{"id":"https://openalex.org/W1983337041","doi":"https://doi.org/10.1109/tim.2008.2012386","title":"2008 Conference on Precision Electromagnetic Measurements (CPEM)","display_name":"2008 Conference on Precision Electromagnetic Measurements (CPEM)","publication_year":2009,"publication_date":"2009-02-09","ids":{"openalex":"https://openalex.org/W1983337041","doi":"https://doi.org/10.1109/tim.2008.2012386","mag":"1983337041"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2008.2012386","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2008.2012386","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030173545","display_name":"Thomas E. Lipe","orcid":"https://orcid.org/0000-0002-8943-3325"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Thomas E. Lipe","raw_affiliation_strings":["National Institute of Standards and Technology, Gaithersburg, MD"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, MD","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064231652","display_name":"Yi-hua Tang","orcid":"https://orcid.org/0000-0003-3754-5293"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yi-Hua Tang","raw_affiliation_strings":["National Institute of Standards and Technology, Gaithersburg, MD"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, MD","institution_ids":["https://openalex.org/I1321296531"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1321296531"],"apc_list":null,"apc_paid":null,"fwci":0.581,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.70999198,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"58","issue":"4","first_page":"749","last_page":"750"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.5200999975204468,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.5200999975204468,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.4970000088214874,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.45329999923706055,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromagnetics","display_name":"Electromagnetics","score":0.4870462715625763},{"id":"https://openalex.org/keywords/electromagnetic-radiation","display_name":"Electromagnetic radiation","score":0.4455403685569763},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4074968695640564},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.35803166031837463},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.35260921716690063},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3238760828971863},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2816128134727478},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2350955605506897}],"concepts":[{"id":"https://openalex.org/C2909720056","wikidata":"https://www.wikidata.org/wiki/Q11406","display_name":"Electromagnetics","level":2,"score":0.4870462715625763},{"id":"https://openalex.org/C149773537","wikidata":"https://www.wikidata.org/wiki/Q12969754","display_name":"Electromagnetic radiation","level":2,"score":0.4455403685569763},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4074968695640564},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.35803166031837463},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.35260921716690063},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3238760828971863},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2816128134727478},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2350955605506897}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2008.2012386","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2008.2012386","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2935759653","https://openalex.org/W3105167352","https://openalex.org/W54078636","https://openalex.org/W2954470139","https://openalex.org/W1501425562","https://openalex.org/W2902782467","https://openalex.org/W3084825885","https://openalex.org/W2298861036","https://openalex.org/W3148032049"],"abstract_inverted_index":{"The":[0],"88":[1],"papers":[2,11],"in":[3,23],"this":[4],"special":[5],"issue":[6],"are":[7],"extended":[8],"versions":[9],"of":[10],"presented":[12],"at":[13],"the":[14],"2008":[15],"Conference":[16],"on":[17],"Precision":[18],"Electromagnetic":[19],"Measurements":[20],"(CPEM),":[21],"held":[22],"Broomfield,":[24],"CO,":[25],"from":[26],"June":[27,30],"8":[28],"through":[29],"13.":[31]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}