{"id":"https://openalex.org/W4396982416","doi":"https://doi.org/10.1109/tii.2024.3396554","title":"Disentanglement Learning With Adaptive Centroid Alignment for Multiple Target Domains Fault Diagnosis","display_name":"Disentanglement Learning With Adaptive Centroid Alignment for Multiple Target Domains Fault Diagnosis","publication_year":2024,"publication_date":"2024-05-16","ids":{"openalex":"https://openalex.org/W4396982416","doi":"https://doi.org/10.1109/tii.2024.3396554"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2024.3396554","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2024.3396554","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011595617","display_name":"Yu Gao","orcid":"https://orcid.org/0000-0002-0421-6787"},"institutions":[{"id":"https://openalex.org/I158809036","display_name":"Shenzhen Institute of Information Technology","ror":"https://ror.org/03wrf9427","country_code":"CN","type":"education","lineage":["https://openalex.org/I158809036"]},{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yu Gao","raw_affiliation_strings":["Department of Computer Science, Harbin Institute of Technology at Shenzhen, Shenzhen, China"],"raw_orcid":"https://orcid.org/0000-0002-0421-6787","affiliations":[{"raw_affiliation_string":"Department of Computer Science, Harbin Institute of Technology at Shenzhen, Shenzhen, China","institution_ids":["https://openalex.org/I158809036","https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026282538","display_name":"Xutao Zheng","orcid":"https://orcid.org/0009-0004-9747-0240"},"institutions":[{"id":"https://openalex.org/I158809036","display_name":"Shenzhen Institute of Information Technology","ror":"https://ror.org/03wrf9427","country_code":"CN","type":"education","lineage":["https://openalex.org/I158809036"]},{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xutao Zheng","raw_affiliation_strings":["Department of Computer Science, Harbin Institute of Technology at Shenzhen, Shenzhen, China"],"raw_orcid":"https://orcid.org/0009-0004-9747-0240","affiliations":[{"raw_affiliation_string":"Department of Computer Science, Harbin Institute of Technology at Shenzhen, Shenzhen, China","institution_ids":["https://openalex.org/I158809036","https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100753458","display_name":"Jinxing Li","orcid":"https://orcid.org/0000-0001-5156-0305"},"institutions":[{"id":"https://openalex.org/I158809036","display_name":"Shenzhen Institute of Information Technology","ror":"https://ror.org/03wrf9427","country_code":"CN","type":"education","lineage":["https://openalex.org/I158809036"]},{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinxing Li","raw_affiliation_strings":["Department of Computer Science, Harbin Institute of Technology at Shenzhen, Shenzhen, China"],"raw_orcid":"https://orcid.org/0000-0001-5156-0305","affiliations":[{"raw_affiliation_string":"Department of Computer Science, Harbin Institute of Technology at Shenzhen, Shenzhen, China","institution_ids":["https://openalex.org/I158809036","https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053946500","display_name":"Lijun Zong","orcid":null},"institutions":[{"id":"https://openalex.org/I17145004","display_name":"Northwestern Polytechnical University","ror":"https://ror.org/01y0j0j86","country_code":"CN","type":"education","lineage":["https://openalex.org/I17145004"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lijun Zong","raw_affiliation_strings":["Northwestern Polytechnical University, Xi'an, China"],"raw_orcid":"https://orcid.org/0000-0001-8977-179X","affiliations":[{"raw_affiliation_string":"Northwestern Polytechnical University, Xi'an, China","institution_ids":["https://openalex.org/I17145004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100609956","display_name":"Hongpeng Yin","orcid":"https://orcid.org/0000-0002-1404-1378"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongpeng Yin","raw_affiliation_strings":["Key Laboratory of Complex System Safety and Control, Ministry of Education, Chongqing University, Chongqing, China"],"raw_orcid":"https://orcid.org/0000-0002-1404-1378","affiliations":[{"raw_affiliation_string":"Key Laboratory of Complex System Safety and Control, Ministry of Education, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080535168","display_name":"Huafeng Li","orcid":"https://orcid.org/0000-0003-2462-6174"},"institutions":[{"id":"https://openalex.org/I10660446","display_name":"Kunming University of Science and Technology","ror":"https://ror.org/00xyeez13","country_code":"CN","type":"education","lineage":["https://openalex.org/I10660446"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huafeng Li","raw_affiliation_strings":["Faculty of Information Engineering and Automation, Kunming University of Science and Technology, Kunming, China"],"raw_orcid":"https://orcid.org/0000-0003-2462-6174","affiliations":[{"raw_affiliation_string":"Faculty of Information Engineering and Automation, Kunming University of Science and Technology, Kunming, China","institution_ids":["https://openalex.org/I10660446"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030843117","display_name":"Guangming Lu","orcid":"https://orcid.org/0000-0003-1578-2634"},"institutions":[{"id":"https://openalex.org/I158809036","display_name":"Shenzhen Institute of Information Technology","ror":"https://ror.org/03wrf9427","country_code":"CN","type":"education","lineage":["https://openalex.org/I158809036"]},{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guangming Lu","raw_affiliation_strings":["Department of Computer Science, Harbin Institute of Technology at Shenzhen, Shenzhen, China"],"raw_orcid":"https://orcid.org/0000-0003-1578-2634","affiliations":[{"raw_affiliation_string":"Department of Computer Science, Harbin Institute of Technology at