{"id":"https://openalex.org/W2119702009","doi":"https://doi.org/10.1109/tim.2008.2007033","title":"Development and Investigation of SNS Josephson Arrays for the Josephson Arbitrary Waveform Synthesizer","display_name":"Development and Investigation of SNS Josephson Arrays for the Josephson Arbitrary Waveform Synthesizer","publication_year":2008,"publication_date":"2008-12-03","ids":{"openalex":"https://openalex.org/W2119702009","doi":"https://doi.org/10.1109/tim.2008.2007033","mag":"2119702009"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2008.2007033","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2008.2007033","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005986773","display_name":"J. Kohlmann","orcid":"https://orcid.org/0000-0003-1062-0775"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"J. Kohlmann","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany"],"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000734020","display_name":"Oliver Kieler","orcid":"https://orcid.org/0000-0001-5193-8910"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"O.F. Kieler","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany"],"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059700874","display_name":"Ricardo Iuzzolino","orcid":"https://orcid.org/0000-0002-4781-9166"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]},{"id":"https://openalex.org/I41147313","display_name":"National Institute of Industrial Technology","ror":"https://ror.org/046denk61","country_code":"AR","type":"funder","lineage":["https://openalex.org/I41147313"]}],"countries":["AR","DE"],"is_corresponding":false,"raw_author_name":"R. Iuzzolino","raw_affiliation_strings":["Instituto Nacional de Tecnolog\u00eda Industrial, San Martin, Argentina","Physikalisch-Technisch Bundesanstalt, Brunswick, Germany"],"affiliations":[{"raw_affiliation_string":"Instituto Nacional de Tecnolog\u00eda Industrial, San Martin, Argentina","institution_ids":["https://openalex.org/I41147313"]},{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087450469","display_name":"J. Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]},{"id":"https://openalex.org/I4210130343","display_name":"National Metrology Centre","ror":"https://ror.org/035gbps25","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210130343","https://openalex.org/I91275662"]},{"id":"https://openalex.org/I115228651","display_name":"Agency for Science, Technology and Research","ror":"https://ror.org/036wvzt09","country_code":"SG","type":"government","lineage":["https://openalex.org/I115228651"]}],"countries":["DE","SG"],"is_corresponding":false,"raw_author_name":"J. Lee","raw_affiliation_strings":["National Metrology Centre, Agency for Science, Technology and Research (ASTAR), Singapore","Physikalisch-Technisch Bundesanstalt, Brunswick, Germany"],"affiliations":[{"raw_affiliation_string":"National Metrology Centre, Agency for Science, Technology and Research (ASTAR), Singapore","institution_ids":["https://openalex.org/I4210130343","https://openalex.org/I115228651"]},{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046206081","display_name":"R. Behr","orcid":"https://orcid.org/0000-0002-5480-443X"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"R. Behr","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany"],"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090262016","display_name":"B. Egeling","orcid":null},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"B. Egeling","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany"],"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002630852","display_name":"Franz M\u00fcller","orcid":"https://orcid.org/0000-0002-6564-9121"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"F. Muller","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany"],"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5005986773"],"corresponding_institution_ids":["https://openalex.org/I1285933455"],"apc_list":null,"apc_paid":null,"fwci":2.9965,"has_fulltext":false,"cited_by_count":26,"citation_normalized_percentile":{"value":0.91193349,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"58","issue":"4","first_page":"797","last_page":"802"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":0.9796000123023987,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12004","display_name":"Advanced Frequency and Time Standards","score":0.9284999966621399,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/josephson-effect","display_name":"Josephson effect","score":0.9064191579818726},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.8733104467391968},{"id":"https://openalex.org/keywords/harmonics","display_name":"Harmonics","score":0.7321499586105347},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5828189253807068},{"id":"https://openalex.org/keywords/pi-josephson-junction","display_name":"Pi Josephson