{"id":"https://openalex.org/W2136400384","doi":"https://doi.org/10.1109/tim.2009.2018009","title":"A Combined TD\u2013FD Method for Enhanced Reflectometry Measurements in Liquid Quality Monitoring","display_name":"A Combined TD\u2013FD Method for Enhanced Reflectometry Measurements in Liquid Quality Monitoring","publication_year":2009,"publication_date":"2009-06-16","ids":{"openalex":"https://openalex.org/W2136400384","doi":"https://doi.org/10.1109/tim.2009.2018009","mag":"2136400384"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2009.2018009","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2018009","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043509431","display_name":"Andrea Cataldo","orcid":"https://orcid.org/0000-0001-9031-7690"},"institutions":[{"id":"https://openalex.org/I131729948","display_name":"University of Salerno","ror":"https://ror.org/0192m2k53","country_code":"IT","type":"education","lineage":["https://openalex.org/I131729948"]},{"id":"https://openalex.org/I142910587","display_name":"University of Salento","ror":"https://ror.org/03fc1k060","country_code":"IT","type":"education","lineage":["https://openalex.org/I142910587"]},{"id":"https://openalex.org/I4210096856","display_name":"Innovation Engineering (Italy)","ror":"https://ror.org/00sxjp357","country_code":"IT","type":"company","lineage":["https://openalex.org/I4210096856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Cataldo","raw_affiliation_strings":["Department of Innovation Engineering, University of Salerno, Lecce, Italy","Dept. of Innovation Engineering, University of Salento, Lecce, Italy#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Innovation Engineering, University of Salerno, Lecce, Italy","institution_ids":["https://openalex.org/I131729948","https://openalex.org/I4210096856"]},{"raw_affiliation_string":"Dept. of Innovation Engineering, University of Salento, Lecce, Italy#TAB#","institution_ids":["https://openalex.org/I142910587"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042293969","display_name":"Luca Catarinucci","orcid":"https://orcid.org/0000-0001-9735-6844"},"institutions":[{"id":"https://openalex.org/I131729948","display_name":"University of Salerno","ror":"https://ror.org/0192m2k53","country_code":"IT","type":"education","lineage":["https://openalex.org/I131729948"]},{"id":"https://openalex.org/I142910587","display_name":"University of Salento","ror":"https://ror.org/03fc1k060","country_code":"IT","type":"education","lineage":["https://openalex.org/I142910587"]},{"id":"https://openalex.org/I4210096856","display_name":"Innovation Engineering (Italy)","ror":"https://ror.org/00sxjp357","country_code":"IT","type":"company","lineage":["https://openalex.org/I4210096856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"L. Catarinucci","raw_affiliation_strings":["Department of Innovation Engineering, University of Salerno, Lecce, Italy","Dept. of Innovation Engineering, University of Salento, Lecce, Italy#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Innovation Engineering, University of Salerno, Lecce, Italy","institution_ids":["https://openalex.org/I131729948","https://openalex.org/I4210096856"]},{"raw_affiliation_string":"Dept. of Innovation Engineering, University of Salento, Lecce, Italy#TAB#","institution_ids":["https://openalex.org/I142910587"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013237455","display_name":"Luciano Tarricone","orcid":null},"institutions":[{"id":"https://openalex.org/I131729948","display_name":"University of Salerno","ror":"https://ror.org/0192m2k53","country_code":"IT","type":"education","lineage":["https://openalex.org/I131729948"]},{"id":"https://openalex.org/I142910587","display_name":"University of Salento","ror":"https://ror.org/03fc1k060","country_code":"IT","type":"education","lineage":["https://openalex.org/I142910587"]},{"id":"https://openalex.org/I4210096856","display_name":"Innovation Engineering (Italy)","ror":"https://ror.org/00sxjp357","country_code":"IT","type":"company","lineage":["https://openalex.org/I4210096856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"L. Tarricone","raw_affiliation_strings":["Department of Innovation Engineering, University of Salerno, Lecce, Italy","Dept. of Innovation Engineering, University of Salento, Lecce, Italy#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Innovation Engineering, University of Salerno, Lecce, Italy","institution_ids":["https://openalex.org/I131729948","https://openalex.org/I4210096856"]},{"raw_affiliation_string":"Dept. of