{"id":"https://openalex.org/W3045363903","doi":"https://doi.org/10.1109/tii.2020.3011065","title":"Sparse Elitist Group Lasso Denoising in Frequency Domain for Bearing Fault Diagnosis","display_name":"Sparse Elitist Group Lasso Denoising in Frequency Domain for Bearing Fault Diagnosis","publication_year":2020,"publication_date":"2020-07-21","ids":{"openalex":"https://openalex.org/W3045363903","doi":"https://doi.org/10.1109/tii.2020.3011065","mag":"3045363903"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2020.3011065","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2020.3011065","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005201276","display_name":"Kai Zheng","orcid":"https://orcid.org/0000-0002-2939-0669"},"institutions":[{"id":"https://openalex.org/I185261750","display_name":"University of Toronto","ror":"https://ror.org/03dbr7087","country_code":"CA","type":"education","lineage":["https://openalex.org/I185261750"]},{"id":"https://openalex.org/I10535382","display_name":"Chongqing University of Posts and Telecommunications","ror":"https://ror.org/03dgaqz26","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]}],"countries":["CA","CN"],"is_corresponding":true,"raw_author_name":"Kai Zheng","raw_affiliation_strings":["Department of Mechanical and Industrial Engineering, University of Toronto, Toronto, ON, Canada","School of Advanced Manufacturing Engineering, Chongqing University of Posts and Telecommunications, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"Department of Mechanical and Industrial Engineering, University of Toronto, Toronto, ON, Canada","institution_ids":["https://openalex.org/I185261750"]},{"raw_affiliation_string":"School of Advanced Manufacturing Engineering, Chongqing University of Posts and Telecommunications, Chongqing, China","institution_ids":["https://openalex.org/I10535382"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006968936","display_name":"Tianliang Li","orcid":"https://orcid.org/0000-0002-7323-169X"},"institutions":[{"id":"https://openalex.org/I196699116","display_name":"Wuhan University of Technology","ror":"https://ror.org/03fe7t173","country_code":"CN","type":"education","lineage":["https://openalex.org/I196699116"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianliang Li","raw_affiliation_strings":["School of Mechanical and Electronic Engineering, Wuhan University of Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical and Electronic Engineering, Wuhan University of Technology, Wuhan, China","institution_ids":["https://openalex.org/I196699116"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016923791","display_name":"Zuqiang Su","orcid":"https://orcid.org/0000-0002-2938-6213"},"institutions":[{"id":"https://openalex.org/I10535382","display_name":"Chongqing University of Posts and Telecommunications","ror":"https://ror.org/03dgaqz26","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zuqiang Su","raw_affiliation_strings":["School of Advanced Manufacturing Engineering, Chongqing University of Posts and Telecommunications, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"School of Advanced Manufacturing Engineering, Chongqing University of Posts and Telecommunications, Chongqing, China","institution_ids":["https://openalex.org/I10535382"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100717260","display_name":"Bin Zhang","orcid":"https://orcid.org/0000-0002-7736-6866"},"institutions":[{"id":"https://openalex.org/I10535382","display_name":"Chongqing University of Posts and Telecommunications","ror":"https://ror.org/03dgaqz26","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bin Zhang","raw_affiliation_strings":["School of Advanced Manufacturing Engineering, Chongqing University of Posts and Telecommunications, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"School of Advanced Manufacturing Engineering, Chongqing University of Posts and Telecommunications, Chongqing, China","institution_ids":["https://openalex.org/I10535382"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5005201276"],"corresponding_institution_ids":["https://openalex.org/I10535382","https://openalex.org/I185261750"],"apc_list":null,"apc_paid":null,"fwci":7.4125,"has_fulltext":false,"cited_by_count":79,"citation_normalized_percentile":{"value":0.97780183,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":100},"biblio":{"volume":"17","issue":"7","first_page":"4681","last_page":"4691"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11062","display_name":"Gear and Bearing Dynamics Analysis","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9901999831199646,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6325787901878357},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.601438581943512},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5374717116355896},{"id":"https://openalex.org/keywords/regularization","display_name":"Regularization (linguistics)","score":0.528926432132721},{"id":"https://openalex.org/keywords/frequency-domain","display_name":"Frequency domain","score":0.5148417353630066},{"id":"https://openalex.org/keywords/normalization","display_name":"Normalization (sociology)","score":0.5116515755653381},{"id":"https://openalex.org/keywords/impulse","display_name":"Impulse (physics)","score":0.5037762522697449},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4775144159793854},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.47292476892471313},{"id":"https://openalex.org/keywords/solver","display_name":"Solver","score":0.44279342889785767},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3797105550765991},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.0662635862827301}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6325787901878357},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.601438581943512},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5374717116355896},{"id":"https://openalex.org/C2776135515","wikidata":"https://www.wikidata.org/wiki/Q17143721","display_name":"Regularization (linguistics)","level":2,"score":0.528926432132721},{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.5148417353630066},{"id":"https://openalex.org/C136886441","wikidata":"https://www.wikidata.org/wiki/Q926129","display_name":"Normalization (sociology)","level":2,"score":0.5116515755653381},{"id":"https://openalex.org/C70836080","wikidata":"https://www.wikidata.org/wiki/Q837940","display_name":"Impulse (physics)","level":2,"score":0.5037762522697449},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4775144159793854},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.47292476892471313},{"id":"https://openalex.org/C2778770139","wikidata":"https://www.wikidata.org/wiki/Q1966904","display_name":"Solver","level":2,"score":0.44279342889785767},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3797105550765991},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0662635862827301},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C144024400","wikidata":"https://www.wikidata.org/wiki/Q21201","display_name":"Sociology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C19165224","wikidata":"https://www.wikidata.org/wiki/Q23404","display_name":"Anthropology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tii.2020.3011065","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2020.3011065","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5400000214576721,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[{"id":"https://openalex.org/G3600353248","display_name":null,"funder_award_id":"51905065","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4202285481","display_name":null,"funder_award_id":"51705060","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":42,"referenced_works":["https://openalex.org/W1948271374","https://openalex.org/W2000888362","https://openalex.org/W2097795807","https://openalex.org/W2120871928","https://openalex.org/W2192457479","https://openalex.org/W2295840936","https://openalex.org/W2302880132","https://openalex.org/W2399038344","https://openalex.org/W2521543067","https://openalex.org/W2521994690","https://openalex.org/W2529812697","https://openalex.org/W2583356199","https://openalex.org/W2585416310","https://openalex.org/W2761196906","https://openalex.org/W2766414400","https://openalex.org/W2769927436","https://openalex.org/W2779615422","https://openalex.org/W2784141614","https://openalex.org/W2785011264","https://openalex.org/W2788684127","https://openalex.org/W2791036512","https://openalex.org/W2791794685","https://openalex.org/W2797657372","https://openalex.org/W2804275394","https://openalex.org/W2805662770","https://openalex.org/W2808274106","https://openalex.org/W2810598141","https://openalex.org/W2811323977","https://openalex.org/W2904278575","https://openalex.org/W2904460913","https://openalex.org/W2908969754","https://openalex.org/W2914390646","https://openalex.org/W2931070064","https://openalex.org/W2943909972","https://openalex.org/W2950003595","https://openalex.org/W2963000588","https://openalex.org/W2963521312","https://openalex.org/W2963921977","https://openalex.org/W3004640153","https://openalex.org/W3103984481","https://openalex.org/W4256504953","https://openalex.org/W6727618824"],"related_works":["https://openalex.org/W2953716828","https://openalex.org/W2904857019","https://openalex.org/W2944728705","https://openalex.org/W3011538607","https://openalex.org/W2904022177","https://openalex.org/W2591697403","https://openalex.org/W4321441197","https://openalex.org/W2359348847","https://openalex.org/W4294432981","https://openalex.org/W3209466624"],"abstract_inverted_index":{"The":[0],"fault-induced":[1],"impulse":[2],"responses":[3],"of":[4,81,92,142,150,164,183],"localized":[5],"bearing":[6,47,94,145],"fault":[7,48,76,95,146,185,207],"are":[8,20,25,169],"usually":[9],"interfered":[10],"by":[11,172],"the":[12,42,51,73,83,89,93,114,121,127,130,134,138,143,153,160,165,173,181,196,200,205],"background":[13],"noise":[14,141],"and":[15,24,37,137,162,176,187],"other":[16],"harmonic":[17],"components.":[18],"They":[19],"strongly":[21],"coupled":[22],"together":[23],"hard":[26],"to":[27,33,40,71],"be":[28],"separated.":[29],"It":[30],"is":[31,79,105,118,157,193],"crucial":[32],"develop":[34],"a":[35,59,101,109],"fast":[36],"reliable":[38],"method":[39,202],"extract":[41],"impulse-based":[43,75],"feature":[44],"for":[45,120,203],"online":[46],"diagnosis":[49],"in":[50,68,97],"industry":[52],"application.":[53],"In":[54],"this":[55],"article,":[56],"we":[57,125],"propose":[58],"new":[60],"sparse":[61,90],"elitist":[62],"group":[63],"lasso":[64],"denoising":[65,103,122],"(SEGLD)":[66],"algorithm":[67,168],"frequency":[69,98],"domain":[70],"detect":[72],"incipient":[74],"feature,":[77],"which":[78],"free":[80],"utilizing":[82],"prior":[84],"knowledge.":[85],"We":[86],"first":[87],"reveal":[88],"characteristics":[91],"signals":[96],"domain.":[99],"Then,":[100],"tailored":[102],"model":[104],"proposed.":[106],"To":[107],"obtain":[108],"satisfactory":[110],"analytical":[111],"stationary":[112],"solution,":[113],"Douglas-Rachford":[115],"splitting":[116],"solver":[117],"employed":[119],"model.":[123],"Moreover,":[124],"explore":[126],"relationship":[128],"between":[129],"best":[131,154],"regularization":[132,155],"parameters,":[133],"periodic":[135],"information":[136],"normalization":[139],"estimated":[140],"rolling":[144],"signal.":[147],"A":[148],"rule":[149],"adaptively":[151],"selecting":[152],"parameters":[156],"demonstrated.":[158],"Finally,":[159],"robustness":[161],"effectiveness":[163],"proposed":[166,197],"SEGLD":[167],"profoundly":[170],"verified":[171],"numerical":[174],"simulation":[175],"two":[177],"evaluation":[178],"experiments":[179],"under":[180],"conditions":[182],"early":[184],"stage":[186],"low":[188],"speed":[189],"scenario.":[190],"Also,":[191],"it":[192],"demonstrated":[194],"that":[195],"approach":[198],"outperforms":[199],"state-of-the-art":[201],"extracting":[204],"weak":[206],"feature.":[208]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":11},{"year":2024,"cited_by_count":16},{"year":2023,"cited_by_count":25},{"year":2022,"cited_by_count":18},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":2}],"updated_date":"2026-03-05T09:29:38.588285","created_date":"2025-10-10T00:00:00"}