{"id":"https://openalex.org/W2994994097","doi":"https://doi.org/10.1109/tii.2019.2960440","title":"Fault Location Technology for Power System Based on Information About the Power Internet of Things","display_name":"Fault Location Technology for Power System Based on Information About the Power Internet of Things","publication_year":2019,"publication_date":"2019-12-19","ids":{"openalex":"https://openalex.org/W2994994097","doi":"https://doi.org/10.1109/tii.2019.2960440","mag":"2994994097"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2019.2960440","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2019.2960440","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102875171","display_name":"Xiangyu Kong","orcid":"https://orcid.org/0000-0001-8578-3179"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiangyu Kong","raw_affiliation_strings":["Key Laboratory of Smart Grid of Ministry of Education, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Smart Grid of Ministry of Education, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006444761","display_name":"Yong Xu","orcid":"https://orcid.org/0000-0002-3845-7538"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yong Xu","raw_affiliation_strings":["Key Laboratory of Smart Grid of Ministry of Education, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Smart Grid of Ministry of Education, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017100899","display_name":"Zaibin Jiao","orcid":"https://orcid.org/0000-0002-2951-0077"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zaibin Jiao","raw_affiliation_strings":["Shaanxi Key Laboratory of Smart Grid, School of Electrical Engineering, Xi'an Jiaotong University, Xi'an, China"],"affiliations":[{"raw_affiliation_string":"Shaanxi Key Laboratory of Smart Grid, School of Electrical Engineering, Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039967865","display_name":"Delong Dong","orcid":null},"institutions":[{"id":"https://openalex.org/I4210097143","display_name":"Tianjin Research Institute of Electric Science (China)","ror":"https://ror.org/010ryc044","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210097143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Delong Dong","raw_affiliation_strings":["Tianjin Electric Power Research Institute, State Grid Tianjin Electric Power Company, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Tianjin Electric Power Research Institute, State Grid Tianjin Electric Power Company, Tianjin, China","institution_ids":["https://openalex.org/I4210097143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082095305","display_name":"Xiaoxiao Yuan","orcid":"https://orcid.org/0000-0002-8834-9367"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoxiao Yuan","raw_affiliation_strings":["Key Laboratory of Smart Grid of Ministry of Education, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Smart Grid of Ministry of Education, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101490699","display_name":"Shupeng Li","orcid":"https://orcid.org/0000-0002-3221-1123"},"institutions":[{"id":"https://openalex.org/I4210097143","display_name":"Tianjin Research Institute of Electric Science (China)","ror":"https://ror.org/010ryc044","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210097143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shupeng Li","raw_affiliation_strings":["Tianjin Electric Power Research Institute, State Grid Tianjin Electric Power Company, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Tianjin Electric Power Research Institute, State Grid Tianjin Electric Power Company, Tianjin, China","institution_ids":["https://openalex.org/I4210097143"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5102875171"],"corresponding_institution_ids":["https://openalex.org/I162868743"],"apc_list":null,"apc_paid":null,"fwci":7.3179,"has_fulltext":false,"cited_by_count":79,"citation_normalized_percentile":{"value":0.97656314,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":"16","issue":"10","first_page":"6682","last_page":"6692"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13183","display_name":"Islanding Detection in Power Systems","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10917","display_name":"Smart Grid Security and Resilience","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phasor","display_name":"Phasor","score":0.7973088026046753},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7960967421531677},{"id":"https://openalex.org/keywords/phasor-measurement-unit","display_name":"Phasor measurement unit","score":0.7377249002456665},{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.6993616819381714},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.5415130257606506},{"id":"https://openalex.org/keywords/units-of-measurement","display_name":"Units of measurement","score":0.5140103101730347},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.4953056871891022},{"id":"https://openalex.org/keywords/matlab","display_name":"MATLAB","score":0.4941597282886505},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4893912374973297},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46749937534332275},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4655647277832031},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.46315258741378784},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.44072431325912476},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3988426625728607},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3901742398738861},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3567954897880554},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.28039079904556274},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.15488335490226746},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.08338189125061035}],"concepts":[{"id":"https://openalex.org/C176605952","wikidata":"https://www.wikidata.org/wiki/Q827674","display_name":"Phasor","level":4,"score":0.7973088026046753},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7960967421531677},{"id":"https://openalex.org/C2778229166","wikidata":"https://www.wikidata.org/wiki/Q8290","display_name":"Phasor