junction","score":0.5501771569252014},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.5024268627166748},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4624581038951874},{"id":"https://openalex.org/keywords/superconductivity","display_name":"Superconductivity","score":0.45073193311691284},{"id":"https://openalex.org/keywords/harmonic-analysis","display_name":"Harmonic analysis","score":0.4357113540172577},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4268922209739685},{"id":"https://openalex.org/keywords/spectrum-analyzer","display_name":"Spectrum analyzer","score":0.4268278181552887},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.36366498470306396},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32125163078308105},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.236773282289505},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2018771469593048},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.19797194004058838}],"concepts":[{"id":"https://openalex.org/C12038964","wikidata":"https://www.wikidata.org/wiki/Q764228","display_name":"Josephson effect","level":3,"score":0.9064191579818726},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.8733104467391968},{"id":"https://openalex.org/C188414643","wikidata":"https://www.wikidata.org/wiki/Q3001183","display_name":"Harmonics","level":3,"score":0.7321499586105347},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5828189253807068},{"id":"https://openalex.org/C180349316","wikidata":"https://www.wikidata.org/wiki/Q7189956","display_name":"Pi Josephson junction","level":4,"score":0.5501771569252014},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5024268627166748},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4624581038951874},{"id":"https://openalex.org/C54101563","wikidata":"https://www.wikidata.org/wiki/Q124131","display_name":"Superconductivity","level":2,"score":0.45073193311691284},{"id":"https://openalex.org/C131770355","wikidata":"https://www.wikidata.org/wiki/Q876215","display_name":"Harmonic analysis","level":2,"score":0.4357113540172577},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4268922209739685},{"id":"https://openalex.org/C158007255","wikidata":"https://www.wikidata.org/wiki/Q1055222","display_name":"Spectrum analyzer","level":2,"score":0.4268278181552887},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.36366498470306396},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32125163078308105},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.236773282289505},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2018771469593048},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.19797194004058838}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2008.2007033","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2008.2007033","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1965594562","https://openalex.org/W2022530170","https://openalex.org/W2026731950","https://openalex.org/W2045940492","https://openalex.org/W2053503093","https://openalex.org/W2066592727","https://openalex.org/W2074886868","https://openalex.org/W2097338136","https://openalex.org/W2097496066","https://openalex.org/W2101853591","https://openalex.org/W2116044800","https://openalex.org/W2130977120","https://openalex.org/W2146107278","https://openalex.org/W2147190388","https://openalex.org/W2155247682","https://openalex.org/W2158220284","https://openalex.org/W2172133684"],"related_works":["https://openalex.org/W2107363207","https://openalex.org/W2003102171","https://openalex.org/W1977410726","https://openalex.org/W2066515429","https://openalex.org/W2102470243","https://openalex.org/W2134128150","https://openalex.org/W2039321566","https://openalex.org/W2357241914","https://openalex.org/W1999045657","https://openalex.org/W2105727342"],"abstract_inverted_index":{"Superconductor-normal":[0],"metal-superconductor(SNS)":[1],"Josephson":[2,14,45,78],"junction":[3],"series":[4,20],"arrays":[5,21],"are":[6,39,53],"developed":[7],"and":[8,36],"investigated":[9],"for":[10],"applications":[11],"in":[12,30],"the":[13,44,59,63],"arbitrary":[15,37],"waveform":[16],"synthesizer":[17],"(JAWS).":[18],"The":[19],"contain":[22],"up":[23],"to":[24],"about":[25],"10":[26],"000":[27],"junctions":[28,46],"arranged":[29],"a":[31,66,75],"meanderlike":[32],"design.":[33],"AC":[34],"voltages":[35],"waveforms":[38],"synthesized":[40],"by":[41,47],"operation":[42],"of":[43],"short":[48],"current":[49],"pulses.":[50],"Higher":[51],"harmonics":[52],"at":[54],"least":[55],"110":[56],"dB":[57],"below":[58],"fundamental.":[60],"To":[61],"verify":[62],"generated":[64],"waveforms,":[65],"spectrum":[67],"analyzer":[68],"that":[69],"has":[70],"initially":[71],"been":[72],"calibrated":[73],"using":[74],"binary-divided":[76],"programmable":[77],"voltage":[79],"standard":[80],"is":[81],"used.":[82]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}