{"id":"https://openalex.org/W2105222492","doi":"https://doi.org/10.1109/tim.2002.806008","title":"AC-DC current transfer step-up and step-down calibration and uncertainty calculation","display_name":"AC-DC current transfer step-up and step-down calibration and uncertainty calculation","publication_year":2002,"publication_date":"2002-10-01","ids":{"openalex":"https://openalex.org/W2105222492","doi":"https://doi.org/10.1109/tim.2002.806008","mag":"2105222492"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2002.806008","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2002.806008","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077791721","display_name":"M. Klonz","orcid":null},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"M. Klonz","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany"],"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071004824","display_name":"H. Laiz","orcid":null},"institutions":[{"id":"https://openalex.org/I41147313","display_name":"National Institute of Industrial Technology","ror":"https://ror.org/046denk61","country_code":"AR","type":"funder","lineage":["https://openalex.org/I41147313"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"H. Laiz","raw_affiliation_strings":["Instituto Nacional de Tecnolog\u00eda Industrial, San Martin, Argentina"],"affiliations":[{"raw_affiliation_string":"Instituto Nacional de Tecnolog\u00eda Industrial, San Martin, Argentina","institution_ids":["https://openalex.org/I41147313"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067225891","display_name":"Thomas Spiegel","orcid":"https://orcid.org/0000-0001-9258-0564"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"T. Spiegel","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany"],"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012098709","display_name":"P. Bittel","orcid":null},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"P. Bittel","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany"],"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5077791721"],"corresponding_institution_ids":["https://openalex.org/I1285933455"],"apc_list":null,"apc_paid":null,"fwci":1.6972,"has_fulltext":false,"cited_by_count":39,"citation_normalized_percentile":{"value":0.84280787,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"51","issue":"5","first_page":"1027","last_page":"1034"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9921000003814697,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.729938268661499},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.6909483671188354},{"id":"https://openalex.org/keywords/coaxial","display_name":"Coaxial","score":0.6590492725372314},{"id":"https://openalex.org/keywords/overdetermined-system","display_name":"Overdetermined system","score":0.5423768758773804},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5384715795516968},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.5140377283096313},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4992225170135498},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.47673332691192627},{"id":"https://openalex.org/keywords/transfer","display_name":"Transfer (computing)","score":0.4622291028499603},{"id":"https://openalex.org/keywords/direct-current","display_name":"Direct current","score":0.45522865653038025},{"id":"https://openalex.org/keywords/planar","display_name":"Planar","score":0.4374277889728546},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.41884246468544006},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3825441598892212},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37015512585639954},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3312247395515442},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.29338550567626953},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27203547954559326},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.19951170682907104},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.1782306432723999},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.08179301023483276}],"concepts":[{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.729938268661499},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.6909483671188354},{"id":"https://openalex.org/C51221625","wikidata":"https://www.wikidata.org/wiki/Q1751466","display_name":"Coaxial","level":2,"score":0.6590492725372314},{"id":"https://openalex.org/C81901731","wikidata":"https://www.wikidata.org/wiki/Q331348","display_name":"Overdetermined system","level":2,"score":0.5423768758773804},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5384715795516968},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.5140377283096313},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4992225170135498},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.47673332691192627},{"id":"https://openalex.org/C2776175482","wikidata":"https://www.wikidata.org/wiki/Q1195816","display_name":"Transfer (computing)","level":2,"score":0.4622291028499603},{"id":"https://openalex.org/C2776620479","wikidata":"https://www.wikidata.org/wiki/Q159241","display_name":"Direct current","level":3,"score":0.45522865653038025},{"id":"https://openalex.org/C134786449","wikidata":"https://www.wikidata.org/wiki/Q3391255","display_name":"Planar","level":2,"score":0.4374277889728546},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.41884246468544006},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3825441598892212},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37015512585639954},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3312247395515442},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.29338550567626953},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27203547954559326},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19951170682907104},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.1782306432723999},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.08179301023483276},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.0},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2002.806008","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2002.806008","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8600000143051147,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1861026555","https://openalex.org/W1978338331","https://openalex.org/W2012634681","https://openalex.org/W2028437540","https://openalex.org/W2038171834","https://openalex.org/W2038634975","https://openalex.org/W2047478945","https://openalex.org/W2054896315","https://openalex.org/W2105560431","https://openalex.org/W2112977816","https://openalex.org/W2122072795","https://openalex.org/W2132559919","https://openalex.org/W2141200692","https://openalex.org/W6639039757"],"related_works":["https://openalex.org/W4382516418","https://openalex.org/W2990591761","https://openalex.org/W4386576538","https://openalex.org/W1981326443","https://openalex.org/W2347376008","https://openalex.org/W2383044727","https://openalex.org/W4287998014","https://openalex.org/W2996858796","https://openalex.org/W28907793","https://openalex.org/W2111704737"],"abstract_inverted_index":{"New":[0],"AC-DC":[1,47],"current":[2,9,48,79,87,172],"transfer":[3,49],"standards":[4],"are":[5,72,97],"built":[6],"for":[7,45,153],"the":[8,18,42,46,86,99,125,131,154,157,161,170,176],"range":[10,20,88,100],"from":[11,21,52,66,101],"0.3":[12],"mA":[13,107],"to":[14,24,54,68,90,111,147,151,175],"20":[15,53,91,116],"A":[16,27,117],"and":[17,108,118,134],"frequency":[19],"10":[22],"Hz":[23],"100":[25,119],"kHz.":[26,120],"three-dimensional":[28],"PTB-multijunction":[29],"thermal":[30],"converter":[31],"(MJTC)":[32],"with":[33,63,83],"a":[34,75],"heater":[35,64],"resistance":[36],"of":[37,124,142,156],"27":[38],"/spl":[39,70,103,113],"Omega/":[40,71],"is":[41],"basic":[43],"standard":[44,94],"at":[50,105,115,169],"currents":[51],"50":[55,112],"mA.":[56],"At":[57],"lower":[58],"currents,":[59],"planar":[60],"MJTCs":[61],"(PMJTCs)":[62],"resistances":[65],"90":[67],"960":[69],"used":[73],"in":[74,81,98,130,160,166],"step-down":[76],"procedure.":[77,163],"Coaxial":[78],"shunts":[80],"parallel":[82],"PMJTCs":[84],"extend":[85],"up":[89],"A.":[92],"The":[93,121],"measurement":[95],"uncertainties":[96,168],"0.2":[102],"mu/A/A":[104,114],"25":[106],"1":[109],"kHz":[110],"high":[122],"sensitivity":[123],"PMJTC":[126],"allows":[127],"bigger":[128],"steps":[129,137,145],"step-up":[132,162],"calibration":[133],"some":[135],"smaller":[136],"between":[138],"these":[139,144],"steps.":[140],"Calibration":[141],"all":[143],"leads":[146],"an":[148],"overdetermined":[149],"system":[150],"check":[152],"validity":[155],"assumptions":[158],"made":[159],"This":[164],"results":[165],"reduced":[167],"different":[171],"levels":[173],"compared":[174],"old":[177],"method.":[178]},"counts_by_year":[{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2016,"cited_by_count":3},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}