{"id":"https://openalex.org/W3049268870","doi":"https://doi.org/10.1109/tii.2020.3014950","title":"Modeling of Machining Errors\u2019 Accumulation Driven by RFID Graphical Deduction Computing in Multistage Machining Processes","display_name":"Modeling of Machining Errors\u2019 Accumulation Driven by RFID Graphical Deduction Computing in Multistage Machining Processes","publication_year":2020,"publication_date":"2020-08-12","ids":{"openalex":"https://openalex.org/W3049268870","doi":"https://doi.org/10.1109/tii.2020.3014950","mag":"3049268870"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2020.3014950","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2020.3014950","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101804552","display_name":"Pulin Li","orcid":null},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Pulin Li","raw_affiliation_strings":["Xi'an Jiaotong University, Xi'an, China","State Key Laboratory for Manufacturing Systems Engineering Xi'an Jiaotong University  Xi'an China"],"raw_orcid":"https://orcid.org/0000-0001-8745-1004","affiliations":[{"raw_affiliation_string":"Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering Xi'an Jiaotong University  Xi'an China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043937066","display_name":"Pingyu Jiang","orcid":"https://orcid.org/0000-0002-1757-4276"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pingyu Jiang","raw_affiliation_strings":["Xi'an Jiaotong University, Xi'an, China","State Key Laboratory for Manufacturing Systems Engineering Xi'an Jiaotong University  Xi'an China"],"raw_orcid":"https://orcid.org/0000-0002-1757-4276","affiliations":[{"raw_affiliation_string":"Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering Xi'an Jiaotong University  Xi'an China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081189816","display_name":"Wei Guo","orcid":"https://orcid.org/0000-0002-0370-7058"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Guo","raw_affiliation_strings":["Xi'an Jiaotong University, Xi'an, China","State Key Laboratory for Manufacturing Systems Engineering Xi'an Jiaotong University  Xi'an China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering Xi'an Jiaotong University  Xi'an China","institution_ids":["https://openalex.org/I87445476"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5101804552"],"corresponding_institution_ids":["https://openalex.org/I87445476"],"apc_list":null,"apc_paid":null,"fwci":0.9035,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.7998036,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"17","issue":"6","first_page":"3971","last_page":"3981"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11451","display_name":"Advanced Machining and Optimization Techniques","score":0.9919000267982483,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/machining","display_name":"Machining","score":0.8516064882278442},{"id":"https://openalex.org/keywords/interpretability","display_name":"Interpretability","score":0.7938446998596191},{"id":"https://openalex.org/keywords/nosql","display_name":"NoSQL","score":0.6752790212631226},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6725265979766846},{"id":"https://openalex.org/keywords/representation","display_name":"Representation (politics)","score":0.5037993788719177},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.45788872241973877},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4486784338951111},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.43149107694625854},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3299805819988251},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.23775234818458557},{"id":"https://openalex.org/keywords/big-data","display_name":"Big data","score":0.2170242965221405},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.2058623731136322},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17253056168556213},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.16371384263038635},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.1136397123336792},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.09380581974983215}],"concepts":[{"id":"https://openalex.org/C523214423","wikidata":"https://www.wikidata.org/wiki/Q192047","display_name":"Machining","level":2,"score":0.8516064882278442},{"id":"https://openalex.org/C2781067378","wikidata":"https://www.wikidata.org/wiki/Q17027399","display_name":"Interpretability","level":2,"score":0.7938446998596191},{"id":"https://openalex.org/C2779599972","wikidata":"https://www.wikidata.org/wiki/Q82231","display_name":"NoSQL","level":3,"score":0.6752790212631226},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6725265979766846},{"id":"https://openalex.org/C2776359362","wikidata":"https://www.wikidata.org/wiki/Q2145286","display_name":"Representation (politics)","level":3,"score":0.5037993788719177},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.45788872241973877},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4486784338951111},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.43149107694625854},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3299805819988251},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.23775234818458557},{"id":"https://openalex.org/C75684735","wikidata":"https://www.wikidata.org/wiki/Q858810","display_name":"Big