Innovation Engineering, University of Salento, Lecce, Italy#TAB#","institution_ids":["https://openalex.org/I142910587"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081914151","display_name":"Filippo Attivissimo","orcid":"https://orcid.org/0000-0002-2667-8982"},"institutions":[{"id":"https://openalex.org/I59361560","display_name":"Instituto Polit\u00e9cnico Nacional","ror":"https://ror.org/059sp8j34","country_code":"MX","type":"education","lineage":["https://openalex.org/I59361560"]},{"id":"https://openalex.org/I68618741","display_name":"Polytechnic University of Bari","ror":"https://ror.org/03c44v465","country_code":"IT","type":"education","lineage":["https://openalex.org/I68618741"]}],"countries":["IT","MX"],"is_corresponding":false,"raw_author_name":"F. Attivissimo","raw_affiliation_strings":["Dipartimento Elettrotecnica ed Elettronica, Politecnico di Bari, Bari, Italy","Politecnico Di Bari#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dipartimento Elettrotecnica ed Elettronica, Politecnico di Bari, Bari, Italy","institution_ids":["https://openalex.org/I68618741"]},{"raw_affiliation_string":"Politecnico Di Bari#TAB#","institution_ids":["https://openalex.org/I59361560"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028793067","display_name":"Emanuele Piuzzi","orcid":"https://orcid.org/0000-0002-3822-139X"},"institutions":[{"id":"https://openalex.org/I861853513","display_name":"Sapienza University of Rome","ror":"https://ror.org/02be6w209","country_code":"IT","type":"education","lineage":["https://openalex.org/I861853513"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"E. Piuzzi","raw_affiliation_strings":["Department of Electronic Engineering, University of Roma La Sapienza, Rome, Italy","Engineering, Electronics and Telecommunications"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, University of Roma La Sapienza, Rome, Italy","institution_ids":["https://openalex.org/I861853513"]},{"raw_affiliation_string":"Engineering, Electronics and Telecommunications","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.7706,"has_fulltext":false,"cited_by_count":38,"citation_normalized_percentile":{"value":0.92589427,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"58","issue":"10","first_page":"3534","last_page":"3543"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11312","display_name":"Soil Moisture and Remote Sensing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2305","display_name":"Environmental Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11312","display_name":"Soil Moisture and Remote Sensing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2305","display_name":"Environmental Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":0.9886000156402588,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reflectometry","display_name":"Reflectometry","score":0.9294003844261169},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5749870538711548},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.5294095277786255},{"id":"https://openalex.org/keywords/time-domain","display_name":"Time domain","score":0.5074254870414734},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5003173351287842},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.48523807525634766},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.4691672921180725},{"id":"https://openalex.org/keywords/network-analyzer","display_name":"Network analyzer (electrical)","score":0.43014055490493774},{"id":"https://openalex.org/keywords/frequency-domain","display_name":"Frequency domain","score":0.4243302345275879},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3253212571144104},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20629721879959106},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.097953200340271},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08124542236328125}],"concepts":[{"id":"https://openalex.org/C2778925768","wikidata":"https://www.wikidata.org/wiki/Q3454718","display_name":"Reflectometry","level":3,"score":0.9294003844261169},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5749870538711548},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.5294095277786255},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.5074254870414734},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5003173351287842},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.48523807525634766},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.4691672921180725},{"id":"https://openalex.org/C99101257","wikidata":"https://www.wikidata.org/wiki/Q1529374","display_name":"Network