{"id":"https://openalex.org/W4399562810","doi":"https://doi.org/10.1109/tii.2024.3404053","title":"Purposive Data Augmentation Strategy and Lightweight Classification Model for Small Sample Industrial Defect Dataset","display_name":"Purposive Data Augmentation Strategy and Lightweight Classification Model for Small Sample Industrial Defect Dataset","publication_year":2024,"publication_date":"2024-06-12","ids":{"openalex":"https://openalex.org/W4399562810","doi":"https://doi.org/10.1109/tii.2024.3404053"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2024.3404053","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/tii.2024.3404053","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076848615","display_name":"Liyuan Lin","orcid":"https://orcid.org/0000-0003-2028-3346"},"institutions":[{"id":"https://openalex.org/I132369690","display_name":"Tianjin University of Science and Technology","ror":"https://ror.org/018rbtf37","country_code":"CN","type":"education","lineage":["https://openalex.org/I132369690"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Liyuan Lin","raw_affiliation_strings":["College of Electronic Information and Automation, Tianjin University of Science and Technology, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"College of Electronic Information and Automation, Tianjin University of Science and Technology, Tianjin, China","institution_ids":["https://openalex.org/I132369690"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101583764","display_name":"Shuxian Zhao","orcid":"https://orcid.org/0000-0003-3281-6795"},"institutions":[{"id":"https://openalex.org/I132369690","display_name":"Tianjin University of Science and Technology","ror":"https://ror.org/018rbtf37","country_code":"CN","type":"education","lineage":["https://openalex.org/I132369690"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuxian Zhao","raw_affiliation_strings":["College of Electronic Information and Automation, Tianjin University of Science and Technology, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"College of Electronic Information and Automation, Tianjin University of Science and Technology, Tianjin, China","institution_ids":["https://openalex.org/I132369690"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051194377","display_name":"Yiran Zhang","orcid":"https://orcid.org/0009-0006-2764-8511"},"institutions":[{"id":"https://openalex.org/I132369690","display_name":"Tianjin University of Science and Technology","ror":"https://ror.org/018rbtf37","country_code":"CN","type":"education","lineage":["https://openalex.org/I132369690"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yiran Zhang","raw_affiliation_strings":["College of Electronic Information and Automation, Tianjin University of Science and Technology, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"College of Electronic Information and Automation, Tianjin University of Science and Technology, Tianjin, China","institution_ids":["https://openalex.org/I132369690"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024958312","display_name":"Aolin Wen","orcid":"https://orcid.org/0009-0004-5623-0187"},"institutions":[{"id":"https://openalex.org/I132369690","display_name":"Tianjin University of Science and Technology","ror":"https://ror.org/018rbtf37","country_code":"CN","type":"education","lineage":["https://openalex.org/I132369690"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Aolin Wen","raw_affiliation_strings":["College of Electronic Information and Automation, Tianjin University of Science and Technology, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"College of Electronic Information and Automation, Tianjin University of Science and Technology, Tianjin, China","institution_ids":["https://openalex.org/I132369690"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021344002","display_name":"S. Zhang","orcid":"https://orcid.org/0000-0002-6473-0497"},"institutions":[{"id":"https://openalex.org/I132369690","display_name":"Tianjin University of Science and Technology","ror":"https://ror.org/018rbtf37","country_code":"CN","type":"education","lineage":["https://openalex.org/I132369690"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shun Zhang","raw_affiliation_strings":["College of Electronic Information and Automation, Tianjin University of Science and Technology, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"College of Electronic Information and Automation, Tianjin University of Science and Technology, Tianjin, China","institution_ids":["https://openalex.org/I132369690"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064612689","display_name":"Jingpeng Yan","orcid":"https://orcid.org/0009-0003-3043-4088"},"institutions":[{"id":"https://openalex.org/I132369690","display_name":"Tianjin University of Science and Technology","ror":"https://ror.org/018rbtf37","country_code":"CN","type":"education","lineage":["https://openalex.org/I132369690"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingpeng Yan","raw_affiliation_strings":["College of Electronic Information and Automation, Tianjin University of Science and Technology, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"College of Electronic Information and Automation, Tianjin University of Science and Technology, Tianjin, China","institution_ids":["https://openalex.org/I132369690"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091918055","display_name":"Ying Wang","orcid":"https://orcid.org/0000-0001-9797-8619"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ying Wang","raw_affiliation_strings":["Dawning Information Industry Company Ltd., Xiqing District, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Dawning Information Industry Company Ltd., Xiqing