{"id":"https://openalex.org/W3209195797","doi":"https://doi.org/10.1109/tii.2021.3123060","title":"An Integrated Approach for Bearing Health Indicator and Stage Division Using Improved Gaussian Mixture Model and Confidence Value","display_name":"An Integrated Approach for Bearing Health Indicator and Stage Division Using Improved Gaussian Mixture Model and Confidence Value","publication_year":2021,"publication_date":"2021-10-27","ids":{"openalex":"https://openalex.org/W3209195797","doi":"https://doi.org/10.1109/tii.2021.3123060","mag":"3209195797"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2021.3123060","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2021.3123060","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079314253","display_name":"Mao He","orcid":"https://orcid.org/0000-0002-0831-8764"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Mao He","raw_affiliation_strings":["School of Mechanical and Electrical Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-0831-8764","affiliations":[{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068541324","display_name":"Wei Guo","orcid":"https://orcid.org/0000-0001-8360-179X"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Guo","raw_affiliation_strings":["School of Mechanical and Electrical Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0001-8360-179X","affiliations":[{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5079314253"],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":null,"apc_paid":null,"fwci":3.3302,"has_fulltext":false,"cited_by_count":36,"citation_normalized_percentile":{"value":0.92522248,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"18","issue":"8","first_page":"5219","last_page":"5230"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9894999861717224,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13213","display_name":"Mechanical Failure Analysis and Simulation","score":0.9837999939918518,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hellinger-distance","display_name":"Hellinger distance","score":0.732539713382721},{"id":"https://openalex.org/keywords/bearing","display_name":"Bearing (navigation)","score":0.6786338090896606},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.5500603318214417},{"id":"https://openalex.org/keywords/gaussian","display_name":"Gaussian","score":0.5310056209564209},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.49216169118881226},{"id":"https://openalex.org/keywords/mixture-model","display_name":"Mixture model","score":0.49085623025894165},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4734204411506653},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4448857605457306},{"id":"https://openalex.org/keywords/condition-monitoring","display_name":"Condition monitoring","score":0.423151433467865},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.4067322015762329},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.39978647232055664},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.34269052743911743},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2838976979255676}],"concepts":[{"id":"https://openalex.org/C153024298","wikidata":"https://www.wikidata.org/wiki/Q3030678","display_name":"Hellinger distance","level":2,"score":0.732539713382721},{"id":"https://openalex.org/C199978012","wikidata":"https://www.wikidata.org/wiki/Q1273815","display_name":"Bearing (navigation)","level":2,"score":0.6786338090896606},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.5500603318214417},{"id":"https://openalex.org/C163716315","wikidata":"https://www.wikidata.org/wiki/Q901177","display_name":"Gaussian","level":2,"score":0.5310056209564209},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.49216169118881226},{"id":"https://openalex.org/C61224824","wikidata":"https://www.wikidata.org/wiki/Q2260434","display_name":"Mixture model","level":2,"score":0.49085623025894165},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4734204411506653},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4448857605457306},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.423151433467865},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.4067322015762329},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.39978647232055664},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.34269052743911743},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2838976979255676},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tii.2021.3123060","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2021.3123060","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4769290947","display_name":null,"funder_award_id":"61833002","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":51,"referenced_works":["https://openalex.org/W1594453127","https://