{"id":"https://openalex.org/W2097063933","doi":"https://doi.org/10.1109/tim.2008.2008589","title":"Frequency Measurement Capability of a Fiber-Based Frequency Comb at 633 nm","display_name":"Frequency Measurement Capability of a Fiber-Based Frequency Comb at 633 nm","publication_year":2008,"publication_date":"2008-12-18","ids":{"openalex":"https://openalex.org/W2097063933","doi":"https://doi.org/10.1109/tim.2008.2008589","mag":"2097063933"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2008.2008589","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2008.2008589","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054698184","display_name":"Hajime Inaba","orcid":"https://orcid.org/0000-0001-8840-8091"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Inaba","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology, National Metrology Institute of Japan, Tsukuba, Japan","Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology, National Metrology Institute of Japan, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068327089","display_name":"Yoshiaki Nakajima","orcid":"https://orcid.org/0000-0002-2701-9858"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Nakajima","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology, National Metrology Institute of Japan, Tsukuba, Japan","Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology, National Metrology Institute of Japan, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022045114","display_name":"Feng-Lei Hong","orcid":"https://orcid.org/0000-0003-1318-2635"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Feng-Lei Hong","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology, National Metrology Institute of Japan, Tsukuba, Japan","Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology, National Metrology Institute of Japan, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024325072","display_name":"Kaoru Minoshima","orcid":"https://orcid.org/0000-0003-1301-1406"},"institutions":[{"id":"https://openalex.org/I161296585","display_name":"Tokyo University of Science","ror":"https://ror.org/05sj3n476","country_code":"JP","type":"education","lineage":["https://openalex.org/I161296585"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Minoshima","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology, National Metrology Institute of Japan, Tsukuba, Japan","Tokyo University of Science, Shinjuku, Japan","Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology, National Metrology Institute of Japan, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"Tokyo University of Science, Shinjuku, Japan","institution_ids":["https://openalex.org/I161296585"]},{"raw_affiliation_string":"Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101952474","display_name":"Jun Ishikawa","orcid":"https://orcid.org/0000-0002-7808-5767"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"J. Ishikawa","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology, National Metrology Institute of Japan, Tsukuba, Japan","Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology, National Metrology Institute of Japan, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113564490","display_name":"Atsushi Onae","orcid":null},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"A. Onae","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology, National Metrology Institute of Japan, Tsukuba, Japan","Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology, National Metrology Institute of Japan, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079329616","display_name":"H. Matsumoto","orcid":null},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Matsumoto","raw_affiliation_strings":["Department of Precision Engineering, University of Tokyo, Tokyo, Japan","National Institute of Advanced Industrial Science and Technology, National Metrology Institute of Japan, Tsukuba, Japan","Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Precision Engineering, University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology, National Metrology Institute of Japan, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107271846","display_name":"Michael J. Wouters","orcid":"https://orcid.org/0000-0001-7752-4695"},"institutions":[{"id":"https://openalex.org/I1319171921","display_name":"National Measurement Institute","ror":"https://ror.org/03be3fb73","country_code":"AU","type":"government","lineage":["https://openalex.org/I1319171921","https://openalex.org/I2801453606","https://openalex.org/I4387156119"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"M. Wouters","raw_affiliation_strings":["National Measurement Institute of Australia NMIA, West Lindfield, NSW, Australia","Nat. Meas. Inst., West Lindfield, NSW"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Measurement Institute of Australia NMIA, West Lindfield, NSW, Australia","institution_ids":["https://openalex.org/I1319171921"]},{"raw_affiliation_string":"Nat. Meas. Inst., West Lindfield, NSW","institution_ids":["https://openalex.org/I1319171921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070020018","display_name":"B. Warrington","orcid":null},"institutions":[{"id":"https://openalex.org/I1319171921","display_name":"National Measurement Institute","ror":"https://ror.org/03be3fb73","country_code":"AU","type":"government","lineage":["https://openalex.org/I1319171921","https://openalex.org/I2801453606","https://openalex.org/I4387156119"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"B. Warrington","raw_affiliation_strings":["National Measurement Institute of Australia NMIA, West Lindfield, NSW, Australia","Nat. Meas. Inst., West Lindfield, NSW"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Measurement Institute of Australia NMIA, West Lindfield, NSW, Australia","institution_ids":["https://openalex.org/I1319171921"]},{"raw_affiliation_string":"Nat. Meas. Inst., West Lindfield, NSW","institution_ids":["https://openalex.org/I1319171921"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070192739","display_name":"Nicholas A. T. Brown","orcid":"https://orcid.org/0000-0003-2747-6634"},"institutions":[{"id":"https://openalex.org/I1319171921","display_name":"National Measurement Institute","ror":"https://ror.org/03be3fb73","country_code":"AU","type":"government","lineage":["https://openalex.org/I1319171921","https://openalex.org/I2801453606","https://openalex.org/I4387156119"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"N. Brown","raw_affiliation_strings":["National Measurement Institute of Australia NMIA, West Lindfield, NSW, Australia","Nat. Meas. Inst., West