{"id":"https://openalex.org/W2134183863","doi":"https://doi.org/10.1109/tim.2008.2009138","title":"A New Method for the Online Voidage Measurement of the Gas\u2013Oil Two-Phase Flow","display_name":"A New Method for the Online Voidage Measurement of the Gas\u2013Oil Two-Phase Flow","publication_year":2008,"publication_date":"2008-12-18","ids":{"openalex":"https://openalex.org/W2134183863","doi":"https://doi.org/10.1109/tim.2008.2009138","mag":"2134183863"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2008.2009138","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2008.2009138","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100646502","display_name":"Li Xia","orcid":"https://orcid.org/0000-0002-3193-7336"},"institutions":[{"id":"https://openalex.org/I4391767838","display_name":"State Key Laboratory of Industrial Control Technology","ror":"https://ror.org/03a33a786","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391767838","https://openalex.org/I76130692"]},{"id":"https://openalex.org/I55712492","display_name":"Zhejiang University of Technology","ror":"https://ror.org/02djqfd08","country_code":"CN","type":"education","lineage":["https://openalex.org/I55712492"]},{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xia Li","raw_affiliation_strings":["State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, University of Zhejiang, Hangzhou, China","[Dept. of Control Sci. & Eng., Zhejiang Univ., Hangzhou]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, University of Zhejiang, Hangzhou, China","institution_ids":["https://openalex.org/I55712492","https://openalex.org/I4391767838"]},{"raw_affiliation_string":"[Dept. of Control Sci. & Eng., Zhejiang Univ., Hangzhou]","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038128825","display_name":"Zhiyao Huang","orcid":"https://orcid.org/0000-0003-1858-5994"},"institutions":[{"id":"https://openalex.org/I4391767838","display_name":"State Key Laboratory of Industrial Control Technology","ror":"https://ror.org/03a33a786","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391767838","https://openalex.org/I76130692"]},{"id":"https://openalex.org/I55712492","display_name":"Zhejiang University of Technology","ror":"https://ror.org/02djqfd08","country_code":"CN","type":"education","lineage":["https://openalex.org/I55712492"]},{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiyao Huang","raw_affiliation_strings":["State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, University of Zhejiang, Hangzhou, China","[Dept. of Control Sci. & Eng., Zhejiang Univ., Hangzhou]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, University of Zhejiang, Hangzhou, China","institution_ids":["https://openalex.org/I55712492","https://openalex.org/I4391767838"]},{"raw_affiliation_string":"[Dept. of Control Sci. & Eng., Zhejiang Univ., Hangzhou]","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072259811","display_name":"Baoliang Wang","orcid":"https://orcid.org/0000-0002-0045-0576"},"institutions":[{"id":"https://openalex.org/I4391767838","display_name":"State Key Laboratory of Industrial Control Technology","ror":"https://ror.org/03a33a786","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391767838","https://openalex.org/I76130692"]},{"id":"https://openalex.org/I55712492","display_name":"Zhejiang University of Technology","ror":"https://ror.org/02djqfd08","country_code":"CN","type":"education","lineage":["https://openalex.org/I55712492"]},{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Baoliang Wang","raw_affiliation_strings":["State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, University of Zhejiang, Hangzhou, China","[Dept. of Control Sci. & Eng., Zhejiang Univ., Hangzhou]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, University of Zhejiang, Hangzhou, China","institution_ids":["https://openalex.org/I55712492","https://openalex.org/I4391767838"]},{"raw_affiliation_string":"[Dept. of Control Sci. & Eng., Zhejiang Univ., Hangzhou]","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100675989","display_name":"Haiqing Li","orcid":"https://orcid.org/0000-0002-1827-6625"},"institutions":[{"id":"https://openalex.org/I4391767838","display_name":"State Key Laboratory of Industrial Control Technology","ror":"https://ror.org/03a33a786","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391767838","https://openalex.org/I76130692"]},{"id":"https://openalex.org/I55712492","display_name":"Zhejiang University of Technology","ror":"https://ror.org/02djqfd08","country_code":"CN","type":"education","lineage":["https://openalex.org/I55712492"]},{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haiqing Li","raw_affiliation_strings":["State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, University of Zhejiang, Hangzhou, China","[Dept. of Control Sci. & Eng., Zhejiang Univ., Hangzhou]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, University of Zhejiang, Hangzhou, China","institution_ids":["https://openalex.org/I55712492","https://openalex.org/I4391767838"]},{"raw_affiliation_string":"[Dept. of Control Sci. & Eng., Zhejiang Univ., Hangzhou]","institution_ids":["https://openalex.org/I76130692"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.0175,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.79208082,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"58","issue":"5","first_page":"1571","last_page":"1577"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9925000071525574,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-capacitance-tomography","display_name":"Electrical capacitance tomography","score":0.9474177360534668},{"id":"https://openalex.org/keywords/flow","display_name":"Flow (mathematics)","score":0.6693044304847717},{"id":"https://openalex.org/keywords/flow-measurement","display_name":"Flow measurement","score":0.6037602424621582},{"id":"https://openalex.org/keywords/two-phase-flow","display_name":"Two-phase flow","score":0.5414609313011169},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.5327472686767578},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.5011625289916992},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.46859943866729736},{"id":"https://openalex.org/keywords/multiphase-flow","display_name":"Multiphase