analyzer (electrical)","level":2,"score":0.43014055490493774},{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.4243302345275879},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3253212571144104},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20629721879959106},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.097953200340271},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08124542236328125},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2009.2018009","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2018009","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:iris.uniroma1.it:11573/146266","is_oa":false,"landing_page_url":"http://www.scopus.com/inward/record.url?eid=2-s2.0-70349453585&partnerID=65&md5=18f762d25ca80aa362db776322c6616c","pdf_url":null,"source":{"id":"https://openalex.org/S4377196107","display_name":"IRIS Research product catalog (Sapienza University of Rome)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.5699999928474426}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1965910111","https://openalex.org/W1970772750","https://openalex.org/W1989554834","https://openalex.org/W2009855773","https://openalex.org/W2017685178","https://openalex.org/W2028794894","https://openalex.org/W2028803296","https://openalex.org/W2031066739","https://openalex.org/W2040865009","https://openalex.org/W2044016271","https://openalex.org/W2067574634","https://openalex.org/W2096821301","https://openalex.org/W2097346889","https://openalex.org/W2101714204","https://openalex.org/W2102634887","https://openalex.org/W2111460811","https://openalex.org/W2115566343","https://openalex.org/W2123256340","https://openalex.org/W2123336468","https://openalex.org/W2129383511","https://openalex.org/W2130579792","https://openalex.org/W2158769179","https://openalex.org/W2171617502","https://openalex.org/W2505908204","https://openalex.org/W4240756890","https://openalex.org/W4250263439"],"related_works":["https://openalex.org/W2971284929","https://openalex.org/W3184095098","https://openalex.org/W4247269142","https://openalex.org/W2396133027","https://openalex.org/W2084522216","https://openalex.org/W2169212713","https://openalex.org/W1965835773","https://openalex.org/W1493885512","https://openalex.org/W2021460492","https://openalex.org/W3046000334"],"abstract_inverted_index":{"Measurement":[0],"and":[1,33,55,68,123,128,171],"control":[2],"of":[3,7,27,83,87,98,109,119,158,169],"the":[4,37,74,80,84,94,99,106,110,117,125,135,147,159,164,167],"dielectric":[5,85,100],"parameters":[6,86,101],"liquids":[8],"play":[9],"a":[10,43,60,120,150],"major":[11],"role":[12],"in":[13,146,175],"industrial":[14,177],"quality-control":[15],"applications.":[16,179],"Although":[17],"several":[18],"techniques":[19],"are":[20,140],"currently":[21],"available":[22],"to":[23,52,77,132,162],"this":[24,58],"aim,":[25],"none":[26],"them":[28],"is":[29,72,76,102,161],"simultaneously":[30],"accurate,":[31],"cost-effective,":[32],"reasonably":[34],"quick.":[35],"On":[36],"other":[38],"hand,":[39],"reflectometry":[40,66],"has":[41],"become":[42],"very":[44],"attractive":[45],"method":[46,62],"for":[47,166],"monitoring":[48,178],"applications,":[49],"mostly":[50],"thanks":[51],"its":[53],"accuracy":[54,82],"flexibility.":[56],"In":[57],"paper,":[59],"combined":[61,107,137],"based":[63],"on":[64],"time-domain":[65],"(TDR)":[67],"frequency-domain":[69],"(FD)":[70],"analysis":[71],"presented:":[73],"aim":[75],"substantially":[78],"improve":[79],"measurement":[81],"liquids.":[88],"Starting":[89],"with":[90,142],"typical":[91],"TDR":[92,173],"measurements,":[93],"associated":[95],"FD":[96,148],"evaluation":[97],"considerably":[103],"enhanced":[104],"through":[105,149],"effect":[108],"following:":[111],"1)":[112],"specific":[113],"data-processing":[114],"techniques;":[115],"2)":[116],"implementation":[118],"calibration":[121],"procedure;":[122],"3)":[124],"final":[126],"modeling":[127],"minimization":[129],"routine.":[130],"Furthermore,":[131],"definitively":[133],"assess":[134],"proposed":[136],"procedure,":[138],"results":[139],"compared":[141],"measurements":[143],"directly":[144],"performed":[145],"vector":[151],"network":[152],"analyzer":[153],"(VNA).":[154],"The":[155],"ultimate":[156],"goal":[157],"work":[160],"pave":[163],"way":[165],"adoption":[168],"inexpensive":[170],"portable":[172],"devices":[174],"practical":[176]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}