{"id":"https://openalex.org/W2163817444","doi":"https://doi.org/10.1109/tim.2007.904491","title":"SEIR Linearity Testing of Precision A/D Converters in Nonstationary Environments With Center-Symmetric Interleaving","display_name":"SEIR Linearity Testing of Precision A/D Converters in Nonstationary Environments With Center-Symmetric Interleaving","publication_year":2007,"publication_date":"2007-09-17","ids":{"openalex":"https://openalex.org/W2163817444","doi":"https://doi.org/10.1109/tim.2007.904491","mag":"2163817444"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2007.904491","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2007.904491","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112171934","display_name":"Le Jin","orcid":"https://orcid.org/0009-0000-9622-1526"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]},{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Le Jin","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","National Semiconductor Corporation, Santa Clara, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"National Semiconductor Corporation, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101873076","display_name":"Degang Chen","orcid":"https://orcid.org/0000-0002-5938-6329"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Degang Chen","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108357375","display_name":"R.L. Geiger","orcid":null},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Randall L. Geiger","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5112171934"],"corresponding_institution_ids":["https://openalex.org/I173911158","https://openalex.org/I74760111"],"apc_list":null,"apc_paid":null,"fwci":4.5661,"has_fulltext":false,"cited_by_count":34,"citation_normalized_percentile":{"value":0.94785652,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"56","issue":"5","first_page":"1776","last_page":"1785"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interleaving","display_name":"Interleaving","score":0.8179576396942139},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.7724024057388306},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.7274590134620667},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6146723031997681},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5388299226760864},{"id":"https://openalex.org/keywords/analog-to-digital-converter","display_name":"Analog-to-digital converter","score":0.5155551433563232},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.45042431354522705},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.4457279145717621},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2649361491203308},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.25132477283477783},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2099759876728058},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.19549161195755005},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12442022562026978},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10440400242805481}],"concepts":[{"id":"https://openalex.org/C28034677","wikidata":"https://www.wikidata.org/wiki/Q17092530","display_name":"Interleaving","level":2,"score":0.8179576396942139},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.7724024057388306},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.7274590134620667},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6146723031997681},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5388299226760864},{"id":"https://openalex.org/C2777271169","wikidata":"https://www.wikidata.org/wiki/Q190169","display_name":"Analog-to-digital converter","level":3,"score":0.5155551433563232},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.45042431354522705},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.4457279145717621},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2649361491203308},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.25132477283477783},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2099759876728058},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.19549161195755005},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12442022562026978},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10440400242805481}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2007.904491","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2007.904491","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Life in Land","score":0.4300000071525574,"id":"https://metadata.un.org/sdg/15"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1566907904","https://openalex.org/W1571942025","https://openalex.org/W1638355465","https://openalex.org/W2007472976","https://openalex.org/W2113796007","https://openalex.org/W2129182275","https://openalex.org/W2131477866","https://openalex.org/W2149775467","https://openalex.org/W2150395713","https://openalex.org/W2166763847","https://openalex.org/W6681928805"],"related_works":["https://openalex.org/W2520281879","https://openalex.org/W2354856110","https://openalex.org/W2759986866","https://openalex.org/W2551040039","https://openalex.org/W2316679782","https://openalex.org/W2260965739","https://openalex.org/W3170226631","https://openalex.org/W3027656099","https://openalex.org/W3152894281","https://openalex.org/W2489339234"],"abstract_inverted_index":{"This":[0,59],"paper":[1],"describes":[2],"an":[3,119],"approach":[4,60],"for":[5,93],"analog-to-digital":[6],"converter":[7],"(ADC)":[8],"linearity":[9,117],"testing":[10,28,65],"that":[11,101],"can":[12,61,105,129],"tolerate":[13],"environmental":[14,46],"nonstationarity":[15,47],"and":[16,33,78,97,145,149],"use":[17],"low-precision":[18],"test":[19,140],"signals.":[20,42],"The":[21,43,126],"effects":[22,44],"of":[23,40,45,66,68,115,134,142],"stimulus":[24],"errors":[25],"on":[26],"ADC":[27,104,135],"results":[29,99],"will":[30,48],"be":[31,49,62,106],"identified":[32],"removed":[34],"by":[35,51,111],"exploiting":[36],"the":[37,132,139],"functional":[38],"relationship":[39],"input":[41,53,113],"suppressed":[50],"interleaving":[52],"signals":[54,114],"with":[55,121],"a":[56,90,102],"center-symmetric":[57],"pattern.":[58],"applied":[63],"to":[64,85,108],"ADCs":[67],"very":[69],"high":[70],"performance,":[71],"such":[72],"as":[73],"16-bit":[74,103],"or":[75],"higher":[76],"resolution":[77],"more":[79,122],"than":[80,123],"1":[81],"MSPS":[82],"sampling":[83],"rates,":[84],"which":[86],"there":[87],"is":[88],"hardly":[89],"well-established":[91],"solution":[92],"full-code":[94],"testing.":[95],"Simulation":[96],"experimental":[98],"show":[100],"tested":[107],"one-least-significant-bit":[109],"accuracy":[110],"using":[112],"seven-bit":[116],"in":[118],"environment":[120],"100-ppm/min":[124],"nonstationarity.":[125],"proposed":[127],"method":[128],"help":[130],"control":[131],"cost":[133],"production":[136],"tests,":[137],"extend":[138],"coverage":[141],"current":[143],"solutions,":[144],"enable":[146],"built-in":[147],"self-tests":[148],"test-based":[150],"self-calibrations.":[151]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}