{"id":"https://openalex.org/W2136184663","doi":"https://doi.org/10.1109/tim.2008.2012381","title":"Determination of the Correction Factor of Waveguide Microcalorimeters in the Millimeter-Wave Range","display_name":"Determination of the Correction Factor of Waveguide Microcalorimeters in the Millimeter-Wave Range","publication_year":2009,"publication_date":"2009-02-09","ids":{"openalex":"https://openalex.org/W2136184663","doi":"https://doi.org/10.1109/tim.2008.2012381","mag":"2136184663"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2008.2012381","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2008.2012381","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007854187","display_name":"R. Judaschke","orcid":"https://orcid.org/0000-0002-0341-5194"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"government","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"R. Judaschke","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","Phys.-Tech. Bundesanstalt, Braunschweig"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]},{"raw_affiliation_string":"Phys.-Tech. Bundesanstalt, Braunschweig","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067001524","display_name":"J\u00fcrgen Ruhaak","orcid":null},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"government","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"J. Ruhaak","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","Phys.-Tech. Bundesanstalt, Braunschweig"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]},{"raw_affiliation_string":"Phys.-Tech. Bundesanstalt, Braunschweig","institution_ids":["https://openalex.org/I1285933455"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1285933455"],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":2.6453,"has_fulltext":false,"cited_by_count":55,"citation_normalized_percentile":{"value":0.89847083,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"58","issue":"4","first_page":"1104","last_page":"1108"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9797000288963318,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/thermistor","display_name":"Thermistor","score":0.8625523447990417},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.7067686915397644},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6184024214744568},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.5946204662322998},{"id":"https://openalex.org/keywords/millimeter","display_name":"Millimeter","score":0.5915607810020447},{"id":"https://openalex.org/keywords/extremely-high-frequency","display_name":"Extremely high frequency","score":0.5864416360855103},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.5400211811065674},{"id":"https://openalex.org/keywords/waveguide","display_name":"Waveguide","score":0.4838213324546814},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.4274742007255554},{"id":"https://openalex.org/keywords/device-under-test","display_name":"Device under test","score":0.4273822605609894},{"id":"https://openalex.org/keywords/bolometer","display_name":"Bolometer","score":0.41425585746765137},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3973986506462097},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.36970722675323486},{"id":"https://openalex.org/keywords/scattering-parameters","display_name":"Scattering parameters","score":0.29230308532714844},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.2273177206516266},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21861496567726135},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.1592921018600464}],"concepts":[{"id":"https://openalex.org/C66726788","wikidata":"https://www.wikidata.org/wiki/Q175973","display_name":"Thermistor","level":2,"score":0.8625523447990417},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.7067686915397644},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6184024214744568},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.5946204662322998},{"id":"https://openalex.org/C109792285","wikidata":"https://www.wikidata.org/wiki/Q174789","display_name":"Millimeter","level":2,"score":0.5915607810020447},{"id":"https://openalex.org/C45764600","wikidata":"https://www.wikidata.org/wiki/Q570342","display_name":"Extremely high frequency","level":2,"score":0.5864416360855103},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5400211811065674},{"id":"https://openalex.org/C200687136","wikidata":"https://www.wikidata.org/wiki/Q11233438","display_name":"Waveguide","level":2,"score":0.4838213324546814},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.4274742007255554},{"id":"https://openalex.org/C76249512","wikidata":"https://www.wikidata.org/wiki/Q1206780","display_name":"Device under test","level":3,"score":0.4273822605609894},{"id":"https://openalex.org/C21028948","wikidata":"https://www.wikidata.org/wiki/Q852212","display_name":"Bolometer","level":3,"score":0.41425585746765137},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3973986506462097},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.36970722675323486},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.29230308532714844},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.2273177206516266},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21861496567726135},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.1592921018600464},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2008.2012381","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2008.2012381","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8100000023841858}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1988095506","https://openalex.org/W2046307241","https://openalex.org/W2071690532","https://openalex.org/W2111252207","https://openalex.org/W2139002909","https://openalex.org/W2315214008","https://openalex.org/W2329954402","https://openalex.org/W2492041848","https://openalex.org/W2902897446"],"related_works":["https://openalex.org/W2106256449","https://openalex.org/W1970339010","https://openalex.org/W2009771736","https://openalex.org/W2172907604","https://openalex.org/W4241345830","https://openalex.org/W3104426597","https://openalex.org/W2601102298","https://openalex.org/W2771888401","https://openalex.org/W2470882745","https://openalex.org/W299526084"],"abstract_inverted_index":{"A":[0],"novel":[1],"self-consistent":[2],"approach":[3],"for":[4,87,93],"the":[5,8,22,47,53,57,61,64,76,94,124],"determination":[6],"of":[7,11,24,27,36,60,123,128],"correction":[9,66],"factor":[10,67],"a":[12,102],"waveguide":[13,83],"microcalorimeter":[14,104],"is":[15,19],"described.":[16],"The":[17,70],"method":[18,71],"based":[20],"on":[21],"measurement":[23,35],"offset":[25,88],"shorts":[26],"different":[28,77],"length":[29],"followed":[30],"by":[31],"one":[32],"single":[33],"calibration":[34],"an":[37],"unknown":[38],"thermistor":[39,129],"device":[40],"under":[41],"test":[42],"(DUT).":[43],"Without":[44],"precisely":[45],"measuring":[46],"radio-frequency":[48],"(RF)":[49],"power":[50,130],"incident":[51],"to":[52,101],"reference":[54],"plane,":[55],"both":[56],"effective":[58,126],"efficiency":[59,127],"DUT":[62,95],"and":[63,81],"calorimeter":[65],"are":[68],"determined.":[69],"theoretically":[72],"takes":[73],"into":[74],"account":[75],"surface":[78],"current":[79],"distributions":[80],"associated":[82],"losses":[84],"being":[85],"existent":[86],"short,":[89],"as":[90,92],"well":[91],"measurements.":[96],"It":[97],"has":[98,108],"been":[99,110],"applied":[100],"twin-type":[103],"(33\u201350":[105],"GHz)":[106],"that":[107],"recently":[109],"developed":[111],"at":[112],"Physikalisch-Technische":[113],"Bundesanstalt":[114],"(PTB),":[115],"Braunschweig,":[116],"Germany,":[117],"which":[118],"results":[119],"in":[120],"low":[121],"uncertainties":[122],"measured":[125],"sensors.":[131]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":6},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":8},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":1}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}