex.org/W1968167504"],"abstract_inverted_index":{"The":[0],"Pstmeasured":[1],"using":[2],"the":[3,19,40,50,57,76,80,88,93,106,116,127,130,134],"International":[4],"Electrotechnical":[5],"Commission":[6],"(IEC)":[7],"flickermeter":[8,89,108],"for":[9,15],"a":[10,28,37,101],"rectangular":[11,113],"fluctuation":[12],"is":[13],"discontinuous":[14],"certain":[16],"values":[17],"of":[18,21,32,39,43,49,59,87,104,120,129,133],"frequency":[20],"fluctuation.":[22],"These":[23],"discontinuities":[24,72,122],"do":[25,73],"not":[26,74],"represent":[27],"real":[29],"physiological":[30],"perception":[31],"flicker,":[33],"but":[34],"they":[35,82],"are":[36,83],"consequence":[38],"nonlinear":[41],"behavior":[42],"blocks":[44],"1,":[45],"4,":[46],"and":[47,62,67,118],"5":[48],"IEC":[51,94,107],"flickermeter.":[52,135],"We":[53],"have":[54,64],"theoretically":[55],"proved":[56],"origin":[58],"these":[60,71,121],"discontinuities,":[61],"we":[63],"experimentally":[65],"identified":[66],"quantified":[68],"them.":[69],"Although":[70],"influence":[75],"Pstvalues":[77],"recorded":[78],"in":[79,92],"field,":[81],"an":[84],"intrinsic":[85],"characteristic":[86],"model":[90],"proposed":[91],"61000-4-15":[95],"standard.":[96],"This":[97],"paper":[98],"contributes":[99],"to":[100,112,125],"better":[102],"understanding":[103],"how":[105],"works":[109],"when":[110],"subject":[111],"fluctuations.":[114],"Furthermore,":[115],"identification":[117],"quantification":[119],"can":[123],"help":[124],"improve":[126],"design":[128],"performance":[131],"tests":[132]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}