{"id":"https://openalex.org/W2136765793","doi":"https://doi.org/10.1109/tim.2008.2004982","title":"A Vector Approach for Image Quality Assessment and Some Metrological Considerations","display_name":"A Vector Approach for Image Quality Assessment and Some Metrological Considerations","publication_year":2008,"publication_date":"2008-09-26","ids":{"openalex":"https://openalex.org/W2136765793","doi":"https://doi.org/10.1109/tim.2008.2004982","mag":"2136765793"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2008.2004982","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2008.2004982","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083411180","display_name":"Alessio De Angelis","orcid":"https://orcid.org/0000-0001-7953-4272"},"institutions":[{"id":"https://openalex.org/I27483092","display_name":"University of Perugia","ror":"https://ror.org/00x27da85","country_code":"IT","type":"education","lineage":["https://openalex.org/I27483092"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. De Angelis","raw_affiliation_strings":["Department of Electronic and Information Engineering, University of Perugia, Perugia, Italy","Dept. of Electron. & Inf. Eng., Univ. of Perugia, Perugia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic and Information Engineering, University of Perugia, Perugia, Italy","institution_ids":["https://openalex.org/I27483092"]},{"raw_affiliation_string":"Dept. of Electron. & Inf. Eng., Univ. of Perugia, Perugia","institution_ids":["https://openalex.org/I27483092"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047539322","display_name":"Antonio Moschitta","orcid":"https://orcid.org/0000-0001-9807-5948"},"institutions":[{"id":"https://openalex.org/I27483092","display_name":"University of Perugia","ror":"https://ror.org/00x27da85","country_code":"IT","type":"education","lineage":["https://openalex.org/I27483092"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Moschitta","raw_affiliation_strings":["Department of Electronic and Information Engineering, University of Perugia, Perugia, Italy","Dept. of Electron. & Inf. Eng., Univ. of Perugia, Perugia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic and Information Engineering, University of Perugia, Perugia, Italy","institution_ids":["https://openalex.org/I27483092"]},{"raw_affiliation_string":"Dept. of Electron. & Inf. Eng., Univ. of Perugia, Perugia","institution_ids":["https://openalex.org/I27483092"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065482976","display_name":"F. Russo","orcid":"https://orcid.org/0009-0009-0235-8106"},"institutions":[{"id":"https://openalex.org/I142444530","display_name":"University of Trieste","ror":"https://ror.org/02n742c10","country_code":"IT","type":"education","lineage":["https://openalex.org/I142444530"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"F. Russo","raw_affiliation_strings":["Dipartimento di Elettrotecnica, Elettronica ed Informatica, University of Trieste, Trieste, Italy","[Dipartimento di Elettrotecnica, Elettronica ed Informatica, University of Trieste, Trieste, Italy]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dipartimento di Elettrotecnica, Elettronica ed Informatica, University of Trieste, Trieste, Italy","institution_ids":["https://openalex.org/I142444530"]},{"raw_affiliation_string":"[Dipartimento di Elettrotecnica, Elettronica ed Informatica, University of Trieste, Trieste, Italy]","institution_ids":["https://openalex.org/I142444530"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090244413","display_name":"Paolo Carbone","orcid":"https://orcid.org/0000-0003-0540-1287"},"institutions":[{"id":"https://openalex.org/I27483092","display_name":"University of Perugia","ror":"https://ror.org/00x27da85","country_code":"IT","type":"education","lineage":["https://openalex.org/I27483092"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"P. Carbone","raw_affiliation_strings":["Department of Electronic and Information Engineering, University of Perugia, Perugia, Italy","[Dept. of Electronic and Information Engineering, University of Perugia, Perugia, Italy]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic and Information Engineering, University of Perugia, Perugia, Italy","institution_ids":["https://openalex.org/I27483092"]},{"raw_affiliation_string":"[Dept. of Electronic and Information Engineering, University of Perugia, Perugia, Italy]","institution_ids":["https://openalex.org/I27483092"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.1034,"has_fulltext":false,"cited_by_count":34,"citation_normalized_percentile":{"value":0.88634979,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"58","issue":"1","first_page":"14","last_page":"25"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11165","display_name":"Image and Video Quality Assessment","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11165","display_name":"Image and Video Quality Assessment","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6332995295524597},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.5841087698936462},{"id":"https://openalex.org/keywords/mean-squared-error","display_name":"Mean