{"id":"https://openalex.org/W3168099128","doi":"https://doi.org/10.1109/tii.2021.3089333","title":"Development of a Physics-Informed Doubly Fed Cross-Residual Deep Neural Network for High-Precision Magnetic Flux Leakage Defect Size Estimation","display_name":"Development of a Physics-Informed Doubly Fed Cross-Residual Deep Neural Network for High-Precision Magnetic Flux Leakage Defect Size Estimation","publication_year":2021,"publication_date":"2021-06-15","ids":{"openalex":"https://openalex.org/W3168099128","doi":"https://doi.org/10.1109/tii.2021.3089333","mag":"3168099128"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2021.3089333","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tii.2021.3089333","pdf_url":"https://ieeexplore.ieee.org/ielx7/9424/9640533/09456074.pdf","source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://ieeexplore.ieee.org/ielx7/9424/9640533/09456074.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015027530","display_name":"Hongyu Sun","orcid":null},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongyu Sun","raw_affiliation_strings":["State Key Laboratory of Power System, Department of Electrical Engineering, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-0712-6389","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power System, Department of Electrical Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017470096","display_name":"Lisha Peng","orcid":"https://orcid.org/0000-0002-7315-2692"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lisha Peng","raw_affiliation_strings":["State Key Laboratory of Power System, Department of Electrical Engineering, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-7315-2692","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power System, Department of Electrical Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100432868","display_name":"Songling Huang","orcid":"https://orcid.org/0000-0003-4442-2566"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Songling Huang","raw_affiliation_strings":["State Key Laboratory of Power System, Department of Electrical Engineering, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-4442-2566","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power System, Department of Electrical Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005461275","display_name":"Shisong Li","orcid":"https://orcid.org/0000-0002-2509-5523"},"institutions":[{"id":"https://openalex.org/I190082696","display_name":"Durham University","ror":"https://ror.org/01v29qb04","country_code":"GB","type":"education","lineage":["https://openalex.org/I190082696"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Shisong Li","raw_affiliation_strings":["Department of Engineering, Durham University, Durham, U.K"],"raw_orcid":"https://orcid.org/0000-0002-2509-5523","affiliations":[{"raw_affiliation_string":"Department of Engineering, Durham University, Durham, U.K","institution_ids":["https://openalex.org/I190082696"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017881522","display_name":"Yue Long","orcid":"https://orcid.org/0000-0003-4577-5005"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yue Long","raw_affiliation_strings":["State Key Laboratory of Power System, Department of Electrical Engineering, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-4577-5005","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power System, Department of Electrical Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100377060","display_name":"Shen Wang","orcid":"https://orcid.org/0000-0001-5140-648X"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shen Wang","raw_affiliation_strings":["State Key Laboratory of Power System, Department of Electrical Engineering, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-5140-648X","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power System, Department of Electrical Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009949085","display_name":"Wei Zhao","orcid":"https://orcid.org/0000-0002-3679-6165"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Zhao","raw_affiliation_strings":["State Key Laboratory of Power System, Department of Electrical Engineering, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-3679-6165","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power System, Department of Electrical Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":6.0893,"has_fulltext":false,"cited_by_count":100,"citation_normalized_percentile":{"value":0.97472339,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"18","issue":"3","first_page":"1629","last_page":"1640"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.7212873697280884},{"id":"https://openalex.org/keywords/magnetic-flux-leakage","display_name":"Magnetic flux leakage","score":0.7187018394470215},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.7179309129714966},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.6191785335540771},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5955065488815308},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4834659695625305},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.431466281414032},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.39520302414894104},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.38274261355400085},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.32724741101264954},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.28377366065979004},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.27465111017227173}],"concepts":[{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.7212873697280884},{"id":"https://openalex.org/C20892748","wikidata":"https://www.wikidata.org/wiki/Q4390394","display_name":"Magnetic flux