Lindfield, NSW"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Measurement Institute of Australia NMIA, West Lindfield, NSW, Australia","institution_ids":["https://openalex.org/I1319171921"]},{"raw_affiliation_string":"Nat. Meas. Inst., West Lindfield, NSW","institution_ids":["https://openalex.org/I1319171921"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":10,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4681,"has_fulltext":false,"cited_by_count":26,"citation_normalized_percentile":{"value":0.66522552,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"58","issue":"4","first_page":"1234","last_page":"1240"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10988","display_name":"Advanced Fiber Laser Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10988","display_name":"Advanced Fiber Laser Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":0.9736999869346619,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10846","display_name":"Photonic Crystal and Fiber Optics","score":0.961899995803833,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.8057655096054077},{"id":"https://openalex.org/keywords/frequency-comb","display_name":"Frequency comb","score":0.7509146928787231},{"id":"https://openalex.org/keywords/optical-frequency-comb","display_name":"Optical frequency comb","score":0.6868213415145874},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.527905285358429},{"id":"https://openalex.org/keywords/optical-fiber","display_name":"Optical fiber","score":0.45856109261512756},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.4478168487548828},{"id":"https://openalex.org/keywords/frequency-standard","display_name":"Frequency standard","score":0.43947505950927734},{"id":"https://openalex.org/keywords/interferometry","display_name":"Interferometry","score":0.43399739265441895},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.4333483576774597},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4316248893737793},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.42735448479652405},{"id":"https://openalex.org/keywords/consistency","display_name":"Consistency (knowledge bases)","score":0.4207374155521393},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3982192575931549},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.39753612875938416},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.34474048018455505},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.19488954544067383}],"concepts":[{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.8057655096054077},{"id":"https://openalex.org/C138234222","wikidata":"https://www.wikidata.org/wiki/Q1455602","display_name":"Frequency comb","level":3,"score":0.7509146928787231},{"id":"https://openalex.org/C2986204303","wikidata":"https://www.wikidata.org/wiki/Q1455602","display_name":"Optical frequency comb","level":3,"score":0.6868213415145874},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.527905285358429},{"id":"https://openalex.org/C194232370","wikidata":"https://www.wikidata.org/wiki/Q162","display_name":"Optical fiber","level":2,"score":0.45856109261512756},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.4478168487548828},{"id":"https://openalex.org/C131221115","wikidata":"https://www.wikidata.org/wiki/Q362396","display_name":"Frequency standard","level":2,"score":0.43947505950927734},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.43399739265441895},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.4333483576774597},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4316248893737793},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.42735448479652405},{"id":"https://openalex.org/C2776436953","wikidata":"https://www.wikidata.org/wiki/Q5163215","display_name":"Consistency (knowledge bases)","level":2,"score":0.4207374155521393},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3982192575931549},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.39753612875938416},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.34474048018455505},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.19488954544067383},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2008.2008589","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2008.2008589","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320323712","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1975362050","https://openalex.org/W1983423542","https://openalex.org/W2002604550","https://openalex.org/W2002798994","https://openalex.org/W2012545186","https://openalex.org/W2020808626","https://openalex.org/W2029807715","https://openalex.org/W2030593734","https://openalex.org/W2065867171","https://openalex.org/W2070142712","https://openalex.org/W2077288311","https://openalex.org/W2081472520","https://openalex.org/W2096197758","https://openalex.org/W2114977038","https://openalex.org/W2116393805","https://openalex.org/W2128800764","https://openalex.org/W2145606617"],"related_works":["https://openalex.org/W3015838480","https://openalex.org/W1980429525","https://openalex.org/W2033583747","https://openalex.org/W1686633638","https://openalex.org/W4239933732","https://openalex.org/W4225323216","https://openalex.org/W2168171148","https://openalex.org/W2088660421","https://openalex.org/W3112780635","https://openalex.org/W967383821"],"abstract_inverted_index":{"A":[0],"fiber-based":[1],"frequency":[2,10,26,74],"comb":[3,40,98],"has":[4],"been":[5],"developed":[6],"to":[7,43],"measure":[8],"the":[9,17,30,46,49,53,73,77,97,107],"of":[11,21,48,52,76,96],"a":[12,35,63,68],"633-nm":[13],"iodine-stabilized":[14],"laser":[15],"at":[16],"National":[18,54],"Metrology":[19],"Institute":[20],"Japan":[22],"(NMIJ).":[23],"The":[24,38],"measured":[25,33],"was":[27,41,80],"consistent":[28],"with":[29,34],"previous":[31],"results":[32],"Ti:sapphire-based":[36],"comb.":[37],"NMIJ":[39,60],"shipped":[42],"Australia":[44,57],"for":[45],"validation":[47],"measurement":[50],"capability":[51],"Measurement":[55],"Institute,":[56],"(NMIA)":[58],"and":[59,67,101],"combs":[61,79],"using":[62,106],"common":[64,69],"microwave":[65],"reference":[66],"optical":[70],"frequency.":[71],"Consequently,":[72],"consistency":[75],"two":[78,108],"approximately":[81],"8":[82],"times10":[83],"<sup":[84],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[85],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-17</sup>":[86],".":[87],"Furthermore,":[88],"we":[89],"demonstrate":[90],"that":[91],"an":[92],"absolute":[93],"mode":[94],"number":[95],"can":[99],"easily":[100],"clearly":[102],"be":[103],"determined":[104],"by":[105],"combs.":[109]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}