flow","score":0.45588409900665283},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4430202841758728},{"id":"https://openalex.org/keywords/volume","display_name":"Volume (thermodynamics)","score":0.4380333721637726},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4301789104938507},{"id":"https://openalex.org/keywords/least-squares-support-vector-machine","display_name":"Least squares support vector machine","score":0.4281320571899414},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.4181459844112396},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3865357041358948},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.37318044900894165},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3348963260650635},{"id":"https://openalex.org/keywords/mechanics","display_name":"Mechanics","score":0.26755523681640625},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2582401633262634},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2407817542552948},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.17392224073410034},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.12753614783287048},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08517000079154968}],"concepts":[{"id":"https://openalex.org/C2777418626","wikidata":"https://www.wikidata.org/wiki/Q2584887","display_name":"Electrical capacitance tomography","level":4,"score":0.9474177360534668},{"id":"https://openalex.org/C38349280","wikidata":"https://www.wikidata.org/wiki/Q1434290","display_name":"Flow (mathematics)","level":2,"score":0.6693044304847717},{"id":"https://openalex.org/C16302685","wikidata":"https://www.wikidata.org/wiki/Q15091623","display_name":"Flow measurement","level":2,"score":0.6037602424621582},{"id":"https://openalex.org/C144308804","wikidata":"https://www.wikidata.org/wiki/Q232997","display_name":"Two-phase flow","level":3,"score":0.5414609313011169},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.5327472686767578},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.5011625289916992},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.46859943866729736},{"id":"https://openalex.org/C2779379648","wikidata":"https://www.wikidata.org/wiki/Q1559665","display_name":"Multiphase flow","level":2,"score":0.45588409900665283},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4430202841758728},{"id":"https://openalex.org/C20556612","wikidata":"https://www.wikidata.org/wiki/Q4469374","display_name":"Volume (thermodynamics)","level":2,"score":0.4380333721637726},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4301789104938507},{"id":"https://openalex.org/C145828037","wikidata":"https://www.wikidata.org/wiki/Q17086219","display_name":"Least squares support vector machine","level":3,"score":0.4281320571899414},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.4181459844112396},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3865357041358948},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.37318044900894165},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3348963260650635},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.26755523681640625},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2582401633262634},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2407817542552948},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.17392224073410034},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.12753614783287048},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08517000079154968},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2008.2009138","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2008.2009138","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W62315469","https://openalex.org/W1596717185","https://openalex.org/W1974076946","https://openalex.org/W1986490585","https://openalex.org/W1987967507","https://openalex.org/W2014825070","https://openalex.org/W2049772201","https://openalex.org/W2051053296","https://openalex.org/W2055563201","https://openalex.org/W2063752386","https://openalex.org/W2088417542","https://openalex.org/W2096538971","https://openalex.org/W2105193947","https://openalex.org/W2119699417","https://openalex.org/W2120879667","https://openalex.org/W2123691489","https://openalex.org/W2132549764","https://openalex.org/W2148603752","https://openalex.org/W2150932010","https://openalex.org/W2172000360","https://openalex.org/W2352769568","https://openalex.org/W2371307040","https://openalex.org/W2592036898","https://openalex.org/W2737036344","https://openalex.org/W4206042949"],"related_works":["https://openalex.org/W2221118401","https://openalex.org/W2599381897","https://openalex.org/W3175649433","https://openalex.org/W2378223409","https://openalex.org/W2530737419","https://openalex.org/W3042445073","https://openalex.org/W2594988164","https://openalex.org/W2116674942","https://openalex.org/W2523593148","https://openalex.org/W4390214707"],"abstract_inverted_index":{"Based":[0],"on":[1,116],"the":[2,14,27,32,37,41,46,58,64,75,88,99,103,111,120],"capacitances":[3,55],"obtained":[4,56],"from":[5,53,57],"a":[6,21,68],"12-electrode":[7],"electrical":[8],"capacitance":[9],"tomography":[10],"(ECT)":[11],"system":[12],"and":[13,74,82,102],"least-squares":[15],"support":[16],"vector":[17],"machine":[18],"(LS-SVM)":[19],"technique,":[20],"new":[22],"method":[23,90,114,122],"is":[24,50,72,78,91,96,106],"proposed":[25,89,121],"for":[26],"online":[28],"voidage":[29,76,127],"measurement":[30,70,128],"of":[31,45,98],"gas-oil":[33,47],"two-phase":[34,48],"flow.":[35],"In":[36],"practical":[38],"voidage-measurement":[39,94,113],"process,":[40],"real-time":[42,104],"flow":[43,49,65,100],"pattern":[44],"directly":[51],"identified":[52],"66":[54],"ECT":[59,118],"system.":[60],"Then,":[61],"according":[62],"to":[63],"pattern-identification":[66],"results,":[67],"suitable":[69],"model":[71],"selected,":[73],"value":[77],"calculated.":[79],"Both":[80],"static":[81],"dynamic":[83],"experimental":[84],"results":[85],"show":[86],"that":[87],"effective.":[92],"The":[93],"result":[95],"independent":[97],"pattern,":[101],"performance":[105],"satisfactory.":[107],"Meanwhile,":[108],"compared":[109],"with":[110],"conventional":[112],"based":[115],"an":[117,132],"system,":[119],"can":[123],"produce":[124],"more":[125],"accurate":[126],"without":[129],"going":[130],"through":[131],"image-reconstruction":[133],"process.":[134]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}