{"id":"https://openalex.org/W2028068584","doi":"https://doi.org/10.1109/tim.2008.2005966","title":"Improving Digital System Diagnostics Through Prognostic and Health Management (PHM) Technology","display_name":"Improving Digital System Diagnostics Through Prognostic and Health Management (PHM) Technology","publication_year":2008,"publication_date":"2008-12-03","ids":{"openalex":"https://openalex.org/W2028068584","doi":"https://doi.org/10.1109/tim.2008.2005966","mag":"2028068584"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2008.2005966","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2008.2005966","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5063182221","display_name":"Mark Baybutt","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M. Baybutt","raw_affiliation_strings":["Impact Technol. LLC, Rochester, NY","Impact Technol., LLC, Rochester, NY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Impact Technol. LLC, Rochester, NY","institution_ids":[]},{"raw_affiliation_string":"Impact Technol., LLC, Rochester, NY","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041502788","display_name":"Chris Minnella","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"C. Minnella","raw_affiliation_strings":["Impact Technol. LLC, Rochester, NY","Impact Technol., LLC, Rochester, NY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Impact Technol. LLC, Rochester, NY","institution_ids":[]},{"raw_affiliation_string":"Impact Technol., LLC, Rochester, NY","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043357388","display_name":"Antonio Ginart","orcid":"https://orcid.org/0000-0002-8743-7090"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"A.E. Ginart","raw_affiliation_strings":["Impact Technol. LLC, Rochester, NY","Impact Technol., LLC, Rochester, NY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Impact Technol. LLC, Rochester, NY","institution_ids":[]},{"raw_affiliation_string":"Impact Technol., LLC, Rochester, NY","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023574761","display_name":"Patrick W. Kalgren","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"P.W. Kalgren","raw_affiliation_strings":["Impact Technol. LLC, Rochester, NY","Impact Technol., LLC, Rochester, NY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Impact Technol. LLC, Rochester, NY","institution_ids":[]},{"raw_affiliation_string":"Impact Technol., LLC, Rochester, NY","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108525595","display_name":"Michael Roemer","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M.J. Roemer","raw_affiliation_strings":["Impact Technol. LLC, Rochester, NY","Impact Technol., LLC, Rochester, NY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Impact Technol. LLC, Rochester, NY","institution_ids":[]},{"raw_affiliation_string":"Impact Technol., LLC, Rochester, NY","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.3942,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.89254235,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"58","issue":"2","first_page":"255","last_page":"262"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.686771035194397},{"id":"https://openalex.org/keywords/health-management-system","display_name":"Health management system","score":0.5937275290489197},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.529058575630188},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5263874530792236},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.5190232992172241},{"id":"https://openalex.org/keywords/physics-of-failure","display_name":"Physics of failure","score":0.5171067714691162},{"id":"https://openalex.org/keywords/condition-monitoring","display_name":"Condition monitoring","score":0.46172159910202026},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.36099952459335327},{"id":"https://openalex.org/keywords/medicine","display_name":"Medicine","score":0.11750242114067078}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.686771035194397},{"id":"https://openalex.org/C171265473","wikidata":"https://www.wikidata.org/wiki/Q5691117","display_name":"Health management system","level":3,"score":0.5937275290489197},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.529058575630188},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5263874530792236},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.5190232992172241},{"id":"https://openalex.org/C2778306610","wikidata":"https://www.wikidata.org/wiki/Q7189696","display_name":"Physics of failure","level":4,"score":0.5171067714691162},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.46172159910202026},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.36099952459335327},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.11750242114067078},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2008.2005966","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2008.2005966","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2002377960","https://openalex.org/W2105524902","https://openalex.org/W2112400091","https://openalex.org/W2165071510","https://openalex.org/W2801672379","https://openalex.org/W4231523873","https://openalex.org/W6650807564"],"related_works":["https://openalex.org/W2000692624","https://openalex.org/W2891709080","https://openalex.org/W2937898963","https://openalex.org/W3167483056","https://openalex.org/W2981723427","https://openalex.org/W2737216675","https://openalex.org/W2081618820","https://openalex.org/W2026292247","https://openalex.org/W3177385993","https://openalex.org/W2086816605"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"work":[3],"on":[4,55],"the":[5],"development":[6],"of":[7,58],"a":[8,56],"robust":[9],"online":[10],"digital":[11],"electronic":[12],"health":[13,49,72],"management":[14,50],"system.":[15],"The":[16,46],"presented":[17],"technical":[18],"approach":[19,52],"integrates":[20],"collaborative":[21],"diagnostic":[22],"and":[23,39,42,48,70],"prognostic":[24,47],"techniques":[25],"from":[26],"engineering":[27],"disciplines,":[28],"including":[29],"statistical":[30],"reliability,":[31],"damage":[32],"accumulation":[33],"modeling,":[34,36],"physics-of-failure":[35],"signal":[37],"processing":[38],"feature":[40],"extraction,":[41],"automated":[43],"reasoning":[44],"algorithms.":[45],"(PHM)":[51],"is":[53],"based":[54],"paradigm":[57],"minimally":[59],"invasive":[60],"onboard":[61],"monitoring":[62],"paired":[63],"with":[64],"model-based":[65],"estimates":[66],"to":[67],"deliver":[68],"timely":[69],"accurate":[71],"assessments.":[73]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}