{"id":"https://openalex.org/W4396597211","doi":"https://doi.org/10.1109/tii.2024.3383515","title":"Surface Defect 3-D Profile Reconstruction Using Eddy Current Pulsed Thermography","display_name":"Surface Defect 3-D Profile Reconstruction Using Eddy Current Pulsed Thermography","publication_year":2024,"publication_date":"2024-05-02","ids":{"openalex":"https://openalex.org/W4396597211","doi":"https://doi.org/10.1109/tii.2024.3383515"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2024.3383515","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2024.3383515","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048195638","display_name":"Xu Zhang","orcid":"https://orcid.org/0000-0003-4834-4163"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xu Zhang","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-4834-4163","affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063242124","display_name":"Libing Bai","orcid":"https://orcid.org/0000-0001-8906-0576"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Libing Bai","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0001-8906-0576","affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057634037","display_name":"Yiping Liang","orcid":"https://orcid.org/0000-0002-2664-4846"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yiping Liang","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-2664-4846","affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101496801","display_name":"Jin-sheng Yang","orcid":"https://orcid.org/0009-0007-1300-3349"},"institutions":[{"id":"https://openalex.org/I4210112595","display_name":"Research Institute of Petroleum Exploration and Development","ror":"https://ror.org/02awe6g05","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210112595","https://openalex.org/I98227222"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinsheng Yang","raw_affiliation_strings":["China Petroleum Pipeline Inspection Technologies Company Ltd., Langfang, China"],"raw_orcid":"https://orcid.org/0009-0007-1300-3349","affiliations":[{"raw_affiliation_string":"China Petroleum Pipeline Inspection Technologies Company Ltd., Langfang, China","institution_ids":["https://openalex.org/I4210112595"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003322267","display_name":"Jiangshan Ai","orcid":"https://orcid.org/0000-0001-6801-5442"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiangshan Ai","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0001-6801-5442","affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101526904","display_name":"Chao Ren","orcid":"https://orcid.org/0000-0002-2136-5477"},"institutions":[{"id":"https://openalex.org/I4210094459","display_name":"Craft Group (China)","ror":"https://ror.org/00gxm5663","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210094459"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chao Ren","raw_affiliation_strings":["Chengdu Aircraft Industry Company, Ltd., Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-2136-5477","affiliations":[{"raw_affiliation_string":"Chengdu Aircraft Industry Company, Ltd., Chengdu, China","institution_ids":["https://openalex.org/I4210094459"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.3051,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.76365246,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":"20","issue":"8","first_page":"10092","last_page":"10102"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/thermography","display_name":"Thermography","score":0.7642731070518494},{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.7593501806259155},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5246553421020508},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5069472789764404},{"id":"https://openalex.org/keywords/surface-reconstruction","display_name":"Surface reconstruction","score":0.4550001919269562},{"id":"https://openalex.org/keywords/eddy-current-testing","display_name":"Eddy-current testing","score":0.44826847314834595},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.41521143913269043},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2181316614151001},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17370980978012085},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14153718948364258},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13905081152915955},{"id":"https://openalex.org/keywords/infrared","display_name":"Infrared","score":0.0986003577709198}],"concepts":[{"id":"https://openalex.org/C2779222261","wikidata":"https://www.wikidata.org/wiki/Q624587","display_name":"Thermography","level":3,"score":0.7642731070518494},{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.7593501806259155},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5246553421020508},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5069472789764404},{"id":"https://openalex.org/C20885615","wikidata":"https://www.wikidata.org/wiki/Q825595","display_name":"Surface reconstruction","level":3,"score":0.4550001919269562},{"id":"https://openalex.org/C6441794","wikidata":"https://www.wikidata.org/wiki/Q1420867","display_name":"Eddy-current testing","level":3,"score":0.44826847314834595},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.41521143913269043},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2181316614151001},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17370980978012085},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14153718948364258},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13905081152915955},{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.0986003577709198},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tii.2024.3383515","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2024.3383515","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/11","display_name":"Sustainable cities and communities","score":0.6000000238418579}],"awards":[{"id":"https://openalex.org/G6076953923","display_name":null,"funder_award_id":"62003075","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6854158270","display_name":null,"funder_award_id":"U2030205","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1503716086","https://openalex.org/W2003444531","https://openalex.org/W2075297004","https://openalex.org/W2101239839","https://openalex.org/W2141002303","https://openalex.org/W2330243309","https://openalex.org/W2523654185","https://openalex.org/W2789945932","https://openalex.org/W2885486625","https://openalex.org/W2913535773","https://openalex.org/W2949691960","https://openalex.org/W2983603785","https://openalex.org/W2988714309","https://openalex.org/W3005368325","https://openalex.org/W3007656037","https://openalex.org/W3011445408","https://openalex.org/W3015707570","https://openalex.org/W3117095279","https://openalex.org/W3169324720","https://openalex.org/W3170356703","https://openalex.org/W4214650168","https://openalex.org/W4353098251","https://openalex.org/W4379117301"],"related_works":["https://openalex.org/W2744634501","https://openalex.org/W2085805524","https://openalex.org/W2003522138","https://openalex.org/W4296871629","https://openalex.org/W2551942315","https://openalex.org/W2333795440","https://openalex.org/W2325202533","https://openalex.org/W2029993380","https://openalex.org/W2535232420","https://openalex.org/W2084261063"],"abstract_inverted_index":{"Accurately":[0],"evaluating":[1],"the":[2,40,46,87,107,113,121],"3-D":[3,69,114],"profile":[4,70,115],"of":[5,31,86,91,116],"nonferromagnetic":[6],"metal":[7],"surface":[8,25,67],"defects":[9,117,126],"is":[10,79],"essential":[11],"for":[12,23,43],"nondestructive":[13],"evaluation.":[14],"Eddy":[15],"current":[16,76,93],"pulsed":[17],"thermography":[18],"(ECPT)":[19],"has":[20,54],"been":[21],"used":[22],"reconstructing":[24],"defects,":[26],"which":[27,57],"utilizes":[28],"multiphysics":[29],"coupling":[30],"electromagnetic":[32],"and":[33,53,61,95,127],"thermal":[34,41,47],"fields.":[35],"Previous":[36],"investigations":[37],"mainly":[38],"employ":[39],"field":[42,48,77],"reconstruction.":[44],"However,":[45],"varies":[49],"slowly":[50],"over":[51],"time":[52],"weak":[55],"correlation,":[56],"causes":[58],"serious":[59],"blur":[60],"noise.":[62],"In":[63],"this":[64],"article,":[65],"a":[66],"defect":[68],"reconstruction":[71],"method":[72,83,109],"based":[73],"on":[74],"eddy":[75,92],"distribution":[78],"proposed.":[80],"The":[81],"proposed":[82,108],"takes":[84],"advantage":[85],"strong":[88],"global":[89],"correlation":[90],"fields":[94],"proposes":[96],"an":[97],"inversion":[98],"technique":[99],"to":[100],"reconstruct":[101,112],"defects.":[102],"Experimental":[103],"results":[104],"demonstrate":[105],"that":[106],"can":[110],"effectively":[111],"with":[118],"depths":[119],"within":[120],"skin":[122],"depth,":[123],"including":[124],"complex-shaped":[125],"natural":[128],"cracks.":[129]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":6}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}