{"id":"https://openalex.org/W2102969258","doi":"https://doi.org/10.1109/tim.2008.2004340","title":"Novel Classifier Fusion Approaches for Fault Diagnosis in Automotive Systems","display_name":"Novel Classifier Fusion Approaches for Fault Diagnosis in Automotive Systems","publication_year":2008,"publication_date":"2008-09-26","ids":{"openalex":"https://openalex.org/W2102969258","doi":"https://doi.org/10.1109/tim.2008.2004340","mag":"2102969258"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2008.2004340","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2008.2004340","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083915705","display_name":"Kihoon Choi","orcid":null},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kihoon Choi","raw_affiliation_strings":["Department of the Electrical and Computer Engineering, University of Connecticut, Storrs, CT, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of the Electrical and Computer Engineering, University of Connecticut, Storrs, CT, USA","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101711904","display_name":"S. Singh","orcid":"https://orcid.org/0009-0009-3127-3048"},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]},{"id":"https://openalex.org/I2801120862","display_name":"General Motors (India)","ror":"https://ror.org/05g5nrw43","country_code":"IN","type":"company","lineage":["https://openalex.org/I118136607","https://openalex.org/I2801120862"]}],"countries":["IN","US"],"is_corresponding":false,"raw_author_name":"S. Singh","raw_affiliation_strings":["Department of the Electrical and Computer Engineering, University of Connecticut, Storrs, CT, USA","General Motors India Science Laboratory, Bangalore, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of the Electrical and Computer Engineering, University of Connecticut, Storrs, CT, USA","institution_ids":["https://openalex.org/I140172145"]},{"raw_affiliation_string":"General Motors India Science Laboratory, Bangalore, India","institution_ids":["https://openalex.org/I2801120862"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103512763","display_name":"Anuradha Kodali","orcid":null},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Kodali","raw_affiliation_strings":["Department of the Electrical and Computer Engineering, University of Connecticut, Storrs, CT, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of the Electrical and Computer Engineering, University of Connecticut, Storrs, CT, USA","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082001657","display_name":"Krishna R. Pattipati","orcid":"https://orcid.org/0000-0002-0565-181X"},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K.R. Pattipati","raw_affiliation_strings":["Department of the Electrical and Computer Engineering, University of Connecticut, Storrs, CT, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of the Electrical and Computer Engineering, University of Connecticut, Storrs, CT, USA","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072522101","display_name":"John W. Sheppard","orcid":"https://orcid.org/0000-0001-9487-5622"},"institutions":[{"id":"https://openalex.org/I145311948","display_name":"Johns Hopkins University","ror":"https://ror.org/00za53h95","country_code":"US","type":"education","lineage":["https://openalex.org/I145311948"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J.W. Sheppard","raw_affiliation_strings":["Department of Computer Science, Johns Hopkins University, Baltimore, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Johns Hopkins University, Baltimore, MD, USA","institution_ids":["https://openalex.org/I145311948"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109968169","display_name":"Setu Madhavi Namburu","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S.M. Namburu","raw_affiliation_strings":["Toyota Technical Center, Ann Arbor, MI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Toyota Technical Center, Ann Arbor, MI, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086973578","display_name":"Shunsuke Chigusa","orcid":null},"institutions":[{"id":"https://openalex.org/I1338438537","display_name":"Isuzu Motors (United States)","ror":"https://ror.org/05mspvn40","country_code":"US","type":"company","lineage":["https://openalex.org/I1338438537","https://openalex.org/I4210091544"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Chigusa","raw_affiliation_strings":["Isuzu Motors America, Plymouth, MI"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Isuzu Motors America, Plymouth, MI","institution_ids":["https://openalex.org/I1338438537"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061971606","display_name":"Danil Prokhorov","orcid":"https://orcid.org/0000-0002-6208-4233"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"D.V. Prokhorov","raw_affiliation_strings":["Toyota Technical Center, Ann Arbor, MI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Toyota Technical Center, Ann Arbor, MI, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077109703","display_name":"Qiao Liu","orcid":"https://orcid.org/0000-0002-2573-9544"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Liu Qiao","raw_affiliation_strings":["Toyota Technical Center, Ann Arbor, MI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Toyota Technical Center, Ann Arbor, MI, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":11.0678,"has_fulltext":false,"cited_by_count":61,"citation_normalized_percentile":{"value":0.97799017,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"58","issue":"3","first_page":"602","last_page":"611"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10640","display_name":"Spectroscopy and Chemometric Analyses","score":0.982699990272522,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9753000140190125,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.752342700958252},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.6602136492729187},{"id":"https://openalex.org/keywords/sensor-fusion","display_name":"Sensor