openalex.org/W1973665104","https://openalex.org/W1980817237","https://openalex.org/W2005523062","https://openalex.org/W2019505419","https://openalex.org/W2050620380","https://openalex.org/W2098318489","https://openalex.org/W2158042553","https://openalex.org/W2168175751","https://openalex.org/W2183813559","https://openalex.org/W2319025975","https://openalex.org/W2341042348","https://openalex.org/W2463813940","https://openalex.org/W2482002491","https://openalex.org/W2530133016","https://openalex.org/W2549489119","https://openalex.org/W2587865582","https://openalex.org/W2591055632","https://openalex.org/W2601564332","https://openalex.org/W2737617578","https://openalex.org/W2741730792","https://openalex.org/W2741768983","https://openalex.org/W2760637973","https://openalex.org/W2768148617","https://openalex.org/W2773549135","https://openalex.org/W2790565135","https://openalex.org/W2791384746","https://openalex.org/W2809925894","https://openalex.org/W2810586164","https://openalex.org/W2914488306","https://openalex.org/W2925250349","https://openalex.org/W2945803074","https://openalex.org/W2958041981","https://openalex.org/W2971114125","https://openalex.org/W2976697886","https://openalex.org/W2983199727","https://openalex.org/W2997701990","https://openalex.org/W2997825250","https://openalex.org/W3001004371","https://openalex.org/W3002064451","https://openalex.org/W3011785067","https://openalex.org/W3017805480","https://openalex.org/W3032286497","https://openalex.org/W3032983473","https://openalex.org/W3049468927","https://openalex.org/W3090370846","https://openalex.org/W3092601199","https://openalex.org/W3138771845","https://openalex.org/W6635771633","https://openalex.org/W6675747103","https://openalex.org/W6728255800"],"related_works":["https://openalex.org/W2050620380","https://openalex.org/W1977834563","https://openalex.org/W1979265735","https://openalex.org/W4390831585","https://openalex.org/W2057424919","https://openalex.org/W2335478004","https://openalex.org/W4323520306","https://openalex.org/W1578916557","https://openalex.org/W2064011721","https://openalex.org/W2142557486"],"abstract_inverted_index":{"Bearing":[0],"prognosis":[1],"is":[2,46,63],"of":[3,56,107,110,129,151,182,198],"paramount":[4],"and":[5,84,98,116,132,146,170,173,201],"practical":[6],"importance":[7],"for":[8,19,158,211],"rotating":[9],"machinery.":[10],"In":[11,40],"this":[12,41],"article,":[13],"we":[14,25,72],"propose":[15,26],"an":[16,27],"integrated":[17],"approach":[18],"bearing":[20,68,123,154],"performance":[21,69],"degradation":[22,200],"assessment.":[23],"First,":[24],"improved":[28,85],"clustering":[29],"algorithm,":[30],"called":[31],"the":[32,43,50,81,90,95,105,108,113,122,130,137,161,176,180,183,191,196],"Hellinger":[33,44],"distance-based":[34],"regularized":[35,61],"Gaussian":[36],"mixture":[37],"model":[38],"(HRGMM).":[39],"model,":[42],"distance":[45],"incorporated":[47],"to":[48,66,88,103,112],"measure":[49],"similarity":[51],"between":[52,94],"probability":[53],"distributions":[54],"(PDs)":[55],"raw":[57],"data.":[58],"The":[59,149],"manifold":[60],"GMM":[62],"then":[64],"enhanced":[65],"differentiate":[67],"changes.":[70],"Second,":[71],"construct":[73],"a":[74,168],"new":[75],"health":[76,142],"indicator":[77],"(HI)":[78],"that":[79,136,205],"combines":[80],"Jensen\u2013R\u00e9nyi":[82],"divergence":[83],"confidence":[86],"value":[87],"normalize":[89],"difference":[91],"in":[92,167],"PDs":[93],"test":[96],"condition":[97],"healthy":[99],"condition.":[100],"It":[101],"aims":[102],"solve":[104],"problems":[106],"insensitivity":[109],"HI":[111,162],"incipient":[114,177],"defect":[115,178],"its":[117],"highly":[118],"fluctuating":[119],"behavior":[120],"as":[121,179,195],"deteriorates":[124],"over":[125],"time.":[126],"Clustering":[127],"results":[128,150],"experimental":[131],"real":[133],"bearings":[134],"show":[135],"HRGMM":[138,165],"successfully":[139],"distinguishes":[140],"different":[141],"states,":[143],"damage":[144],"severities,":[145],"working":[147],"conditions.":[148],"two":[152],"run-to-failure":[153],"tests":[155],"demonstrate":[156],"that,":[157],"each":[159],"bearing,":[160],"based":[163],"on":[164],"drops":[166],"smooth":[169],"monotonic":[171],"manner":[172],"accurately":[174],"identify":[175],"beginning":[181,197],"slight":[184],"degradation.":[185],"Moreover,":[186],"it":[187],"can":[188,208],"automatically":[189],"mark":[190],"sharp":[192],"state":[193],"declines":[194],"severe":[199],"failure":[202],"stages":[203],"so":[204],"appropriate":[206],"warnings":[207],"be":[209],"set":[210],"follow-up":[212],"maintenance.":[213]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":10},{"year":2023,"cited_by_count":11},{"year":2022,"cited_by_count":3}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}