{"id":"https://openalex.org/W2982172966","doi":"https://doi.org/10.1109/tii.2019.2949344","title":"A Data-Driven Method for IGBT Open-Circuit Fault Diagnosis Based on Hybrid Ensemble Learning and Sliding-Window Classification","display_name":"A Data-Driven Method for IGBT Open-Circuit Fault Diagnosis Based on Hybrid Ensemble Learning and Sliding-Window Classification","publication_year":2019,"publication_date":"2019-10-24","ids":{"openalex":"https://openalex.org/W2982172966","doi":"https://doi.org/10.1109/tii.2019.2949344","mag":"2982172966"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2019.2949344","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2019.2949344","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073745810","display_name":"Yang Xia","orcid":"https://orcid.org/0000-0002-3163-137X"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"Yang Xia","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013947981","display_name":"Yan Xu","orcid":"https://orcid.org/0000-0002-0503-183X"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Yan Xu","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007359227","display_name":"Bin Gou","orcid":"https://orcid.org/0000-0003-1951-643X"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Bin Gou","raw_affiliation_strings":["Rolls-Royce @ NTU Corporate Lab, Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"Rolls-Royce @ NTU Corporate Lab, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5073745810"],"corresponding_institution_ids":["https://openalex.org/I172675005"],"apc_list":null,"apc_paid":null,"fwci":3.4986,"has_fulltext":false,"cited_by_count":104,"citation_normalized_percentile":{"value":0.93281777,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":100},"biblio":{"volume":"16","issue":"8","first_page":"5223","last_page":"5233"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12676","display_name":"Machine Learning and ELM","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7159771919250488},{"id":"https://openalex.org/keywords/sliding-window-protocol","display_name":"Sliding window protocol","score":0.6613651514053345},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5454490780830383},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.4776831269264221},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4769681394100189},{"id":"https://openalex.org/keywords/ensemble-learning","display_name":"Ensemble learning","score":0.4676401615142822},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.38765910267829895},{"id":"https://openalex.org/keywords/window","display_name":"Window (computing)","score":0.1955333650112152}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7159771919250488},{"id":"https://openalex.org/C102392041","wikidata":"https://www.wikidata.org/wiki/Q592860","display_name":"Sliding window protocol","level":3,"score":0.6613651514053345},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5454490780830383},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.4776831269264221},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4769681394100189},{"id":"https://openalex.org/C45942800","wikidata":"https://www.wikidata.org/wiki/Q245652","display_name":"Ensemble learning","level":2,"score":0.4676401615142822},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.38765910267829895},{"id":"https://openalex.org/C2778751112","wikidata":"https://www.wikidata.org/wiki/Q835016","display_name":"Window (computing)","level":2,"score":0.1955333650112152},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tii.2019.2949344","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2019.2949344","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},{"id":"pmh:oai:dr.ntu.edu.sg:10356/155302","is_oa":false,"landing_page_url":"https://hdl.handle.net/10356/155302","pdf_url":null,"source":{"id":"https://openalex.org/S4306402609","display_name":"DR-NTU (Nanyang Technological University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I172675005","host_organization_name":"Nanyang Technological University","host_organization_lineage":["https://openalex.org/I172675005"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Journal Article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1500895378","https://openalex.org/W1597576211","https://openalex.org/W2012430877","https://openalex.org/W2023736703","https://openalex.org/W2026131661","https://openalex.org/W2051044060","https://openalex.org/W2056972503","https://openalex.org/W2064727986","https://openalex.org/W2083390614","https://openalex.org/W2100028154","https://openalex.org/W2111072639","https://openalex.org/W2136707745","https://openalex.org/W2138383519","https://openalex.org/W2142351866","https://openalex.org/W2156740116","https://openalex.org/W2174980551","https://openalex.org/W2205067742","https://openalex.org/W2318970278","https://openalex.org/W2514981216","https://openalex.org/W2519348275","https://openalex.org/W2587187701","https://openalex.org/W2592413301","https://openalex.org/W2605258224","https://openalex.org/W2607740335","https://openalex.org/W2614556125","https://openalex.org/W2790230453","https://openalex.org/W2811058982","https://openalex.org/W2897411297","https://openalex.org/W2900706455"],"related_works":["https://openalex.org/W2345184372","https://openalex.org/W3013515612","https://openalex.org/W2136184105","https://openalex.org/W2187500075","https://openalex.org/W2041399278","https://openalex.org/W2160451891","https://openalex.org/W2336974148","https://openalex.org/W2056016498","https://openalex.org/W2389470892","https://openalex.org/W4293087713"],"abstract_inverted_index":{"In":[0],"this":[1],"article,":[2],"a":[3,61,90,105],"novel":[4],"data-driven":[5],"method":[6],"is":[7,66,94],"proposed":[8,67],"for":[9,68],"open-circuit":[10],"fault":[11,73],"diagnosis":[12,115],"of":[13,138],"insulated":[14],"gate":[15],"bipolar":[16],"transistor":[17],"used":[18,38],"in":[19,80,98],"three-phase":[20,28],"pulsewidth":[21],"modulation":[22],"converter.":[23],"Based":[24],"on":[25,46],"the":[26,76,99,123,135],"sampled":[27],"current":[29],"signals,":[30],"fast":[31,87],"Fourier":[32],"transform":[33],"and":[34,55,75,86,117,149],"ReliefF":[35],"algorithm":[36],"are":[37,102],"to":[39,82,110],"select":[40],"most":[41],"correlated":[42],"features.":[43,78],"Then,":[44],"based":[45],"two":[47],"randomized":[48],"learning":[49,53,64],"technologies":[50],"named":[51],"extreme":[52],"machine":[54],"random":[56],"vector":[57],"functional":[58],"link":[59],"network,":[60],"hybrid":[62],"ensemble":[63],"scheme":[65],"extracting":[69],"mapping":[70],"relationship":[71],"between":[72,114],"modes":[74],"selected":[77],"Furthermore,":[79,143],"order":[81],"achieve":[83,111],"an":[84],"accurate":[85],"diagnostic":[88,100,126,136],"performance,":[89],"sliding-window":[91],"classification":[92],"framework":[93],"designed.":[95],"Finally,":[96],"parameters":[97],"model":[101,109],"optimized":[103],"by":[104],"multiobjective":[106],"optimization":[107],"programming":[108],"optimal":[112],"balance":[113],"accuracy":[116,127],"speed.":[118],"At":[119],"offline":[120],"testing":[121],"stage,":[122],"overall":[124],"average":[125],"can":[128],"be":[129],"as":[130,132],"high":[131],"99%":[133],"with":[134],"time":[137],"around":[139],"one-cycle":[140],"sampling":[141],"time.":[142],"real-time":[144],"experiments":[145],"verify":[146],"its":[147],"effectiveness":[148],"reliability":[150],"under":[151],"different":[152],"operation":[153],"conditions.":[154]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":26},{"year":2024,"cited_by_count":25},{"year":2023,"cited_by_count":23},{"year":2022,"cited_by_count":12},{"year":2021,"cited_by_count":10},{"year":2020,"cited_by_count":7}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}