Shenzhen, Shenzhen, China","institution_ids":["https://openalex.org/I158809036","https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5011595617"],"corresponding_institution_ids":["https://openalex.org/I158809036","https://openalex.org/I204983213"],"apc_list":null,"apc_paid":null,"fwci":2.2032,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.87811703,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":"20","issue":"9","first_page":"10779","last_page":"10790"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9912999868392944,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9912999868392944,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.988099992275238,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9879000186920166,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/centroid","display_name":"Centroid","score":0.7119273543357849},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6142333149909973},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5422992706298828},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4659695625305176},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4110379219055176},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3997111916542053},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.11946278810501099}],"concepts":[{"id":"https://openalex.org/C146599234","wikidata":"https://www.wikidata.org/wiki/Q511093","display_name":"Centroid","level":2,"score":0.7119273543357849},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6142333149909973},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5422992706298828},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4659695625305176},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4110379219055176},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3997111916542053},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.11946278810501099},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tii.2024.3396554","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2024.3396554","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/10","score":0.6100000143051147,"display_name":"Reduced inequalities"}],"awards":[{"id":"https://openalex.org/G5694134097","display_name":null,"funder_award_id":"JCYJ20210324132210025","funder_id":"https://openalex.org/F4320335803","funder_display_name":"Shenzhen Fundamental Research and Discipline Layout project"},{"id":"https://openalex.org/G5726720604","display_name":null,"funder_award_id":"62176077","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335803","display_name":"Shenzhen Fundamental Research and Discipline Layout project","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":43,"referenced_works":["https://openalex.org/W1565327149","https://openalex.org/W1731081199","https://openalex.org/W2165698076","https://openalex.org/W2187089797","https://openalex.org/W2520774990","https://openalex.org/W2530133016","https://openalex.org/W2556013418","https://openalex.org/W2584994008","https://openalex.org/W2763583057","https://openalex.org/W2768753204","https://openalex.org/W2798149494","https://openalex.org/W2898375427","https://openalex.org/W2951418342","https://openalex.org/W2964288524","https://openalex.org/W2969902687","https://openalex.org/W2991521245","https://openalex.org/W2993397516","https://openalex.org/W2998506103","https://openalex.org/W3025888249","https://openalex.org/W3041173183","https://openalex.org/W3043790829","https://openalex.org/W3083358932","https://openalex.org/W3090135004","https://openalex.org/W3110952705","https://openalex.org/W3127326105","https://openalex.org/W3134162419","https://openalex.org/W3171580342","https://openalex.org/W3200230256","https://openalex.org/W3212045841","https://openalex.org/W3214613446","https://openalex.org/W4206057957","https://openalex.org/W4211242271","https://openalex.org/W4225517134","https://openalex.org/W4283518205","https://openalex.org/W4313061949","https://openalex.org/W4317751798","https://openalex.org/W4385245566","https://openalex.org/W6633949838","https://openalex.org/W6744627333","https://openalex.org/W6748205129","https://openalex.org/W6750109254","https://openalex.org/W6752051073","https://openalex.org/W6798351829"],"related_works":["https://openalex.org/W2058170566","https://openalex.org/W2772917594","https://openalex.org/W2755342338","https://openalex.org/W2166024367","https://openalex.org/W3116076068","https://openalex.org/W2229312674","https://openalex.org/W2951359407","https://openalex.org/W2079911747","https://openalex.org/W1969923398","https://openalex.org/W2775347418"],"abstract_inverted_index":{"Most":[0],"current":[1],"domain":[2,43],"adaptation":[3,44,53],"methods":[4,45],"for":[5,49,74,77,88],"fault":[6,130],"diagnosis":[7],"focus":[8],"on":[9],"single":[10,41],"target":[11,20,38,42,51],"domain.":[12],"However,":[13],"test":[14],"data":[15],"often":[16],"comes":[17],"from":[18],"multiple":[19,50],"domains,":[21],"as":[22],"machines":[23],"work":[24],"under":[25],"different":[26,133],"operating":[27],"conditions,":[28],"subsequently":[29],"generating":[30],"a":[31,64],"more":[32],"complex":[33],"and":[34,82,90,94],"extensive":[35],"distribution":[36],"of":[37,127,148],"data.":[39],"Unfortunately,":[40],"are":[46,85,106,135],"not":[47],"adaptive":[48,69,118],"domains":[52,134],"(MTDA),":[54],"which":[55],"results":[56],"in":[57,132],"transfer":[58],"performance":[59],"degradation.":[60],"To":[61],"this":[62],"end,":[63],"novel":[65],"disentanglement":[66,78],"learning":[67],"with":[68,153],"centroid":[70,119],"alignment":[71,120],"is":[72],"proposed":[73,150],"MTDA.":[75],"Specifically":[76],"learning,":[79],"two":[80,83],"encoders":[81],"classifiers":[84],"constructed":[86],"independently":[87],"fault-related":[89,102],"domain-related":[91],"feature":[92,125],"extractions":[93],"classifications.":[95],"Followed":[96],"by":[97],"the":[98,111,124,128,146],"dual-adversarial":[99],"strategy,":[100,121],"only":[101],"but":[103],"domain-irrelevant":[104],"features":[105],"extracted.":[107],"Furthermore,":[108],"to":[109,137,140],"achieve":[110],"category":[112,131],"alignment,":[113],"we":[114],"also":[115],"propose":[116],"an":[117],"so":[122],"that":[123],"centroids":[126],"same":[129],"enforced":[136],"be":[138],"close":[139],"each":[141],"other.":[142],"Extensive":[143],"experiments":[144],"demonstrate":[145],"superiority":[147],"our":[149],"method":[151],"compared":[152],"other":[154],"popular":[155],"approaches.":[156]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":8}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}