{"id":"https://openalex.org/W2121382939","doi":"https://doi.org/10.1109/tim.2008.2011099","title":"Modeling and Measuring Error Contributions in Stepwise Synthesized Josephson Sine Waves","display_name":"Modeling and Measuring Error Contributions in Stepwise Synthesized Josephson Sine Waves","publication_year":2009,"publication_date":"2009-01-28","ids":{"openalex":"https://openalex.org/W2121382939","doi":"https://doi.org/10.1109/tim.2008.2011099","mag":"2121382939"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2008.2011099","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2008.2011099","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087450469","display_name":"J. Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I4210130343","display_name":"National Metrology Centre","ror":"https://ror.org/035gbps25","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210130343","https://openalex.org/I91275662"]},{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]},{"id":"https://openalex.org/I115228651","display_name":"Agency for Science, Technology and Research","ror":"https://ror.org/036wvzt09","country_code":"SG","type":"government","lineage":["https://openalex.org/I115228651"]}],"countries":["DE","SG"],"is_corresponding":true,"raw_author_name":"J. Lee","raw_affiliation_strings":["National Metrology Centre, Agency for Science, Technology and Research, Singapore","Physikalisch-Technisch Bundesanstalt, Brunswick, Germany"],"affiliations":[{"raw_affiliation_string":"National Metrology Centre, Agency for Science, Technology and Research, Singapore","institution_ids":["https://openalex.org/I4210130343","https://openalex.org/I115228651"]},{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046206081","display_name":"R. Behr","orcid":"https://orcid.org/0000-0002-5480-443X"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"R. Behr","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany"],"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050365023","display_name":"A. S. Katkov","orcid":"https://orcid.org/0000-0001-5597-9437"},"institutions":[{"id":"https://openalex.org/I4210102191","display_name":"D.I. Mendeleyev All-Russian Institute for Metrology","ror":"https://ror.org/017c99632","country_code":"RU","type":"facility","lineage":["https://openalex.org/I4210102191"]},{"id":"https://openalex.org/I4210108590","display_name":"All-Russian Scientific Research Institute of Butter and Cheese Making","ror":"https://ror.org/01wxbtj35","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210108590"]},{"id":"https://openalex.org/I4210144836","display_name":"All-Russian research Institute of metrological service","ror":"https://ror.org/03ekph544","country_code":"RU","type":"facility","lineage":["https://openalex.org/I4210144836"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"A.S. Katkov","raw_affiliation_strings":["Institute for Metrology (VNIIM), Saint Petersburg, Russia"],"affiliations":[{"raw_affiliation_string":"Institute for Metrology (VNIIM), Saint Petersburg, Russia","institution_ids":["https://openalex.org/I4210102191","https://openalex.org/I4210108590","https://openalex.org/I4210144836"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024204686","display_name":"L. Palafox","orcid":"https://orcid.org/0000-0001-7663-856X"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"L. Palafox","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany"],"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5087450469"],"corresponding_institution_ids":["https://openalex.org/I115228651","https://openalex.org/I1285933455","https://openalex.org/I4210130343"],"apc_list":null,"apc_paid":null,"fwci":7.6143,"has_fulltext":false,"cited_by_count":43,"citation_normalized_percentile":{"value":0.97634724,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"58","issue":"4","first_page":"803","last_page":"808"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":0.9721999764442444,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9627000093460083,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sine-wave","display_name":"Sine wave","score":0.771084189414978},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.7332319617271423},{"id":"https://openalex.org/keywords/root-mean-square","display_name":"Root mean square","score":0.6361802816390991},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.557891845703125},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.5361473560333252},{"id":"https://openalex.org/keywords/square-root","display_name":"Square root","score":0.5319920778274536},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.4971292316913605},{"id":"https://openalex.org/keywords/time-constant","display_name":"Time constant","score":0.48051413893699646},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.4772500991821289},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.4624590575695038},{"id":"https://openalex.org/keywords/josephson-effect","display_name":"Josephson effect","score":0.45648810267448425},{"id":"https://openalex.org/keywords/sine","display_name":"Sine","score":0.4544607996940613},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.45157283544540405},{"id":"https://openalex.org/keywords/computational-physics","display_name":"Computational