{"id":"https://openalex.org/W2105007456","doi":"https://doi.org/10.1109/tim.2009.2019310","title":"Research on Novel Grating Eddy-Current Absolute-Position Sensor","display_name":"Research on Novel Grating Eddy-Current Absolute-Position Sensor","publication_year":2009,"publication_date":"2009-07-30","ids":{"openalex":"https://openalex.org/W2105007456","doi":"https://doi.org/10.1109/tim.2009.2019310","mag":"2105007456"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2009.2019310","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2019310","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Liu Weiwen","orcid":null},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liu Weiwen","raw_affiliation_strings":["Department of Instrument Science and Engineering, Shanghai Jiaotong University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Instrument Science and Engineering, Shanghai Jiaotong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066103561","display_name":"Hui Zhao","orcid":"https://orcid.org/0000-0003-2942-3376"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhao Hui","raw_affiliation_strings":["Department of Instrument Science and Engineering, Shanghai Jiaotong University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Instrument Science and Engineering, Shanghai Jiaotong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060141466","display_name":"Hongli Qi","orcid":null},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]},{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qi Hongli","raw_affiliation_strings":["Department Electronic Engineering, North University of China, Taiyuan, China","Department of Instrument Science and Engineering, Shanghai Jiaotong University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department Electronic Engineering, North University of China, Taiyuan, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"Department of Instrument Science and Engineering, Shanghai Jiaotong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.7122,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":{"value":0.85468237,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"58","issue":"10","first_page":"3678","last_page":"3683"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9918000102043152,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/grating","display_name":"Grating","score":0.6756504774093628},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.6089315414428711},{"id":"https://openalex.org/keywords/calipers","display_name":"Calipers","score":0.5974633693695068},{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.5969187617301941},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.5079894661903381},{"id":"https://openalex.org/keywords/reflection","display_name":"Reflection (computer programming)","score":0.48129549622535706},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.465213805437088},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.45989468693733215},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.41744565963745117},{"id":"https://openalex.org/keywords/fabrication","display_name":"Fabrication","score":0.41499724984169006},{"id":"https://openalex.org/keywords/transducer","display_name":"Transducer","score":0.41238734126091003},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3574010729789734},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3251938223838806},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.2581268846988678},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2387007772922516},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.21751779317855835},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11882323026657104}],"concepts":[{"id":"https://openalex.org/C2777813233","wikidata":"https://www.wikidata.org/wiki/Q1527816","display_name":"Grating","level":2,"score":0.6756504774093628},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.6089315414428711},{"id":"https://openalex.org/C186738849","wikidata":"https://www.wikidata.org/wiki/Q12408","display_name":"Calipers","level":2,"score":0.5974633693695068},{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.5969187617301941},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.5079894661903381},{"id":"https://openalex.org/C65682993","wikidata":"https://www.wikidata.org/wiki/Q1056451","display_name":"Reflection (computer programming)","level":2,"score":0.48129549622535706},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.465213805437088},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.45989468693733215},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.41744565963745117},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.41499724984169006},{"id":"https://openalex.org/C56318395","wikidata":"https://www.wikidata.org/wiki/Q215928","display_name":"Transducer","level":2,"score":0.41238734126091003},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3574010729789734},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3251938223838806},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.2581268846988678},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2387007772922516},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.21751779317855835},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11882323026657104},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2009.2019310","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2019310","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1600086423","https://openalex.org/W1972036710","https://openalex.org/W2043539550","https://openalex.org/W2058220265","https://openalex.org/W2069479280","https://openalex.org/W2090478105","https://openalex.org/W2093273389","https://openalex.org/W2104384339","https://openalex.org/W2120639987","https://openalex.org/W2136726466","https://openalex.org/W2139290661","https://openalex.org/W2141662301","https://openalex.org/W2352639809"],"related_works":["https://openalex.org/W2371094352","https://openalex.org/W2384705931","https://openalex.org/W2362544213","https://openalex.org/W1987081680","https://openalex.org/W2353448705","https://openalex.org/W3195805269","https://openalex.org/W2378648583","https://openalex.org/W2092110463","https://openalex.org/W2381783751","https://openalex.org/W2013977564"],"abstract_inverted_index":{"A":[0],"novel":[1],"grating":[2],"eddy-current":[3],"absolute-position":[4],"sensor":[5,23],"(GECS)":[6],"that":[7,81],"can":[8,42,95,113,133],"work":[9],"in":[10,38,99,116],"a":[11,31,100],"harsh":[12],"environment":[13],"and":[14,33,70,124,127],"its":[15],"low-power":[16],"measurement":[17,66,72,86],"system":[18,73],"are":[19,76],"presented.":[20],"The":[21,65,106],"designed":[22],"consists":[24],"of":[25,74,84,91,103,130],"reflection":[26],"conductors":[27],"uniformly":[28],"arranged":[29],"on":[30,111],"line":[32],"eight":[34],"corresponding":[35],"rectangular":[36],"coils":[37],"an":[39],"array,":[40],"which":[41,88],"be":[43,114],"manufactured":[44],"by":[45],"printed":[46],"circuit":[47],"board":[48],"(PCB)":[49],"technics.":[50],"Hence,":[51],"it":[52],"is":[53,89],"easy":[54],"to":[55,60],"realize":[56],"mass":[57],"production":[58],"due":[59],"the":[61,68,71,82,85,92,128],"simple":[62],"fabrication":[63],"process.":[64],"principle,":[67],"design,":[69],"GECS":[75,112],"introduced.":[77],"Experimental":[78],"results":[79],"show":[80],"accuracy":[83],"system,":[87],"independent":[90],"moving":[93],"speed,":[94],"reach":[96,134],"plusmn0.015":[97],"mm":[98],"full":[101],"scale":[102],"300":[104],"mm.":[105],"electronic":[107],"digital":[108],"caliper":[109],"based":[110],"used":[115],"liquid":[117],"medium,":[118],"such":[119],"as":[120],"water,":[121],"oil,":[122],"coolant,":[123],"so":[125],"on,":[126],"rating":[129],"being":[131],"waterproof":[132],"IP67.":[135]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}