fusion","score":0.6524602770805359},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5614587664604187},{"id":"https://openalex.org/keywords/fusion","display_name":"Fusion","score":0.5579022169113159},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.5533766150474548},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5173001289367676},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.43780025839805603},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3686216473579407},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.36220043897628784}],"concepts":[{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.752342700958252},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.6602136492729187},{"id":"https://openalex.org/C33954974","wikidata":"https://www.wikidata.org/wiki/Q486494","display_name":"Sensor fusion","level":2,"score":0.6524602770805359},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5614587664604187},{"id":"https://openalex.org/C158525013","wikidata":"https://www.wikidata.org/wiki/Q2593739","display_name":"Fusion","level":2,"score":0.5579022169113159},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.5533766150474548},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5173001289367676},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.43780025839805603},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3686216473579407},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.36220043897628784},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2008.2004340","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2008.2004340","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.142.5755","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.142.5755","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.cs.jhu.edu/~jsquad/pubs/ClassiferFusionRevised.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":48,"referenced_works":["https://openalex.org/W1488706289","https://openalex.org/W1531532259","https://openalex.org/W1538372379","https://openalex.org/W1546113605","https://openalex.org/W1552624648","https://openalex.org/W1571401318","https://openalex.org/W1603849545","https://openalex.org/W1676820704","https://openalex.org/W1858553808","https://openalex.org/W1980073965","https://openalex.org/W1981586857","https://openalex.org/W1988673604","https://openalex.org/W1988790447","https://openalex.org/W2000858991","https://openalex.org/W2002283491","https://openalex.org/W2004789217","https://openalex.org/W2016648380","https://openalex.org/W2023315648","https://openalex.org/W2064546251","https://openalex.org/W2065663925","https://openalex.org/W2075014237","https://openalex.org/W2089468765","https://openalex.org/W2090226684","https://openalex.org/W2092316708","https://openalex.org/W2107451631","https://openalex.org/W2109100253","https://openalex.org/W2112076978","https://openalex.org/W2115119100","https://openalex.org/W2120290123","https://openalex.org/W2122949361","https://openalex.org/W2139212933","https://openalex.org/W2140575513","https://openalex.org/W2154212657","https://openalex.org/W2155639125","https://openalex.org/W2158275940","https://openalex.org/W2159402710","https://openalex.org/W2164568552","https://openalex.org/W2165335390","https://openalex.org/W2172000360","https://openalex.org/W2342204193","https://openalex.org/W2342233250","https://openalex.org/W2487087946","https://openalex.org/W2546067355","https://openalex.org/W4205687621","https://openalex.org/W4240255376","https://openalex.org/W4285719527","https://openalex.org/W6632312326","https://openalex.org/W6647864946"],"related_works":["https://openalex.org/W4382644535","https://openalex.org/W2132659060","https://openalex.org/W2031992971","https://openalex.org/W3214791684","https://openalex.org/W2353265673","https://openalex.org/W2152662039","https://openalex.org/W2726747157","https://openalex.org/W2004817612","https://openalex.org/W2010131506","https://openalex.org/W2145797872"],"abstract_inverted_index":{"Faulty":[0],"automotive":[1,40,62,115],"systems":[2],"significantly":[3],"degrade":[4],"the":[5,69,95,107,122,135,143],"performance":[6],"and":[7,11,26,98,101],"efficiency":[8],"of":[9,16,56,71,94,109,137,142],"vehicles":[10],"are":[12,33],"often":[13],"major":[14],"contributors":[15],"vehicle":[17,30],"breakdown;":[18],"they":[19],"result":[20],"in":[21,39,61],"large":[22],"expenditures":[23],"for":[24,35,58],"repair":[25],"maintenance.":[27],"Therefore,":[28],"intelligent":[29],"health-monitoring":[31],"schemes":[32],"needed":[34],"effective":[36],"fault":[37,59],"diagnosis":[38,60],"systems.":[41,63],"Previously,":[42],"we":[43,67,80],"developed":[44],"a":[45,49,54],"data-driven":[46],"approach":[47],"using":[48],"data-reduction":[50],"technique,":[51],"coupled":[52],"with":[53],"variety":[55],"classifiers,":[57],"In":[64],"this":[65],"paper,":[66],"consider":[68],"problem":[70],"fusing":[72],"classifier":[73,84],"decisions":[74],"to":[75],"reduce":[76],"diagnostic":[77],"errors.":[78],"Specifically,":[79],"develop":[81],"three":[82],"novel":[83],"fusion":[85,96,111,124,128,144],"approaches:":[86],"1.":[87],"class-specific":[88],"Bayesian":[89],"fusion;":[90],"2.":[91],"joint":[92],"optimization":[93],"center":[97],"individual":[99,138],"classifiers;":[100],"3.":[102],"dynamic":[103],"fusion.":[104],"We":[105,130],"evaluate":[106],"efficacies":[108],"these":[110],"approaches":[112],"on":[113],"an":[114],"engine":[116],"data.":[117],"The":[118],"results":[119],"demonstrate":[120],"that":[121,133],"proposed":[123],"techniques":[125],"outperform":[126],"traditional":[127],"approaches.":[129],"also":[131],"show":[132],"learning":[134],"parameters":[136],"classifiers":[139],"as":[140],"part":[141],"architecture":[145],"can":[146],"provide":[147],"better":[148],"classification":[149],"performance.":[150]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":6},{"year":2012,"cited_by_count":7}],"updated_date":"2026-08-26T07:47:46.906454","created_date":"2025-10-10T00:00:00"}