measurement unit","level":5,"score":0.7377249002456665},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.6993616819381714},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.5415130257606506},{"id":"https://openalex.org/C151233233","wikidata":"https://www.wikidata.org/wiki/Q47574","display_name":"Units of measurement","level":2,"score":0.5140103101730347},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.4953056871891022},{"id":"https://openalex.org/C2780365114","wikidata":"https://www.wikidata.org/wiki/Q169478","display_name":"MATLAB","level":2,"score":0.4941597282886505},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4893912374973297},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46749937534332275},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4655647277832031},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.46315258741378784},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.44072431325912476},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3988426625728607},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3901742398738861},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3567954897880554},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.28039079904556274},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15488335490226746},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.08338189125061035},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tii.2019.2960440","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2019.2960440","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1250046947","display_name":null,"funder_award_id":"51877145","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3072739907","display_name":null,"funder_award_id":"2017YFB0902900","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1994306174","https://openalex.org/W2001235722","https://openalex.org/W2004294985","https://openalex.org/W2029576618","https://openalex.org/W2058937311","https://openalex.org/W2059483872","https://openalex.org/W2061938014","https://openalex.org/W2118719892","https://openalex.org/W2170277545","https://openalex.org/W2241118198","https://openalex.org/W2614839472","https://openalex.org/W2687606558","https://openalex.org/W2766017136","https://openalex.org/W2766898170","https://openalex.org/W2771380743","https://openalex.org/W2775359664","https://openalex.org/W2779977204","https://openalex.org/W2789731659","https://openalex.org/W2802839291","https://openalex.org/W2803268327","https://openalex.org/W2897067635","https://openalex.org/W2897691644","https://openalex.org/W2907496629","https://openalex.org/W2912900988","https://openalex.org/W2920825770","https://openalex.org/W2944468177","https://openalex.org/W2963422046","https://openalex.org/W3087012914","https://openalex.org/W7071672111"],"related_works":["https://openalex.org/W2024194466","https://openalex.org/W3148663848","https://openalex.org/W3186790058","https://openalex.org/W2051500795","https://openalex.org/W2163103195","https://openalex.org/W1978303825","https://openalex.org/W4210447066","https://openalex.org/W1974225921","https://openalex.org/W2390533148","https://openalex.org/W2386936363"],"abstract_inverted_index":{"In":[0],"order":[1],"to":[2,162],"improve":[3],"the":[4,9,26,57,62,64,68,74,78,91,95,104,111,116,127,132,141,148,152,164,168,171,187],"reliability":[5],"and":[6,25,37,50,67,80,115,147,166,185,189],"continuity":[7],"of":[8,15,94,134,151,170],"power":[10,13],"distribution":[11,44,96,106],"system,":[12,114],"Internet":[14],"Things":[16],"analysis":[17],"monitoring":[18],"system":[19,27],"was":[20,28,154],"constructed":[21],"in":[22],"this":[23],"article,":[24],"used":[29,109,161],"for":[30,110,126],"comprehensive":[31],"applications":[32],"such":[33],"as":[34],"data":[35],"acquisition":[36],"fault":[38,65,69,99,117,142,180],"analysis.":[39],"Fault":[40],"location":[41,85,100,118,143,181],"methods":[42],"considering":[43],"phasor":[45],"measurement":[46,58],"unit":[47],"(D-PMU)":[48],"information":[49,59],"network":[51],"symmetry":[52,93],"characteristics":[53],"are":[54,71,87,191],"proposed.":[55,155],"With":[56],"provided":[60],"by":[61,73],"D-PMU,":[63],"sections":[66],"types":[70],"determined":[72],"phase":[75],"difference":[76],"between":[77],"positive":[79],"negative":[81],"sequence":[82],"currents.":[83],"Different":[84],"algorithms":[86],"obtained":[88],"based":[89,102,120],"on":[90,103,121,140],"load":[92],"network.":[97],"The":[98,156,174],"method":[101,119],"line":[105,122],"parameters":[107],"is":[108,124,145,160],"three-phase":[112,128],"symmetric":[113],"impedance":[123],"proposed":[125,172],"asymmetric":[129],"system.":[130],"Finally,":[131],"effect":[133],"different":[135],"nodes":[136],"with":[137],"a":[138],"D-PMU":[139,153],"accuracy":[144],"analyzed,":[146],"configuration":[149],"principle":[150],"PSCAD/MATLAB":[157],"simulation":[158,175],"software":[159],"analyze":[163],"example":[165],"verify":[167],"effectiveness":[169],"method.":[173],"results":[176],"demonstrate":[177],"that":[178,186],"high-precision":[179],"could":[182],"be":[183],"realized":[184],"practicality":[188],"economy":[190],"improved.":[192]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":10},{"year":2023,"cited_by_count":15},{"year":2022,"cited_by_count":15},{"year":2021,"cited_by_count":20},{"year":2020,"cited_by_count":9}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}