{"id":"https://openalex.org/W4255661557","doi":"https://doi.org/10.1109/tii.2020.3043226","title":"Object Shape Error Response Using Bayesian 3-D Convolutional Neural Networks for Assembly Systems With Compliant Parts","display_name":"Object Shape Error Response Using Bayesian 3-D Convolutional Neural Networks for Assembly Systems With Compliant Parts","publication_year":2020,"publication_date":"2020-12-09","ids":{"openalex":"https://openalex.org/W4255661557","doi":"https://doi.org/10.1109/tii.2020.3043226"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2020.3043226","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tii.2020.3043226","pdf_url":"https://ieeexplore.ieee.org/ielx7/9424/9480159/09286512.pdf","source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://ieeexplore.ieee.org/ielx7/9424/9480159/09286512.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023162192","display_name":"Sumit Sinha","orcid":"https://orcid.org/0000-0003-2537-3041"},"institutions":[{"id":"https://openalex.org/I39555362","display_name":"University of Warwick","ror":"https://ror.org/01a77tt86","country_code":"GB","type":"education","lineage":["https://openalex.org/I39555362"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Sumit Sinha","raw_affiliation_strings":["Digital Lifecycle Management Group, Warwick Manufacturing Group, University of Warwick, Coventry, U.K"],"raw_orcid":"https://orcid.org/0000-0003-2537-3041","affiliations":[{"raw_affiliation_string":"Digital Lifecycle Management Group, Warwick Manufacturing Group, University of Warwick, Coventry, U.K","institution_ids":["https://openalex.org/I39555362"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051937017","display_name":"Pasquale Franciosa","orcid":"https://orcid.org/0000-0001-5458-3836"},"institutions":[{"id":"https://openalex.org/I39555362","display_name":"University of Warwick","ror":"https://ror.org/01a77tt86","country_code":"GB","type":"education","lineage":["https://openalex.org/I39555362"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Pasquale Franciosa","raw_affiliation_strings":["Digital Lifecycle Management Group, Warwick Manufacturing Group, University of Warwick, Coventry, U.K"],"raw_orcid":"https://orcid.org/0000-0001-5458-3836","affiliations":[{"raw_affiliation_string":"Digital Lifecycle Management Group, Warwick Manufacturing Group, University of Warwick, Coventry, U.K","institution_ids":["https://openalex.org/I39555362"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028702982","display_name":"Dariusz Ceglarek","orcid":"https://orcid.org/0000-0003-0788-4673"},"institutions":[{"id":"https://openalex.org/I39555362","display_name":"University of Warwick","ror":"https://ror.org/01a77tt86","country_code":"GB","type":"education","lineage":["https://openalex.org/I39555362"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Dariusz Ceglarek","raw_affiliation_strings":["Digital Lifecycle Management Group, Warwick Manufacturing Group, University of Warwick, Coventry, U.K"],"raw_orcid":"https://orcid.org/0000-0003-0788-4673","affiliations":[{"raw_affiliation_string":"Digital Lifecycle Management Group, Warwick Manufacturing Group, University of Warwick, Coventry, U.K","institution_ids":["https://openalex.org/I39555362"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I39555362"],"apc_list":null,"apc_paid":null,"fwci":1.245,"has_fulltext":true,"cited_by_count":15,"citation_normalized_percentile":{"value":0.83523035,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"17","issue":"10","first_page":"6676","last_page":"6686"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10719","display_name":"3D Shape Modeling and Analysis","score":0.9876000285148621,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.6979803442955017},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.660109281539917},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5956035256385803},{"id":"https://openalex.org/keywords/object","display_name":"Object (grammar)","score":0.5390782356262207},{"id":"https://openalex.org/keywords/point-cloud","display_name":"Point cloud","score":0.49954724311828613},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.4881480634212494},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.44936856627464294},{"id":"https://openalex.org/keywords/cognitive-neuroscience-of-visual-object-recognition","display_name":"Cognitive neuroscience of visual object recognition","score":0.4356098175048828},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.4165463149547577},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3239147663116455}],"concepts":[{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.6979803442955017},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.660109281539917},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5956035256385803},{"id":"https://openalex.org/C2781238097","wikidata":"https://www.wikidata.org/wiki/Q175026","display_name":"Object (grammar)","level":2,"score":0.5390782356262207},{"id":"https://openalex.org/C131979681","wikidata":"https://www.wikidata.org/wiki/Q1899648","display_name":"Point cloud","level":2,"score":0.49954724311828613},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.4881480634212494},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.44936856627464294},{"id":"https://openalex.org/C64876066","wikidata":"https://www.wikidata.org/wiki/Q5141226","display_name":"Cognitive neuroscience of visual object