{"id":"https://openalex.org/W4375793444","doi":"https://doi.org/10.1109/tii.2023.3272668","title":"System-Level Performance Degradation Prediction for Power Converters Based on SSA\u2013Elman NN and Empirical Knowledge","display_name":"System-Level Performance Degradation Prediction for Power Converters Based on SSA\u2013Elman NN and Empirical Knowledge","publication_year":2023,"publication_date":"2023-05-05","ids":{"openalex":"https://openalex.org/W4375793444","doi":"https://doi.org/10.1109/tii.2023.3272668"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2023.3272668","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2023.3272668","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049965078","display_name":"Ying Zeng","orcid":"https://orcid.org/0000-0003-4162-6387"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Ying Zeng","raw_affiliation_strings":["University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109829615","display_name":"Tudi Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tudi Huang","raw_affiliation_strings":["University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115594999","display_name":"T. Zhang","orcid":"https://orcid.org/0000-0001-7729-085X"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tingyu Zhang","raw_affiliation_strings":["University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069596116","display_name":"Hong\u2010Zhong Huang","orcid":"https://orcid.org/0000-0003-4478-8349"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hong-Zhong Huang","raw_affiliation_strings":["University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-4478-8349","affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5049965078"],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":null,"apc_paid":null,"fwci":9.0026,"has_fulltext":false,"cited_by_count":46,"citation_normalized_percentile":{"value":0.98860886,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":"20","issue":"2","first_page":"1240","last_page":"1250"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.7950365543365479},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.6562367081642151},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5042828321456909},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49875736236572266},{"id":"https://openalex.org/keywords/empirical-research","display_name":"Empirical research","score":0.41886916756629944},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.34424471855163574},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3313952386379242},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16934993863105774},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.13787376880645752},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10967794060707092},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08486047387123108}],"concepts":[{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.7950365543365479},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.6562367081642151},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5042828321456909},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49875736236572266},{"id":"https://openalex.org/C120936955","wikidata":"https://www.wikidata.org/wiki/Q2155640","display_name":"Empirical research","level":2,"score":0.41886916756629944},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.34424471855163574},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3313952386379242},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16934993863105774},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.13787376880645752},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10967794060707092},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08486047387123108},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tii.2023.3272668","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2023.3272668","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4210022717","display_name":null,"funder_award_id":"202206070083","funder_id":"https://openalex.org/F4320322725","funder_display_name":"China Scholarship Council"}],"funders":[{"id":"https://openalex.org/F4320322725","display_name":"China Scholarship Council","ror":"https://ror.org/04atp4p48"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1528424231","https://openalex.org/W1982574138","https://openalex.org/W2076985849","https://openalex.org/W2084004025","https://openalex.org/W2108769879","https://openalex.org/W2126704684","https://openalex.org/W2155832827","https://openalex.org/W2245542160","https://openalex.org/W2277328489","https://openalex.org/W2280819451","https://openalex.org/W2310620816","https://openalex.org/W2343133302","https://openalex.org/W2434283531","https://openalex.org/W2587187701","https://openalex.org/W2597731148","https://openalex.org/W2790206624","https://openalex.org/W2887207409","https://openalex.org/W2895836916","https://openalex.org/W2972441644","https://openalex.org/W2998553334","https://openalex.org/W3037030285","https://openalex.org/W3085337480","https://openalex.org/W3111241302","https://openalex.org/W3149230469","https://openalex.org/W3180510816","https://openalex.org/W4205237702","https://openalex.org/W4221056852","https://openalex.org/W4281629433","https://openalex.org/W4289515705","https://openalex.org/W4313419220","https://openalex.org/W6698198417"],"related_works":["https://openalex.org/W631083485","https://openalex.org/W4313452936","https://openalex.org/W2097026685","https://openalex.org/W2480068220","https://openalex.org/W2070883797","https://openalex.org/W4386859288","https://openalex.org/W2102542442","https://openalex.org/W1986220761","https://openalex.org/W2042495646","https://openalex.org/W2047506301"],"abstract_inverted_index":{"The":[0],"degradation":[1,114,133,195],"of":[2,8,13,19,39,85,98,121,134,157,196],"power":[3,20,113,136,159],"converter":[4,25,160,203],"performance":[5,48,71],"is":[6,74,148,177],"one":[7],"the":[9,17,37,83,96,119,132,135,152,158,163,171,184,188,194,197],"most":[10,153],"critical":[11,154],"issues":[12],"complex":[14],"system":[15,198],"with":[16,95],"improvement":[18],"capacity":[21],"and":[22,29,41,101,127,142],"density.":[23],"Power":[24],"bears":[26],"severe":[27],"electrical":[28],"thermal":[30],"stress,":[31],"resulting":[32],"in":[33,36,105,124],"an":[34,205],"increase":[35],"probability":[38],"failure":[40],"significant":[42],"economic":[43],"losses.":[44],"Most":[45],"research":[46],"addresses":[47],"evaluation":[49],"either":[50],"through":[51,58],"reliability":[52],"theory":[53],"without":[54],"physical":[55],"understanding":[56],"or":[57],"data-driven":[59],"methods":[60],"requiring":[61],"high":[62],"experimental":[63],"cost.":[64],"Few":[65],"studies":[66],"focus":[67],"on":[68,89,170],"predicting":[69,115],"system-level":[70,112],"degradation,":[72],"which":[73,117],"technically":[75],"difficult":[76],"as":[77,204],"many":[78],"components":[79,87],"degrade":[80],"randomly.":[81],"Identifying":[82],"parameters":[84,156],"electronic":[86],"based":[88,169],"sensor":[90],"data":[91],"has":[92],"become":[93],"possible":[94],"development":[97],"neural":[99,122,164,175],"networks":[100,123],"computational":[102],"power.":[103],"Therefore,":[104],"this":[106],"article,":[107],"we":[108],"propose":[109],"a":[110,140,201],"novel":[111],"framework,":[116],"combines":[118],"advantages":[120],"nonlinear":[125],"fitting":[126],"empirical":[128],"knowledge":[129],"to":[130,150,179],"predict":[131,193],"converter.":[137],"In":[138],"addition,":[139],"comprehensive":[141],"improved":[143],"feature":[144,155],"parameter":[145,166],"screening":[146],"method":[147,168,190],"proposed":[149,189],"identify":[151],"systems.":[161],"Furthermore,":[162],"network":[165,176],"identification":[167],"sparrow":[172],"search":[173],"algorithm\u2013Elman":[174],"introduced":[178],"improve":[180],"prediction":[181],"accuracy.":[182],"Finally,":[183],"result":[185],"shows":[186],"that":[187],"can":[191],"accurately":[192],"by":[199],"using":[200],"DC\u2013DC":[202],"example.":[206]},"counts_by_year":[{"year":2026,"cited_by_count":11},{"year":2025,"cited_by_count":13},{"year":2024,"cited_by_count":22}],"updated_date":"2026-05-05T08:41:31.759640","created_date":"2025-10-10T00:00:00"}