{"id":"https://openalex.org/W4401246611","doi":"https://doi.org/10.1109/tii.2024.3431069","title":"Few-Shot Defect Detection of Catheter Products via Enlarged Scale Feature Pyramid and Contrastive Proposal Memory Bank","display_name":"Few-Shot Defect Detection of Catheter Products via Enlarged Scale Feature Pyramid and Contrastive Proposal Memory Bank","publication_year":2024,"publication_date":"2024-08-02","ids":{"openalex":"https://openalex.org/W4401246611","doi":"https://doi.org/10.1109/tii.2024.3431069"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2024.3431069","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2024.3431069","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100375993","display_name":"Yuxuan Wang","orcid":"https://orcid.org/0000-0003-2341-775X"},"institutions":[{"id":"https://openalex.org/I14243506","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Yuxuan Wang","raw_affiliation_strings":["Department of Industrial and Systems Engineering, The Hong Kong Polytechnic University, Hong Kong"],"raw_orcid":"https://orcid.org/0000-0003-2341-775X","affiliations":[{"raw_affiliation_string":"Department of Industrial and Systems Engineering, The Hong Kong Polytechnic University, Hong Kong","institution_ids":["https://openalex.org/I14243506"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083077430","display_name":"Waqar Ahmed Khan","orcid":"https://orcid.org/0000-0002-4082-0893"},"institutions":[{"id":"https://openalex.org/I29891158","display_name":"University of Sharjah","ror":"https://ror.org/00engpz63","country_code":"AE","type":"education","lineage":["https://openalex.org/I29891158"]}],"countries":["AE"],"is_corresponding":false,"raw_author_name":"Waqar Ahmed Khan","raw_affiliation_strings":["Department of Industrial Engineering and Engineering Management, College of Engineering, University of Sharjah, Sharjah, UAE"],"raw_orcid":"https://orcid.org/0000-0002-4082-0893","affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering and Engineering Management, College of Engineering, University of Sharjah, Sharjah, UAE","institution_ids":["https://openalex.org/I29891158"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029344924","display_name":"Sai\u2010Ho Chung","orcid":"https://orcid.org/0000-0002-0534-7930"},"institutions":[{"id":"https://openalex.org/I14243506","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Sai-Ho Chung","raw_affiliation_strings":["Department of Industrial and Systems Engineering, The Hong Kong Polytechnic University, Hong Kong"],"raw_orcid":"https://orcid.org/0000-0002-0534-7930","affiliations":[{"raw_affiliation_string":"Department of Industrial and Systems Engineering, The Hong Kong Polytechnic University, Hong Kong","institution_ids":["https://openalex.org/I14243506"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.3772,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.92474364,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":100},"biblio":{"volume":"20","issue":"11","first_page":"13036","last_page":"13046"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9381999969482422,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":0.921999990940094,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pyramid","display_name":"Pyramid (geometry)","score":0.7702913284301758},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.6216927766799927},{"id":"https://openalex.org/keywords/shot","display_name":"Shot (pellet)","score":0.6182104349136353},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5629075765609741},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5479075312614441},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5254380106925964},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4971649944782257},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.4552757143974304},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4035962224006653},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.17714527249336243},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.12194374203681946},{"id":"https://openalex.org/keywords/cartography","display_name":"Cartography","score":0.06993922591209412}],"concepts":[{"id":"https://openalex.org/C142575187","wikidata":"https://www.wikidata.org/wiki/Q3358290","display_name":"Pyramid (geometry)","level":2,"score":0.7702913284301758},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.6216927766799927},{"id":"https://openalex.org/C2778344882","wikidata":"https://www.wikidata.org/wiki/Q278938","display_name":"Shot (pellet)","level":2,"score":0.6182104349136353},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5629075765609741},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5479075312614441},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5254380106925964},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4971649944782257},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.4552757143974304},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4035962224006653},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.17714527249336243},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.12194374203681946},{"id":"https://openalex.org/C58640448","wikidata":"https://www.wikidata.org/wiki/Q42515","display_name":"Cartography","level":1,"score":0.06993922591209412},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tii.2024.3431069","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2024.3431069","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W2194775991","https://openalex.org/W2565639579","https://openalex.org/W2944303778","https://openalex.org/W2963857746","https://openalex.org/W2996583130","https://openalex.org/W3012374719","https://openalex.org/W3014641072","https://openalex.org/W3028888497","https://openalex.org/W3040739812","https://openalex.org/W3044832322","https://openalex.org/W3097651496","https://openalex.org/W3169708801","https://openalex.org/W4213450898","https://openalex.org/W4298111403","https://openalex.org/W4312738608","https://openalex.org/W4319242194","https://openalex.org/W4366083832","https://openalex.org/W4378697379","https://openalex.org/W4386083115","https://openalex.org/W4387541076","https://openalex.org/W4391128455","https://openalex.org/W4392543763","https://openalex.org/W4394564106","https://openalex.org/W6620707391","https://openalex.org/W6637373629","https://openalex.org/W6688325169","https://openalex.org/W6739696289","https://openalex.org/W6774983715","https://openalex.org/W6776700526","https://openalex.org/W6784094891","https://openalex.org/W6793164127","https://openalex.org/W6798838024","https://openalex.org/W6809665764"],"related_works":["https://openalex.org/W2074502265","https://openalex.org/W4214877189","https://openalex.org/W2773965352","https://openalex.org/W2381179799","https://openalex.org/W2980279061","https://openalex.org/W2334685461","https://openalex.org/W2366718574","https://openalex.org/W2359774528","https://openalex.org/W4206776094","https://openalex.org/W3121197456"],"abstract_inverted_index":{"The":[0],"automatic":[1],"detection":[2,26,54],"of":[3,66,108,147],"defects":[4],"in":[5,13,62,92],"manufacturing":[6],"catheter":[7,37,67,109,140],"production":[8],"assumes":[9],"a":[10,51,77,112],"crucial":[11],"role":[12],"ensuring":[14],"safety":[15],"within":[16],"the":[17,63,88,105,122,138,144],"downstream":[18],"healthcare":[19],"industry.":[20],"However,":[21],"existing":[22,154],"deep-learning-based":[23],"industrial":[24],"defect":[25,141],"methods":[27],"commonly":[28],"rely":[29],"on":[30,137],"large-scale":[31],"datasets,":[32],"making":[33],"them":[34],"unsuitable":[35],"for":[36],"products":[38],"with":[39],"limited":[40,69],"defective":[41],"samples.":[42],"Aiming":[43],"at":[44],"filling":[45],"this":[46,48],"gap,":[47],"work":[49],"proposes":[50],"few-shot":[52,79],"learning-based":[53],"method":[55,150],"to":[56,84,103,120,152],"address":[57],"three":[58],"key":[59],"challenges":[60],"encountered":[61],"quality":[64],"inspection":[65],"products:":[68],"data,":[70],"scale":[71,97],"variance,":[72],"and":[73,130],"intraclass":[74,123],"variation.":[75],"First,":[76],"fine-tuning-based":[78],"learning":[80],"scheme":[81],"is":[82,101,117],"introduced":[83],"gain":[85],"knowledge":[86],"from":[87],"abundant":[89],"base":[90],"dataset":[91,142],"advance.":[93],"Subsequently,":[94],"an":[95],"enlarged":[96],"feature":[98],"pyramid":[99],"network":[100],"designed":[102],"cover":[104],"variant":[106],"size":[107],"defects.":[110],"Finally,":[111],"contrastive":[113],"proposal":[114],"memory":[115],"bank":[116],"put":[118],"forward":[119],"alleviate":[121],"variation":[124],"problem":[125],"caused":[126],"by":[127],"different":[128],"viewpoints":[129],"efficiently":[131],"utilize":[132],"similar":[133],"features.":[134],"Experimental":[135],"results":[136],"collected":[139],"demonstrate":[143],"superior":[145],"performance":[146],"our":[148],"proposed":[149],"compared":[151],"other":[153],"prevalent":[155],"methods.":[156]},"counts_by_year":[{"year":2026,"cited_by_count":6},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}