{"id":"https://openalex.org/W2987981547","doi":"https://doi.org/10.1109/tim.2009.2018003","title":"Using ANOVA in a Microwave Round-Robin Comparison","display_name":"Using ANOVA in a Microwave Round-Robin Comparison","publication_year":2009,"publication_date":"2009-06-25","ids":{"openalex":"https://openalex.org/W2987981547","doi":"https://doi.org/10.1109/tim.2009.2018003","mag":"2987981547"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2009.2018003","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2018003","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019777536","display_name":"Kurt Barb\u00e9","orcid":"https://orcid.org/0000-0002-7825-9077"},"institutions":[{"id":"https://openalex.org/I13469542","display_name":"Vrije Universiteit Brussel","ror":"https://ror.org/006e5kg04","country_code":"BE","type":"education","lineage":["https://openalex.org/I13469542"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"K. Barbe","raw_affiliation_strings":["Electrical Measurement Department (ELEC), Vrije Universiteit Brussel, Brussels, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Measurement Department (ELEC), Vrije Universiteit Brussel, Brussels, Belgium","institution_ids":["https://openalex.org/I13469542"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108510713","display_name":"Wendy Van Moer","orcid":null},"institutions":[{"id":"https://openalex.org/I13469542","display_name":"Vrije Universiteit Brussel","ror":"https://ror.org/006e5kg04","country_code":"BE","type":"education","lineage":["https://openalex.org/I13469542"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"W. Van Moer","raw_affiliation_strings":["Electrical Measurement Department (ELEC), Vrije Universiteit Brussel, Brussels, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Measurement Department (ELEC), Vrije Universiteit Brussel, Brussels, Belgium","institution_ids":["https://openalex.org/I13469542"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074429391","display_name":"Yves Rolain","orcid":"https://orcid.org/0000-0003-2738-7914"},"institutions":[{"id":"https://openalex.org/I13469542","display_name":"Vrije Universiteit Brussel","ror":"https://ror.org/006e5kg04","country_code":"BE","type":"education","lineage":["https://openalex.org/I13469542"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Y. Rolain","raw_affiliation_strings":["Electrical Measurement Department (ELEC), Vrije Universiteit Brussel, Brussels, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Measurement Department (ELEC), Vrije Universiteit Brussel, Brussels, Belgium","institution_ids":["https://openalex.org/I13469542"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I13469542"],"apc_list":null,"apc_paid":null,"fwci":0.3003,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.6849235,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"58","issue":"10","first_page":"3490","last_page":"3498"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9908999800682068,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9707000255584717,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.6141198873519897},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.6059989929199219},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.5754810571670532},{"id":"https://openalex.org/keywords/device-under-test","display_name":"Device under test","score":0.5591334700584412},{"id":"https://openalex.org/keywords/harmonic-analysis","display_name":"Harmonic analysis","score":0.5140734910964966},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.4649924337863922},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44927841424942017},{"id":"https://openalex.org/keywords/harmonic","display_name":"Harmonic","score":0.42440199851989746},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41783392429351807},{"id":"https://openalex.org/keywords/variance","display_name":"Variance (accounting)","score":0.41073527932167053},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3588733673095703},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.25992637872695923},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23446810245513916},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.216358482837677},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1969263255596161},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17357492446899414}],"concepts":[{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.6141198873519897},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.6059989929199219},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.5754810571670532},{"id":"https://openalex.org/C76249512","wikidata":"https://www.wikidata.org/wiki/Q1206780","display_name":"Device under test","level":3,"score":0.5591334700584412},{"id":"https://openalex.org/C131770355","wikidata":"https://www.wikidata.org/wiki/Q876215","display_name":"Harmonic analysis","level":2,"score":0.5140734910964966},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.4649924337863922},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44927841424942017},{"id":"https://openalex.org/C127934551","wikidata":"https://www.wikidata.org/wiki/Q1148098","display_name":"Harmonic","level":2,"score":0.42440199851989746},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41783392429351807},{"id":"https://openalex.org/C196083921","wikidata":"https://www.wikidata.org/wiki/Q7915758","display_name":"Variance (accounting)","level":2,"score":0.41073527932167053},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3588733673095703},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.25992637872695923},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23446810245513916},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.216358482837677},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1969263255596161},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17357492446899414},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121955636","wikidata":"https://www.wikidata.org/wiki/Q4116214","display_name":"Accounting","level":1,"score":0.0},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2009.2018003","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2018003","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.4300000071525574,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W148455047","https://openalex.org/W235409484","https://openalex.org/W597202749","https://openalex.org/W2056099894","https://openalex.org/W2113346827","https://openalex.org/W2117315946","https://openalex.org/W2122902902","https://openalex.org/W2141815969","https://openalex.org/W2156016295","https://openalex.org/W2318802957","https://openalex.org/W4205470728","https://openalex.org/W4237456942","https://openalex.org/W4253355402","https://openalex.org/W4256271404"],"related_works":["https://openalex.org/W2587667458","https://openalex.org/W2163128389","https://openalex.org/W2164070943","https://openalex.org/W2121926536","https://openalex.org/W2390836177","https://openalex.org/W2983963786","https://openalex.org/W1516921425","https://openalex.org/W2543281656","https://openalex.org/W2106781555","https://openalex.org/W2097281691"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"a":[3,14,28,38,49],"procedure":[4],"for":[5],"comparing":[6],"calibrated":[7],"nonlinear":[8,15,29],"radio-frequency":[9],"(RF)":[10],"measurements":[11],"performed":[12],"on":[13,71],"device":[16,23,32],"by":[17],"five":[18],"different":[19],"measurement":[20,59,63],"laboratories.":[21],"The":[22,44,65],"under":[24],"test":[25],"(DUT)":[26],"is":[27,34,46,69],"active":[30],"semiconductor":[31],"that":[33,53],"designed":[35],"to":[36,47],"generate":[37],"maximum":[39],"number":[40],"of":[41,74],"harmonic":[42],"tones.":[43],"goal":[45],"obtain":[48],"simple":[50],"automated":[51],"method":[52,68],"detects":[54],"if":[55],"some":[56],"laboratory":[57],"had":[58],"problems":[60],"during":[61],"the":[62,72],"campaign.":[64],"developed":[66],"comparison":[67],"based":[70],"analysis":[73],"variance":[75],"(ANOVA)":[76],"technique.":[77]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}