physics","score":0.4503806233406067},{"id":"https://openalex.org/keywords/constant","display_name":"Constant (computer programming)","score":0.4258624017238617},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.18891596794128418},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.15764573216438293},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.15220433473587036},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1352429986000061}],"concepts":[{"id":"https://openalex.org/C66907618","wikidata":"https://www.wikidata.org/wiki/Q207527","display_name":"Sine wave","level":3,"score":0.771084189414978},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.7332319617271423},{"id":"https://openalex.org/C71907059","wikidata":"https://www.wikidata.org/wiki/Q223323","display_name":"Root mean square","level":2,"score":0.6361802816390991},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.557891845703125},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5361473560333252},{"id":"https://openalex.org/C11577676","wikidata":"https://www.wikidata.org/wiki/Q134237","display_name":"Square root","level":2,"score":0.5319920778274536},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.4971292316913605},{"id":"https://openalex.org/C81370116","wikidata":"https://www.wikidata.org/wiki/Q1335249","display_name":"Time constant","level":2,"score":0.48051413893699646},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.4772500991821289},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4624590575695038},{"id":"https://openalex.org/C12038964","wikidata":"https://www.wikidata.org/wiki/Q764228","display_name":"Josephson effect","level":3,"score":0.45648810267448425},{"id":"https://openalex.org/C186661526","wikidata":"https://www.wikidata.org/wiki/Q13647261","display_name":"Sine","level":2,"score":0.4544607996940613},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.45157283544540405},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.4503806233406067},{"id":"https://openalex.org/C2777027219","wikidata":"https://www.wikidata.org/wiki/Q1284190","display_name":"Constant (computer programming)","level":2,"score":0.4258624017238617},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.18891596794128418},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15764573216438293},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.15220433473587036},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1352429986000061},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C54101563","wikidata":"https://www.wikidata.org/wiki/Q124131","display_name":"Superconductivity","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2008.2011099","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2008.2011099","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8100000023841858,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2046302477","https://openalex.org/W2056065340","https://openalex.org/W2096440337","https://openalex.org/W2101272815","https://openalex.org/W2128269426","https://openalex.org/W2132256269","https://openalex.org/W2139092953","https://openalex.org/W2143958113","https://openalex.org/W2146107278","https://openalex.org/W2158220284","https://openalex.org/W2948169611","https://openalex.org/W4232509800","https://openalex.org/W6763097387"],"related_works":["https://openalex.org/W2886467464","https://openalex.org/W2379854577","https://openalex.org/W2362063739","https://openalex.org/W2351293857","https://openalex.org/W2424761688","https://openalex.org/W2487672730","https://openalex.org/W2409813437","https://openalex.org/W1997184869","https://openalex.org/W2029762691","https://openalex.org/W2387185277"],"abstract_inverted_index":{"Synthesizing":[0],"Josephson":[1],"stepwise":[2],"approximated":[3],"sine":[4],"waves":[5],"to":[6,46,72],"produce":[7],"an":[8,26],"AC":[9],"quantum":[10],"standard":[11],"is":[12],"limited":[13],"by":[14],"errors":[15],"in":[16,85,95],"the":[17,29,32,48,55,60,63,70,75,81,86,91,96,104,109,117],"waveform":[18],"transitions":[19],"between":[20,119],"quantized":[21,92],"voltages.":[22],"Many":[23],"parameters":[24],"have":[25,78],"impact":[27],"on":[28],"shape":[30],"of":[31,50,54,59,62,69,74,83,111],"transients.":[33],"A":[34],"simple":[35],"model":[36,105],"with":[37,132],"a":[38],"single":[39],"equivalent":[40,64],"time":[41,65],"constant":[42,66],"can":[43],"be":[44],"used":[45,89],"evaluate":[47],"influence":[49,82],"these":[51],"parameters.":[52,76],"Measurements":[53],"transients":[56],"allow":[57],"establishment":[58],"value":[61],"and":[67,94,121],"prediction":[68],"response":[71],"variations":[73],"We":[77],"experimentally":[79],"confirmed":[80,129],"changes":[84],"bias":[87],"current":[88],"for":[90],"voltages":[93],"microwave":[97],"power":[98],"applied.":[99],"Under":[100],"usual":[101],"operating":[102],"conditions,":[103],"predicts":[106],"that":[107],"increasing":[108],"number":[110],"samples":[112],"per":[113],"period":[114],"nonlinearly":[115],"reduces":[116],"difference":[118],"measured":[120],"ideal":[122],"root-mean-square":[123],"(rms)":[124],"values.":[125],"This":[126],"behavior":[127],"was":[128],"through":[130],"measurements":[131],"thermal":[133],"converters.":[134]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":3},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":9}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}