{"id":"https://openalex.org/W4312499228","doi":"https://doi.org/10.1109/tii.2021.3120975","title":"Diagnostic of Combined Mechanical and Electrical Faults in ASD-Powered Induction Motor Using MODWT and a Lightweight 1-D CNN","display_name":"Diagnostic of Combined Mechanical and Electrical Faults in ASD-Powered Induction Motor Using MODWT and a Lightweight 1-D CNN","publication_year":2021,"publication_date":"2021-10-20","ids":{"openalex":"https://openalex.org/W4312499228","doi":"https://doi.org/10.1109/tii.2021.3120975"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2021.3120975","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2021.3120975","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088130455","display_name":"Magdiel Jim\u00e9nez-Guarneros","orcid":"https://orcid.org/0000-0001-9675-7494"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Magdiel Jimenez-Guarneros","raw_affiliation_strings":["Computer Department in the Digital Systems Group, Instituto Nacional de Astrofísica Óptica y Electrónica, Puebla, México"],"raw_orcid":"https://orcid.org/0000-0001-9675-7494","affiliations":[{"raw_affiliation_string":"Computer Department in the Digital Systems Group, Instituto Nacional de Astrofísica Óptica y Electrónica, Puebla, México","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071879049","display_name":"Carlos Morales-Perez","orcid":"https://orcid.org/0000-0003-2378-7021"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Carlos Morales-Perez","raw_affiliation_strings":["Electronics Department in the Digital Systems Group, Instituto Nacional de Astrofísica Óptica y Electrónica, Puebla, México"],"raw_orcid":"https://orcid.org/0000-0003-2378-7021","affiliations":[{"raw_affiliation_string":"Electronics Department in the Digital Systems Group, Instituto Nacional de Astrofísica Óptica y Electrónica, Puebla, México","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010423760","display_name":"Jose Rangel\u2010Magdaleno","orcid":"https://orcid.org/0000-0003-2785-5060"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Jose de Jesus Rangel-Magdaleno","raw_affiliation_strings":["Electronics Department in the Digital Systems Group, Instituto Nacional de Astrofísica Óptica y Electrónica, Puebla, México"],"raw_orcid":"https://orcid.org/0000-0003-2785-5060","affiliations":[{"raw_affiliation_string":"Electronics Department in the Digital Systems Group, Instituto Nacional de Astrofísica Óptica y Electrónica, Puebla, México","institution_ids":["https://openalex.org/I39824353"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I39824353"],"apc_list":null,"apc_paid":null,"fwci":5.5436,"has_fulltext":false,"cited_by_count":66,"citation_normalized_percentile":{"value":0.96818715,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":100},"biblio":{"volume":"18","issue":"7","first_page":"4688","last_page":"4697"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11062","display_name":"Gear and Bearing Dynamics Analysis","score":0.9861000180244446,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9776999950408936,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/induction-motor","display_name":"Induction motor","score":0.5739351511001587},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5062510371208191},{"id":"https://openalex.org/keywords/discrete-wavelet-transform","display_name":"Discrete wavelet transform","score":0.5017962455749512},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4971213638782501},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.48335808515548706},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.47491464018821716},{"id":"https://openalex.org/keywords/raceway","display_name":"Raceway","score":0.4695737063884735},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.43057310581207275},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.42432695627212524},{"id":"https://openalex.org/keywords/condition-monitoring","display_name":"Condition monitoring","score":0.4167134165763855},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.41539251804351807},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.40231919288635254},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3761723041534424},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.28081029653549194},{"id":"https://openalex.org/keywords/actuator","display_name":"Actuator","score":0.2261551320552826},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1949077844619751},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.10090237855911255}],"concepts":[{"id":"https://openalex.org/C80962145","wikidata":"https://www.wikidata.org/wiki/Q207450","display_name":"Induction motor","level":3,"score":0.5739351511001587},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5062510371208191},{"id":"https://openalex.org/C46286280","wikidata":"https://www.wikidata.org/wiki/Q2414958","display_name":"Discrete wavelet