{"id":"https://openalex.org/W2176369011","doi":"https://doi.org/10.1109/tim.2008.2008082","title":"Calibration of High-Voltage Current-Comparator-Based Capacitance and Dissipation Factor Bridges Using Nonsynchronous Sampling","display_name":"Calibration of High-Voltage Current-Comparator-Based Capacitance and Dissipation Factor Bridges Using Nonsynchronous Sampling","publication_year":2008,"publication_date":"2008-12-08","ids":{"openalex":"https://openalex.org/W2176369011","doi":"https://doi.org/10.1109/tim.2008.2008082","mag":"2176369011"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2008.2008082","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2008.2008082","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006069176","display_name":"G. A. Kyriazis","orcid":"https://orcid.org/0000-0002-7552-3602"},"institutions":[{"id":"https://openalex.org/I40891861","display_name":"Instituto Nacional de Metrologia, Qualidade e Tecnologia","ror":"https://ror.org/01f8vhd41","country_code":"BR","type":"government","lineage":["https://openalex.org/I2801200668","https://openalex.org/I2802647933","https://openalex.org/I40891861"]}],"countries":["BR"],"is_corresponding":true,"raw_author_name":"G.A. Kyriazis","raw_affiliation_strings":["Instituto Nacional de Metrologia, Normaliza\u00e7\u00e3o e Qualidade Industrial (INMETRO), Duque de Caxias, Rio de Janeiro, Brazil"],"affiliations":[{"raw_affiliation_string":"Instituto Nacional de Metrologia, Normaliza\u00e7\u00e3o e Qualidade Industrial (INMETRO), Duque de Caxias, Rio de Janeiro, Brazil","institution_ids":["https://openalex.org/I40891861"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5006069176"],"corresponding_institution_ids":["https://openalex.org/I40891861"],"apc_list":null,"apc_paid":null,"fwci":0.3329,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.67523802,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"58","issue":"4","first_page":"1029","last_page":"1034"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.8153663277626038},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.7783796787261963},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.7165247201919556},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.6794736385345459},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6167920231819153},{"id":"https://openalex.org/keywords/dissipation-factor","display_name":"Dissipation factor","score":0.5449456572532654},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5382667779922485},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5026514530181885},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.50235915184021},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.4668923616409302},{"id":"https://openalex.org/keywords/ranging","display_name":"Ranging","score":0.4662223160266876},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.46148648858070374},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.4578366279602051},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.44971877336502075},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40582790970802307},{"id":"https://openalex.org/keywords/computational-physics","display_name":"Computational physics","score":0.3318501114845276},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.27703917026519775},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24816763401031494},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1060229241847992},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.10157307982444763},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.06983080506324768}],"concepts":[{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.8153663277626038},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.7783796787261963},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.7165247201919556},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.6794736385345459},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6167920231819153},{"id":"https://openalex.org/C97274863","wikidata":"https://www.wikidata.org/wiki/Q1040795","display_name":"Dissipation factor","level":3,"score":0.5449456572532654},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5382667779922485},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5026514530181885},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.50235915184021},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.4668923616409302},{"id":"https://openalex.org/C115051666","wikidata":"https://www.wikidata.org/wiki/Q6522493","display_name":"Ranging","level":2,"score":0.4662223160266876},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.46148648858070374},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.4578366279602051},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.44971877336502075},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40582790970802307},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.3318501114845276},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.27703917026519775},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24816763401031494},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1060229241847992},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.10157307982444763},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.06983080506324768},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2008.2008082","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2008.2008082","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8299999833106995,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1870359496","https://openalex.org/W1969360280","https://openalex.org/W1972635345","https://openalex.org/W1985412490","https://openalex.org/W2104670710","https://openalex.org/W2110436871","https://openalex.org/W2129833793","https://openalex.org/W2135104574","https://openalex.org/W2153816229","https://openalex.org/W2165750195","https://openalex.org/W2168519832","https://openalex.org/W2315214008","https://openalex.org/W3146151373","https://openalex.org/W4230471890","https://openalex.org/W4255502045"],"related_works":["https://openalex.org/W4384112194","https://openalex.org/W2783354812","https://openalex.org/W2103009189","https://openalex.org/W4312958259","https://openalex.org/W4390813131","https://openalex.org/W2349383066","https://openalex.org/W1969901537","https://openalex.org/W4328132048","https://openalex.org/W4308259661","https://openalex.org/W4238016235"],"abstract_inverted_index":{"An":[0],"alternative":[1],"approach":[2,68,74],"for":[3],"calibrating":[4],"automated":[5],"high-voltage":[6],"current-comparator-based":[7],"capacitance":[8,38,104],"and":[9,28,31,40,127],"dissipation":[10,41,128],"factor":[11,42],"bridges":[12],"is":[13,69,83,100],"presented.":[14],"For":[15],"the":[16,34,56,61,65,89,96],"calibration,":[17],"two":[18,24,29],"sinusoidal":[19],"currents":[20,46],"are":[21,47],"synthesized":[22],"with":[23,60,115,135],"synchronized":[25,94],"signal":[26,97],"generators":[27],"resistors":[30],"injected":[32],"into":[33],"bridge":[35],"inputs.":[36],"The":[37,67],"ratio":[39,53,63],"simulated":[43],"by":[44],"these":[45],"calculated":[48],"from":[49,55,107,131],"an":[50],"ac":[51],"voltage":[52],"estimated":[54],"digitized":[57],"data,":[58],"together":[59],"impedance":[62],"of":[64,72,119,138],"resistors.":[66],"a":[70],"refinement":[71],"another":[73],"previously":[75],"published":[76],"that":[77],"leads":[78],"to":[79,86,95,102,111,133],"larger":[80],"uncertainties":[81,118,137],"but":[82],"slightly":[84],"easier":[85],"implement":[87],"since":[88],"digitizers":[90],"need":[91],"not":[92],"be":[93],"generators.":[98],"It":[99],"possible":[101],"simulate":[103],"ratios":[105],"ranging":[106,130],"1":[108,110,114,141],":":[109,113],"10":[112],"relative":[116],"standard":[117,136],"less":[120,139],"than":[121,140],"2.0":[122],"middot10":[123,142],"<sup":[124,143],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[125,144],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-5</sup>":[126,145],"factors":[129],"0":[132],"0.1":[134],".":[146]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}