squared error","score":0.5438017249107361},{"id":"https://openalex.org/keywords/image-quality","display_name":"Image quality","score":0.5053966045379639},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.494434118270874},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4568745195865631},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.43592146039009094},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.42505303025245667},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2254486083984375},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.2174796462059021},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.18297606706619263}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6332995295524597},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.5841087698936462},{"id":"https://openalex.org/C139945424","wikidata":"https://www.wikidata.org/wiki/Q1940696","display_name":"Mean squared error","level":2,"score":0.5438017249107361},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.5053966045379639},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.494434118270874},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4568745195865631},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.43592146039009094},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.42505303025245667},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2254486083984375},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.2174796462059021},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.18297606706619263},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2008.2004982","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2008.2004982","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W99749851","https://openalex.org/W1485070959","https://openalex.org/W1492614353","https://openalex.org/W1561404778","https://openalex.org/W1581676061","https://openalex.org/W1783946990","https://openalex.org/W1842459430","https://openalex.org/W1978661170","https://openalex.org/W1989705930","https://openalex.org/W2005927904","https://openalex.org/W2020002837","https://openalex.org/W2025138552","https://openalex.org/W2041798388","https://openalex.org/W2046119925","https://openalex.org/W2092755522","https://openalex.org/W2105347883","https://openalex.org/W2106775624","https://openalex.org/W2114338738","https://openalex.org/W2114880045","https://openalex.org/W2120638214","https://openalex.org/W2125382552","https://openalex.org/W2127007691","https://openalex.org/W2133251102","https://openalex.org/W2133665775","https://openalex.org/W2142884912","https://openalex.org/W2158564760","https://openalex.org/W2161907179","https://openalex.org/W2167830984","https://openalex.org/W2488097972","https://openalex.org/W3182211633","https://openalex.org/W4240226474","https://openalex.org/W4253987648","https://openalex.org/W4285719527","https://openalex.org/W6603982535"],"related_works":["https://openalex.org/W4312671192","https://openalex.org/W2150533962","https://openalex.org/W2076127457","https://openalex.org/W4249083757","https://openalex.org/W2044230331","https://openalex.org/W3015838480","https://openalex.org/W2124449661","https://openalex.org/W2022219476","https://openalex.org/W2079058708","https://openalex.org/W2947674623"],"abstract_inverted_index":{"The":[0],"main":[1,20,148],"purpose":[2],"of":[3,12,27,33,40,42,54,63,83,95,150],"this":[4],"paper":[5],"is":[6,35,90,102,111],"to":[7,80,115,145],"present":[8],"a":[9,38,60,67,77,105,142],"metrology-based":[10],"view":[11],"the":[13,25,28,31,43,55,70,81,84,93,126,147,151],"image":[14],"quality":[15,72],"assessment":[16],"(IQA)":[17],"field.":[18],"Three":[19],"topics":[21],"are":[22,57,136],"developed.":[23],"First,":[24],"state":[26],"art":[29],"in":[30],"field":[32,56],"IQA":[34,49,87,100,110,153],"presented,":[36,91],"providing":[37],"classification":[39],"some":[41,52],"most":[44],"important":[45],"objective":[46,88],"and":[47,92,120,133],"subjective":[48,99],"methods.":[50,154],"Then,":[51],"aspects":[53],"analyzed":[58],"from":[59],"metrological":[61],"point":[62],"view,":[64],"also":[65],"through":[66],"comparison":[68],"with":[69,113],"software":[71],"measurement":[73,96],"area.":[74],"In":[75],"particular,":[76],"statistical":[78],"approach":[79,107],"evaluation":[82],"uncertainty":[85],"for":[86,98,108],"methods":[89,101],"topic":[94],"modeling":[97],"analyzed.":[103],"Finally,":[104],"vector":[106,127,139],"full-reference":[109],"discussed,":[112],"applications":[114],"images":[116],"corrupted":[117],"by":[118],"impulse":[119],"Gaussian":[121],"noise.":[122],"For":[123],"these":[124],"applications,":[125],"root":[128],"mean":[129],"squared":[130],"error":[131],"(VRMSE)":[132],"fuzzy":[134],"VRMSE":[135],"introduced.":[137],"These":[138],"parameters":[140],"provide":[141],"possible":[143],"way":[144],"overcome":[146],"limitations":[149],"mean-squared-error-based":[152]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}