transform","level":4,"score":0.5017962455749512},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4971213638782501},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.48335808515548706},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.47491464018821716},{"id":"https://openalex.org/C184547230","wikidata":"https://www.wikidata.org/wiki/Q7279041","display_name":"Raceway","level":3,"score":0.4695737063884735},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.43057310581207275},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.42432695627212524},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.4167134165763855},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.41539251804351807},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.40231919288635254},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3761723041534424},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.28081029653549194},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.2261551320552826},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1949077844619751},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.10090237855911255},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C184608416","wikidata":"https://www.wikidata.org/wiki/Q1455803","display_name":"Lubrication","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tii.2021.3120975","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2021.3120975","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.5}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W2594265129","https://openalex.org/W2754517723","https://openalex.org/W2783819238","https://openalex.org/W2792098970","https://openalex.org/W2795219550","https://openalex.org/W2795853800","https://openalex.org/W2897806180","https://openalex.org/W2913289332","https://openalex.org/W2922718228","https://openalex.org/W2945244602","https://openalex.org/W2963838685","https://openalex.org/W2963840672","https://openalex.org/W2966507006","https://openalex.org/W2972787034","https://openalex.org/W2977961330","https://openalex.org/W2979835927","https://openalex.org/W2994887188","https://openalex.org/W3010344032","https://openalex.org/W3012005617","https://openalex.org/W3022382095","https://openalex.org/W3027122607","https://openalex.org/W3038308151","https://openalex.org/W3038822438","https://openalex.org/W3045546070","https://openalex.org/W3093076841","https://openalex.org/W3094501577","https://openalex.org/W3096151625","https://openalex.org/W3113008830","https://openalex.org/W3113081890","https://openalex.org/W3134097116","https://openalex.org/W3135227734","https://openalex.org/W3156954244","https://openalex.org/W6696085341","https://openalex.org/W6784325746"],"related_works":["https://openalex.org/W2922026997","https://openalex.org/W2392932925","https://openalex.org/W2373777182","https://openalex.org/W2794215202","https://openalex.org/W2393887945","https://openalex.org/W2516154279","https://openalex.org/W2036218083","https://openalex.org/W1980179937","https://openalex.org/W2902511954","https://openalex.org/W2786447778"],"abstract_inverted_index":{"The":[0,121,137,164],"early":[1],"fault":[2],"detection":[3],"in":[4,16,24,49,83,94],"the":[5,37,44,108],"rotary":[6],"electrical":[7,89],"machines,such":[8],"as":[9],"induction":[10],"motors":[11],"(IMs),":[12],"has":[13],"been":[14,21],"growing":[15],"modern":[17],"industry.":[18],"IMs":[19,41,133],"have":[20],"widely":[22],"used":[23],"industrial":[25],"applications":[26],"due":[27],"to":[28,51,85],"its":[29],"easy":[30],"installation,":[31],"reliability,":[32],"and":[33,55,74,88,91,102,116,157],"low":[34],"cost.":[35],"However,":[36],"increasing":[38],"usage":[39],"of":[40,132,134,172],"also":[42],"increases":[43],"need":[45],"for":[46],"timely":[47],"maintenance":[48],"order":[50,84],"ensure":[52],"their":[53,92],"operation":[54],"a":[56,63,75,147,151],"longer":[57],"service":[58],"life.":[59],"This":[60],"article":[61],"proposes":[62],"new":[64],"diagnosis":[65],"methodology":[66,167],"based":[67],"on":[68],"maximal":[69],"overlap":[70],"discrete":[71],"wavelet":[72],"transform":[73],"lightweight":[76],"1-D":[77],"convolutional":[78],"neural":[79],"network":[80],"(CNN)":[81],"architecture,":[82],"detect":[86],"mechanical":[87],"faults":[90,104],"combination,":[93],"adjustable":[95],"speed":[96],"drive":[97],"(ASD)-powered":[98],"IMs.":[99],"Specifically,":[100],"single":[101],"combined":[103],"were":[105],"studied":[106],"from":[107,130],"next:":[109],"Outer":[110],"raceway":[111],"bearing":[112],"(mechanical),":[113],"turn-to-turn":[114],"short-circuit,":[115],"phase-to-ground":[117],"short":[118],"circuit":[119],"(electrical).":[120],"presented":[122],"study":[123],"was":[124],"developed":[125],"using":[126],"current":[127,138],"signals":[128,139],"acquired":[129],"stators":[131],"1":[135],"hp.":[136],"are":[140],"measured":[141],"at":[142,154,160],"powered":[143],"conditions":[144],"introduced":[145],"by":[146],"power":[148],"grid":[149],"with":[150],"constant":[152],"frequency":[153],"60":[155],"Hz,":[156],"an":[158],"ASD":[159],"three":[161],"different":[162],"frequencies.":[163],"proposed":[165],"diagnostic":[166],"reaches":[168],"more":[169],"than":[170],"99%":[171],"accuracy.":[173]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":11},{"year":2024,"cited_by_count":21},{"year":2023,"cited_by_count":23},{"year":2022,"cited_by_count":7}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}