District, Tianjin, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067013431","display_name":"Yuan Zhou","orcid":"https://orcid.org/0000-0002-6072-337X"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuan Zhou","raw_affiliation_strings":["School of Electronic Information Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5076848615"],"corresponding_institution_ids":["https://openalex.org/I132369690"],"apc_list":null,"apc_paid":null,"fwci":1.3969,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.82566022,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":100},"biblio":{"volume":"20","issue":"9","first_page":"11475","last_page":"11484"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14319","display_name":"Currency Recognition and Detection","score":0.9623000025749207,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14339","display_name":"Image Processing and 3D Reconstruction","score":0.9362999796867371,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.6290950179100037},{"id":"https://openalex.org/keywords/data-modeling","display_name":"Data modeling","score":0.5410394072532654},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.509573221206665},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.508749783039093},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.39339685440063477},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3730388283729553},{"id":"https://openalex.org/keywords/database","display_name":"Database","score":0.14647266268730164}],"concepts":[{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.6290950179100037},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.5410394072532654},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.509573221206665},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.508749783039093},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.39339685440063477},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3730388283729553},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.14647266268730164},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tii.2024.3404053","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/tii.2024.3404053","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W2509065397","https://openalex.org/W2531409750","https://openalex.org/W2851801284","https://openalex.org/W2883780447","https://openalex.org/W2904851779","https://openalex.org/W2905065306","https://openalex.org/W2963163009","https://openalex.org/W2978742590","https://openalex.org/W2982083293","https://openalex.org/W2985783697","https://openalex.org/W3034720584","https://openalex.org/W3098357269","https://openalex.org/W3153037112","https://openalex.org/W3202962003","https://openalex.org/W4206047620","https://openalex.org/W4206821701","https://openalex.org/W4220914098","https://openalex.org/W4224213643","https://openalex.org/W4225358259","https://openalex.org/W4226093122","https://openalex.org/W4285154317","https://openalex.org/W4287671529","https://openalex.org/W4289752563","https://openalex.org/W4293704414","https://openalex.org/W4293732289","https://openalex.org/W4294310053","https://openalex.org/W4312804966","https://openalex.org/W4313530895","https://openalex.org/W6726497184","https://openalex.org/W6779093361","https://openalex.org/W6840720034"],"related_works":["https://openalex.org/W1185300216","https://openalex.org/W2954163146","https://openalex.org/W2899086345","https://openalex.org/W2896057011","https://openalex.org/W3188962172","https://openalex.org/W2772917594","https://openalex.org/W4238675884","https://openalex.org/W4306742369","https://openalex.org/W2033914206","https://openalex.org/W2042327336"],"abstract_inverted_index":{"Industrial":[0],"defect":[1],"detection":[2],"plays":[3],"a":[4,56,97],"critical":[5],"role":[6],"in":[7,19,33,113],"controlling":[8],"product":[9],"quality.":[10],"Obtaining":[11],"industrial":[12],"defects":[13],"with":[14,90,133],"diverse":[15],"and":[16,40,62,73,106,151],"balanced":[17],"classes":[18,32,89],"natural":[20],"environments":[21],"is":[22,44],"often":[23],"challenging.":[24],"Most":[25],"methods":[26],"tend":[27],"to":[28,78,83,115],"uniformly":[29],"augment":[30],"all":[31],"small-sample":[34],"datasets,":[35],"which":[36],"wastes":[37],"computing":[38],"resources":[39],"the":[41,50,71,74,85,130,141],"classification":[42,99,117,131,145],"performance":[43],"not":[45],"always":[46],"good.":[47],"To":[48],"achieve":[49],"purposive":[51],"data":[52,65,124],"augmentation,":[53],"we":[54,95],"propose":[55],"minority":[57],"class":[58,72],"imbalance":[59],"rate":[60],"(MiCIR)":[61],"an":[63],"MiCIR-based":[64],"augmentation":[66,125],"strategy":[67,126],"that":[68,122],"can":[69,127],"determine":[70],"number":[75],"of":[76,88],"samples":[77],"be":[79],"augmented.":[80],"In":[81],"addition,":[82],"address":[84],"misclassification":[86],"problem":[87],"relatively":[91],"large":[92],"sample":[93],"sizes,":[94],"introduce":[96],"lightweight":[98],"model,":[100],"ShcNet.":[101],"We":[102],"construct":[103],"convolution-batchnorm-hard-swish":[104],"(CBH)":[105],"convolution-batchnorm-hard-swish-convolutional":[107],"block":[108],"attention":[109],"mechanism":[110],"(CBHC)":[111],"modules":[112],"ShcNet":[114,139],"improve":[116,129],"performance.":[118],"Experimental":[119],"results":[120,132],"demonstrate":[121],"our":[123],"significantly":[128],"generalizability":[134],"across":[135],"different":[136],"datasets.":[137],"The":[138],"outperforms":[140],"baseline":[142],"models":[143],"on":[144],"accuracy":[146],"while":[147],"maintaining":[148],"fewer":[149],"parameters":[150],"model":[152],"complexity.":[153]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2024,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}