recognition","level":3,"score":0.4356098175048828},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.4165463149547577},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3239147663116455}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tii.2020.3043226","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tii.2020.3043226","pdf_url":"https://ieeexplore.ieee.org/ielx7/9424/9480159/09286512.pdf","source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},{"id":"pmh:oai:wrap.warwick.ac.uk:145492","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4306400665","display_name":"Warwick Research Archive Portal (University of Warwick)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I39555362","host_organization_name":"University of Warwick","host_organization_lineage":["https://openalex.org/I39555362"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"Journal Article"}],"best_oa_location":{"id":"doi:10.1109/tii.2020.3043226","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tii.2020.3043226","pdf_url":"https://ieeexplore.ieee.org/ielx7/9424/9480159/09286512.pdf","source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3140179459","display_name":null,"funder_award_id":"EP/K019368/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G3570019224","display_name":"Self-Resilient Reconfigurable Assembly Systems with In-process Quality Improvement","funder_award_id":"EP/K019368/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"}],"funders":[{"id":"https://openalex.org/F4320314731","display_name":"UK Research and Innovation","ror":"https://ror.org/001aqnf71"},{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":47,"referenced_works":["https://openalex.org/W1522301498","https://openalex.org/W1533861849","https://openalex.org/W1571710005","https://openalex.org/W1644641054","https://openalex.org/W1992838851","https://openalex.org/W1999393241","https://openalex.org/W2037607832","https://openalex.org/W2043510650","https://openalex.org/W2048761446","https://openalex.org/W2050412635","https://openalex.org/W2060953209","https://openalex.org/W2101234009","https://openalex.org/W2145724757","https://openalex.org/W2146056457","https://openalex.org/W2155867868","https://openalex.org/W2163605009","https://openalex.org/W2163674730","https://openalex.org/W2186511346","https://openalex.org/W2211722331","https://openalex.org/W2225156818","https://openalex.org/W2402144811","https://openalex.org/W2556522401","https://openalex.org/W2560609797","https://openalex.org/W2600383743","https://openalex.org/W2765623337","https://openalex.org/W2765838470","https://openalex.org/W2785606994","https://openalex.org/W2887782657","https://openalex.org/W2951266961","https://openalex.org/W2951965145","https://openalex.org/W2952479409","https://openalex.org/W2974046511","https://openalex.org/W2974879045","https://openalex.org/W3025177399","https://openalex.org/W3036100815","https://openalex.org/W4247680473","https://openalex.org/W6631190155","https://openalex.org/W6631943919","https://openalex.org/W6633890869","https://openalex.org/W6675354045","https://openalex.org/W6684191040","https://openalex.org/W6730169791","https://openalex.org/W6735443497","https://openalex.org/W6747657013","https://openalex.org/W6749954789","https://openalex.org/W6763422710","https://openalex.org/W6764214684"],"related_works":["https://openalex.org/W3093612317","https://openalex.org/W4287776258","https://openalex.org/W3027997911","https://openalex.org/W2175746458","https://openalex.org/W2732542196","https://openalex.org/W2536452361","https://openalex.org/W2801801420","https://openalex.org/W3025966514","https://openalex.org/W3153891452","https://openalex.org/W4318148659"],"abstract_inverted_index":{"This":[0],"article":[1],"proposes":[2],"a":[3,68],"novel":[4,69],"object":[5,38,76,82],"shape":[6,39,77],"error":[7,78],"response":[8],"(OSER)":[9],"approach":[10,43],"to":[11,25],"estimate":[12],"the":[13,37,60,63],"dimensional":[14],"and":[15,21,108,124,148],"geometric":[16],"variation":[17],"of":[18,36,71,81,89,97],"assembled":[19],"products":[20],"then,":[22],"relate":[23],"these":[24],"process":[26],"parameters,":[27],"which":[28],"can":[29],"be":[30,102],"interpreted":[31],"as":[32,116],"root":[33],"causes":[34],"(RC)":[35],"defects.":[40],"The":[41],"OSER":[42],"leverages":[44],"Bayesian":[45],"3-D":[46],"convolutional":[47],"neural":[48],"networks":[49],"integrated":[50],"with":[51,59,121,137,145],"computer-aided":[52],"engineering":[53],"simulations":[54],"for":[55,75,93,112],"RC":[56,94,119],"isolation.":[57],"Compared":[58],"existing":[61,138],"methods,":[62],"proposed":[64],"approach:":[65],"1)":[66],"addresses":[67],"problem":[70],"applying":[72],"deep":[73],"learning":[74,125,140],"identification":[79],"instead":[80],"detection;":[83],"2)":[84],"overcomes":[85],"fundamental":[86],"performance":[87,144],"limitations":[88],"current":[90],"linear":[91],"approaches":[92],"analysis":[95],"(RCA)":[96],"assembly":[98],"systems":[99],"that":[100],"cannot":[101],"used":[103],"on":[104],"point":[105],"cloud":[106],"data;":[107],"3)":[109],"provides":[110],"capabilities":[111,156],"unsolved":[113],"challenges":[114],"such":[115],"ill-conditioning,":[117],"fault-multiplicity,":[118],"prediction":[120],"uncertainty":[122],"quantification,":[123],"at":[126],"design":[127],"phase":[128],"when":[129],"no":[130],"measurement":[131],"data":[132],"are":[133],"available.":[134],"Comprehensive":[135],"benchmarking":[136],"machine":[139],"models":[141],"demonstrates":[142],"superior":[143],"R2=":[146],"0.98":[147],"MAE":[149],"=":[150],"0.05":[151],"mm,":[152],"thus":[153],"improving":[154],"RCA":[155],"by":[157],"29%.":[158]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}