leakage","level":3,"score":0.7187018394470215},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.7179309129714966},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.6191785335540771},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5955065488815308},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4834659695625305},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.431466281414032},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.39520302414894104},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.38274261355400085},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.32724741101264954},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.28377366065979004},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.27465111017227173},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tii.2021.3089333","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tii.2021.3089333","pdf_url":"https://ieeexplore.ieee.org/ielx7/9424/9640533/09456074.pdf","source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/tii.2021.3089333","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tii.2021.3089333","pdf_url":"https://ieeexplore.ieee.org/ielx7/9424/9640533/09456074.pdf","source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5345289355","display_name":null,"funder_award_id":"52007088","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8211610869","display_name":null,"funder_award_id":"52077110","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1522301498","https://openalex.org/W1836465849","https://openalex.org/W1976692507","https://openalex.org/W2011382171","https://openalex.org/W2029628882","https://openalex.org/W2058441197","https://openalex.org/W2084134149","https://openalex.org/W2117731089","https://openalex.org/W2132603731","https://openalex.org/W2136922672","https://openalex.org/W2154579312","https://openalex.org/W2156387975","https://openalex.org/W2194775991","https://openalex.org/W2335182503","https://openalex.org/W2593809585","https://openalex.org/W2765793020","https://openalex.org/W2799857777","https://openalex.org/W2803086989","https://openalex.org/W2883020893","https://openalex.org/W2899691698","https://openalex.org/W2919115771","https://openalex.org/W2938692364","https://openalex.org/W2971101093","https://openalex.org/W2975180125","https://openalex.org/W2990660750","https://openalex.org/W2998320282","https://openalex.org/W3000865062","https://openalex.org/W3004840885","https://openalex.org/W3024295828","https://openalex.org/W3038309809","https://openalex.org/W6631190155","https://openalex.org/W6682889407","https://openalex.org/W6773174915"],"related_works":["https://openalex.org/W4380075502","https://openalex.org/W4223943233","https://openalex.org/W4312200629","https://openalex.org/W4360585206","https://openalex.org/W4364306694","https://openalex.org/W2358586775","https://openalex.org/W4380086463","https://openalex.org/W4225161397","https://openalex.org/W3014300295","https://openalex.org/W3164822677"],"abstract_inverted_index":{"Defect":[0],"depth":[1,19,168,229],"is":[2,128],"an":[3],"essential":[4],"indicator":[5],"in":[6,40,81,143,192,213],"magnetic":[7,189],"flux":[8],"leakage":[9],"(MFL)":[10],"detection":[11,118],"and":[12,25,28,52,79,95,130,146,167,184,202,219,227,246,259],"estimation.":[13],"The":[14,153,208],"quantification":[15,47,83,126,162,206,221,230,252,264],"errors":[16,84,222,231],"for":[17,115],"defect":[18,41,46,86,117,125,164,171,199,217,228,251],"are":[20],"closely":[21],"related":[22],"to":[23,35,93,197,223,232],"length":[24,218],"width":[26,220],"errors,":[27],"this":[29,91,214],"feature":[30],"has":[31],"always":[32],"been":[33],"used":[34],"support":[36,75],"the":[37,44,64,74,97,136,186,205],"operator's":[38],"judgment":[39],"identification.":[42],"However,":[43],"existing":[45],"algorithms":[48],"based":[49,119],"on":[50,120],"shallow":[51],"deep":[53,102,121,149,209],"neural":[54,103,137],"networks":[55],"only":[56],"employed":[57],"simple":[58],"general":[59],"network":[60,71,112,138,182,244],"structures":[61,72,245],"inspired":[62],"by":[63,254],"field":[65],"of":[66,76,151,163,194,257],"artificial":[67],"intelligence;":[68],"consequently,":[69],"these":[70],"lack":[73],"physical":[77],"concepts":[78],"result":[80],"large":[82],"regarding":[85],"size,":[87],"especially":[88,170],"depth.":[89,172],"In":[90,239],"article,":[92],"describe":[94],"integrate":[96],"above":[98],"theory":[99,127],"into":[100,132],"a":[101,107,262],"network,":[104],"we":[105],"propose":[106],"physics-informed":[108],"doubly":[109],"fed":[110],"cross-residual":[111],"(DfedResNet)":[113],"suitable":[114],"MFL":[116,124,144],"learning.":[122],"Physics-based":[123],"studied":[129],"integrated":[131],"loss":[133,201],"functions":[134],"during":[135,181],"training.":[139],"DfedResNet":[140,210,249],"quantifies":[141],"defects":[142],"data":[145,176,191],"automatically":[147],"extracts":[148],"features":[150],"defects.":[152],"experimental":[154],"results":[155],"show":[156],"that":[157],"it":[158,174],"effectively":[159],"achieves":[160,261],"high-precision":[161],"length,":[165],"width,":[166],"simultaneously,":[169],"Moreover,":[173],"considers":[175],"from":[177],"all":[178],"three":[179],"dimensions":[180],"training,":[183],"use":[185],"originally":[187],"measured":[188],"signal":[190],"place":[193],"recognized":[195],"images":[196],"avoid":[198],"information":[200],"further":[203],"improve":[204],"accuracy.":[207],"model":[211],"proposed":[212],"article":[215],"reduces":[216],"within":[224,233],"0.3":[225],"mm":[226],"0.4%":[234],"<italic":[235],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[236],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">t</i>":[237],".":[238],"addition,":[240],"compared":[241],"with":[242],"other":[243],"traditional":[247],"algorithms,":[248],"improves":[250],"accuracy":[253],"1\u20132":[255],"orders":[256],"magnitude":[258],"thus":[260],"high":[263],"performance.":[265]},"counts_by_year":[{"year":2026,"cited_by_count":17},{"year":2025,"cited_by_count":29},{"year":2024,"cited_by_count":16},{"year":2023,"cited_by_count":27},{"year":2022,"cited_by_count":10},{"year":2021,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}