data","level":2,"score":0.2170242965221405},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.2058623731136322},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17253056168556213},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.16371384263038635},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.1136397123336792},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.09380581974983215},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C94625758","wikidata":"https://www.wikidata.org/wiki/Q7163","display_name":"Politics","level":2,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tii.2020.3014950","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2020.3014950","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Decent work and economic growth","score":0.4099999964237213,"id":"https://metadata.un.org/sdg/8"}],"awards":[{"id":"https://openalex.org/G3722780358","display_name":null,"funder_award_id":"51975464","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4374067888","display_name":null,"funder_award_id":"71571142","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":42,"referenced_works":["https://openalex.org/W879878326","https://openalex.org/W1979097971","https://openalex.org/W1981435113","https://openalex.org/W2010675106","https://openalex.org/W2017902940","https://openalex.org/W2050787667","https://openalex.org/W2063335372","https://openalex.org/W2084855091","https://openalex.org/W2127861000","https://openalex.org/W2148980845","https://openalex.org/W2158994553","https://openalex.org/W2264855399","https://openalex.org/W2267620405","https://openalex.org/W2295307183","https://openalex.org/W2307009511","https://openalex.org/W2347047235","https://openalex.org/W2392574629","https://openalex.org/W2413678205","https://openalex.org/W2579357702","https://openalex.org/W2586222815","https://openalex.org/W2765094417","https://openalex.org/W2782773417","https://openalex.org/W2786654449","https://openalex.org/W2791746654","https://openalex.org/W2792233253","https://openalex.org/W2793318872","https://openalex.org/W2890589428","https://openalex.org/W2896339617","https://openalex.org/W2899463034","https://openalex.org/W2908251145","https://openalex.org/W2917310212","https://openalex.org/W2941464610","https://openalex.org/W2942044637","https://openalex.org/W2946137441","https://openalex.org/W2947021802","https://openalex.org/W2949597371","https://openalex.org/W2960599306","https://openalex.org/W2969242820","https://openalex.org/W2969788886","https://openalex.org/W2972304091","https://openalex.org/W2982633573","https://openalex.org/W6754939152"],"related_works":["https://openalex.org/W2905433371","https://openalex.org/W2799973158","https://openalex.org/W4390569940","https://openalex.org/W2888392564","https://openalex.org/W2419153746","https://openalex.org/W4361193272","https://openalex.org/W2923327995","https://openalex.org/W4310278675","https://openalex.org/W3089119258","https://openalex.org/W2518340158"],"abstract_inverted_index":{"Interpreting":[0],"the":[1,29,41,46,63,79,88,92,117,128,140],"mechanism":[2,43],"of":[3,66,116],"machining":[4,12,47,122,147],"errors'":[5],"accumulation":[6],"(MEA)":[7],"is":[8,59,106,137],"hard":[9],"in":[10,87,108,145],"multistage":[11],"processes.":[13],"This":[14],"article":[15],"addresses":[16],"a":[17,50],"novel":[18],"three-dimensional":[19],"graphical":[20,33],"model":[21],"named":[22],"RFID-MEA":[23,37,141],"for":[24,111],"quantitating":[25],"MEA":[26,67,80,118,129],"inspired":[27],"by":[28,126],"radio-frequency":[30],"identification":[31],"(RFID)":[32],"deduction":[34],"computing":[35,105],"model.":[36,54],"aims":[38],"at":[39,91],"revealing":[40],"MEA's":[42],"instead":[44],"regarding":[45],"process":[48],"as":[49,149,151],"traditional":[51],"\u201cblack":[52],"box\u201d":[53],"First,":[55],"Taylor's":[56],"second-order":[57],"expansion":[58],"employed":[60],"to":[61,77,114],"advise":[62],"mathematical":[64],"representation":[65],"and":[68,155],"its":[69],"calculation":[70],"formula.":[71,130],"Then,":[72],"RFID":[73],"data":[74,85,104],"are":[75,124],"collected":[76],"bond":[78],"formula's":[81],"variables":[82,115],"with":[83,152],"certain":[84],"silos":[86],"right":[89,93],"type":[90],"time.":[94],"After":[95],"that,":[96],"raw":[97],"not":[98],"only":[99],"structured":[100],"query":[101],"language":[102],"(NoSQL)":[103],"executed":[107],"edge":[109],"nodes":[110],"assigning":[112],"values":[113],"formula":[119],"accurately.":[120],"Finally,":[121],"errors":[123],"estimated":[125],"solving":[127],"By":[131],"illustrating":[132],"an":[133],"industrial":[134],"case,":[135],"it":[136],"shown":[138],"that":[139],"has":[142],"better":[143],"performance":[144],"estimating":[146],"errors,":[148],"well":[150],"higher":[153],"reliability":[154],"interpretability.":[156]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}