{"id":"https://openalex.org/W2161455323","doi":"https://doi.org/10.1109/tim.2002.1017708","title":"An active millimeter load-pull measurement system using two six-port reflectometers operating in the W-frequency band","display_name":"An active millimeter load-pull measurement system using two six-port reflectometers operating in the W-frequency band","publication_year":2002,"publication_date":"2002-06-01","ids":{"openalex":"https://openalex.org/W2161455323","doi":"https://doi.org/10.1109/tim.2002.1017708","mag":"2161455323"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2002.1017708","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2002.1017708","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109911003","display_name":"Soubhi Abou Chahine","orcid":null},"institutions":[{"id":"https://openalex.org/I36314861","display_name":"Beirut Arab University","ror":"https://ror.org/02jya5567","country_code":"LB","type":"education","lineage":["https://openalex.org/I36314861"]}],"countries":["LB"],"is_corresponding":false,"raw_author_name":"S.A. Chahine","raw_affiliation_strings":["Beirut Arab University, Beirut, Lebanon, Lebanon"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beirut Arab University, Beirut, Lebanon, Lebanon","institution_ids":["https://openalex.org/I36314861"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112869197","display_name":"B. Huyart","orcid":null},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"B. Huyart","raw_affiliation_strings":["Ecole Nationale Superieure des Telecommunications, Paris, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ecole Nationale Superieure des Telecommunications, Paris, France","institution_ids":["https://openalex.org/I12356871"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038950684","display_name":"E. Bergeault","orcid":null},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"E. Bergeault","raw_affiliation_strings":["Ecole Nationale Superieure des Telecommunications, Paris, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ecole Nationale Superieure des Telecommunications, Paris, France","institution_ids":["https://openalex.org/I12356871"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108230170","display_name":"L. Jallet","orcid":null},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"L.P. Jallet","raw_affiliation_strings":["Ecole Nationale Superieure des Telecommunications, Paris, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ecole Nationale Superieure des Telecommunications, Paris, France","institution_ids":["https://openalex.org/I12356871"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.25012059,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"51","issue":"3","first_page":"408","last_page":"412"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/smith-chart","display_name":"Smith chart","score":0.8082982897758484},{"id":"https://openalex.org/keywords/reflection-coefficient","display_name":"Reflection coefficient","score":0.530113935470581},{"id":"https://openalex.org/keywords/reflectometry","display_name":"Reflectometry","score":0.5164599418640137},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.5092374086380005},{"id":"https://openalex.org/keywords/millimeter","display_name":"Millimeter","score":0.49318474531173706},{"id":"https://openalex.org/keywords/standard-deviation","display_name":"Standard deviation","score":0.47735026478767395},{"id":"https://openalex.org/keywords/scattering-parameters","display_name":"Scattering parameters","score":0.47496816515922546},{"id":"https://openalex.org/keywords/load-pull","display_name":"Load pull","score":0.4706558287143707},{"id":"https://openalex.org/keywords/reflection","display_name":"Reflection (computer programming)","score":0.4539281725883484},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4491080641746521},{"id":"https://openalex.org/keywords/high-electron-mobility-transistor","display_name":"High-electron-mobility transistor","score":0.4349084496498108},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3869127631187439},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.35084545612335205},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3233550488948822},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.23256656527519226},{"id":"https://openalex.org/keywords/impedance-matching","display_name":"Impedance matching","score":0.20755988359451294},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.193149596452713},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16731896996498108},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.1583530604839325},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.10707473754882812},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09436589479446411}],"concepts":[{"id":"https://openalex.org/C207807769","wikidata":"https://www.wikidata.org/wiki/Q1071416","display_name":"Smith chart","level":4,"score":0.8082982897758484},{"id":"https://openalex.org/C41700454","wikidata":"https://www.wikidata.org/wiki/Q1852282","display_name":"Reflection coefficient","level":2,"score":0.530113935470581},{"id":"https://openalex.org/C2778925768","wikidata":"https://www.wikidata.org/wiki/Q3454718","display_name":"Reflectometry","level":3,"score":0.5164599418640137},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5092374086380005},{"id":"https://openalex.org/C109792285","wikidata":"https://www.wikidata.org/wiki/Q174789","display_name":"Millimeter","level":2,"score":0.49318474531173706},{"id":"https://openalex.org/C22679943","wikidata":"https://www.wikidata.org/wiki/Q159375","display_name":"Standard deviation","level":2,"score":0.47735026478767395},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.47496816515922546},{"id":"https://openalex.org/C2780141302","wikidata":"https://www.wikidata.org/wiki/Q6663311","display_name":"Load pull","level":4,"score":0.4706558287143707},{"id":"https://openalex.org/C65682993","wikidata":"https://www.wikidata.org/wiki/Q1056451","display_name":"Reflection (computer programming)","level":2,"score":0.4539281725883484},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4491080641746521},{"id":"https://openalex.org/C162057924","wikidata":"https://www.wikidata.org/wiki/Q1617706","display_name":"High-electron-mobility transistor","level":4,"score":0.4349084496498108},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3869127631187439},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.35084545612335205},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3233550488948822},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.23256656527519226},{"id":"https://openalex.org/C612350","wikidata":"https://www.wikidata.org/wiki/Q1761108","display_name":"Impedance matching","level":3,"score":0.20755988359451294},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.193149596452713},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16731896996498108},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.1583530604839325},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.10707473754882812},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09436589479446411},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2002.1017708","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2002.1017708","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8700000047683716}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1576408262","https://openalex.org/W1988364177","https://openalex.org/W2046971487","https://openalex.org/W2084665650","https://openalex.org/W2098323996","https://openalex.org/W2111068907","https://openalex.org/W2123874683","https://openalex.org/W2163558941","https://openalex.org/W2166474737","https://openalex.org/W2912954238"],"related_works":["https://openalex.org/W2031594828","https://openalex.org/W4243806617","https://openalex.org/W2020842688","https://openalex.org/W2067897470","https://openalex.org/W1981752360","https://openalex.org/W2543605793","https://openalex.org/W2148990764","https://openalex.org/W3021122695","https://openalex.org/W1636785379","https://openalex.org/W1957449701"],"abstract_inverted_index":{"An":[0],"active":[1],"load-pull":[2],"measurement":[3,36],"system":[4],"using":[5],"two":[6],"six-port":[7],"reflectometers":[8],"operating":[9,65],"in":[10],"the":[11,19,41,47,50,54,85],"W-frequency":[12],"band":[13],"is":[14,38,89],"demonstrated.":[15],"Ninety":[16],"loads":[17],"over":[18],"whole":[20],"Smith":[21],"chart":[22],"have":[23],"been":[24],"synthesized":[25],"and":[26,43,71],"measured":[27],"by":[28],"both":[29,35],"reflectometers.":[30],"The":[31,57,82],"maximum":[32],"deviation":[33,83],"between":[34,84],"data":[37],"0.02":[39],"for":[40,46],"magnitude":[42],"3/spl":[44],"deg/":[45],"phase":[48],"of":[49,53,62,87],"reflection":[51],"coefficient":[52],"90":[55],"loads.":[56],"constant":[58],"power":[59],"gain":[60],"circles":[61,88],"a":[63],"PHEMT":[64],"at":[66],"89":[67],"GHz":[68],"are":[69],"shown":[70],"compared":[72],"with":[73],"those":[74],"calculated":[75],"from":[76],"its":[77],"S/sub":[78],"ij/":[79],"scattering":[80],"parameters.":[81],"radii":[86],"less":[90],"than":[91],"0.03.":[92]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}