{"id":"https://openalex.org/W2942207913","doi":"https://doi.org/10.1109/tii.2019.2910857","title":"Machine Perception Based on Eddy Current for Physical Field Reconstruction of Conductivity and Hidden Geometrical Features","display_name":"Machine Perception Based on Eddy Current for Physical Field Reconstruction of Conductivity and Hidden Geometrical Features","publication_year":2019,"publication_date":"2019-04-25","ids":{"openalex":"https://openalex.org/W2942207913","doi":"https://doi.org/10.1109/tii.2019.2910857","mag":"2942207913"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2019.2910857","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2019.2910857","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070002661","display_name":"Min Li","orcid":"https://orcid.org/0000-0002-3435-3897"},"institutions":[{"id":"https://openalex.org/I152014189","display_name":"Minnesota State University, Mankato","ror":"https://ror.org/04att9732","country_code":"US","type":"education","lineage":["https://openalex.org/I152014189","https://openalex.org/I91221267"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Min Li","raw_affiliation_strings":["Minnesota State University, Mankato, Mankato, MN, USA"],"raw_orcid":"https://orcid.org/0000-0002-3435-3897","affiliations":[{"raw_affiliation_string":"Minnesota State University, Mankato, Mankato, MN, USA","institution_ids":["https://openalex.org/I152014189"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083153534","display_name":"Kok-Meng Lee","orcid":"https://orcid.org/0000-0002-9547-094X"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kok-Meng Lee","raw_affiliation_strings":["George W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":"https://orcid.org/0000-0002-9547-094X","affiliations":[{"raw_affiliation_string":"George W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8674,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.6875535,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"15","issue":"10","first_page":"5392","last_page":"5403"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9764999747276306,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/tikhonov-regularization","display_name":"Tikhonov regularization","score":0.8503262996673584},{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.7422945499420166},{"id":"https://openalex.org/keywords/inverse-problem","display_name":"Inverse problem","score":0.583743155002594},{"id":"https://openalex.org/keywords/discretization","display_name":"Discretization","score":0.5728994011878967},{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.5095313191413879},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.5005197525024414},{"id":"https://openalex.org/keywords/electromagnet","display_name":"Electromagnet","score":0.4907451868057251},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.4745141863822937},{"id":"https://openalex.org/keywords/regularization","display_name":"Regularization (linguistics)","score":0.42648184299468994},{"id":"https://openalex.org/keywords/electrical-conductor","display_name":"Electrical conductor","score":0.4126873314380646},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.396828293800354},{"id":"https://openalex.org/keywords/magnet","display_name":"Magnet","score":0.36773449182510376},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.3589620292186737},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34699735045433044},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.34681108593940735},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3437710404396057},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.3194843530654907},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.28849998116493225},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26907628774642944},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2630941569805145},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.24990710616111755},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20609897375106812}],"concepts":[{"id":"https://openalex.org/C152442038","wikidata":"https://www.wikidata.org/wiki/Q2778212","display_name":"Tikhonov regularization","level":3,"score":0.8503262996673584},{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.7422945499420166},{"id":"https://openalex.org/C135252773","wikidata":"https://www.wikidata.org/wiki/Q1567213","display_name":"Inverse problem","level":2,"score":0.583743155002594},{"id":"https://openalex.org/C73000952","wikidata":"https://www.wikidata.org/wiki/Q17007827","display_name":"Discretization","level":2,"score":0.5728994011878967},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.5095313191413879},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.5005197525024414},{"id":"https://openalex.org/C106997767","wikidata":"https://www.wikidata.org/wiki/Q178032","display_name":"Electromagnet","level":3,"score":0.4907451868057251},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.4745141863822937},{"id":"https://openalex.org/C2776135515","wikidata":"https://www.wikidata.org/wiki/Q17143721","display_name":"Regularization (linguistics)","level":2,"score":0.42648184299468994},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.4126873314380646},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.396828293800354},{"id":"https://openalex.org/C16389437","wikidata":"https://www.wikidata.org/wiki/Q11421","display_name":"Magnet","level":2,"score":0.36773449182510376},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.3589620292186737},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34699735045433044},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.34681108593940735},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3437710404396057},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.3194843530654907},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.28849998116493225},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26907628774642944},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2630941569805145},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.24990710616111755},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20609897375106812},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tii.2019.2910857","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2019.2910857","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2038057984","display_name":null,"funder_award_id":"CMMI-1662700","funder_id":"https://openalex.org/F4320335353","funder_display_name":"National Science Foundation of Sri Lanka"}],"funders":[{"id":"https://openalex.org/F4320335353","display_name":"National Science Foundation of Sri Lanka","ror":"https://ror.org/010xaa060"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W26205945","https://openalex.org/W1145079248","https://openalex.org/W1527557185","https://openalex.org/W1975101026","https://openalex.org/W1981837440","https://openalex.org/W1987966270","https://openalex.org/W1994331942","https://openalex.org/W2008298717","https://openalex.org/W2022209486","https://openalex.org/W2040265265","https://openalex.org/W2048293496","https://openalex.org/W2056299959","https://openalex.org/W2089585821","https://openalex.org/W2098459033","https://openalex.org/W2100788482","https://openalex.org/W2114424556","https://openalex.org/W2124164709","https://openalex.org/W2132477016","https://openalex.org/W2138419149","https://openalex.org/W2146677579","https://openalex.org/W2153760591","https://openalex.org/W2161511377","https://openalex.org/W2319465443","https://openalex.org/W2393874818","https://openalex.org/W2611752436","https://openalex.org/W2782921624","https://openalex.org/W2795715889","https://openalex.org/W2806609794","https://openalex.org/W2888509493","https://openalex.org/W4285719527","https://openalex.org/W6601111172"],"related_works":["https://openalex.org/W2337734184","https://openalex.org/W2388364587","https://openalex.org/W1995301895","https://openalex.org/W2050033254","https://openalex.org/W2322955667","https://openalex.org/W2373176546","https://openalex.org/W2561531189","https://openalex.org/W2152224705","https://openalex.org/W2385735574","https://openalex.org/W2374214022"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,26,94,155],"new":[4],"machine":[5,107,169],"perception":[6,108,170],"method":[7,171],"based":[8],"on":[9,138],"eddy-current":[10],"(EC)":[11],"effects":[12,129],"to":[13,93],"reconstruct":[14],"physical":[15,79,90,133,178],"fields":[16,80],"(EC":[17],"field,":[18,20,117,119],"electrical-conductivity":[19],"and":[21,54,63,69,120,135,154,172],"hidden":[22,121],"geometrical":[23,122],"features)":[24],"of":[25,78,124,130,150,159,167,175],"nonferrous":[27],"material":[28],"commonly":[29],"encountered":[30],"in":[31,56],"intelligent":[32],"manufacturing":[33],"using":[34,81,100],"one-time":[35],"finite":[36],"magnetic":[37,160],"flux":[38],"density":[39,116],"(MFD)":[40],"measurements.":[41],"An":[42],"analytical":[43],"model":[44],"for":[45,98],"EC":[46,115],"testing":[47],"system":[48,73],"with":[49,162],"conductor":[50],"discretization":[51],"is":[52,109],"established":[53],"expressed":[55],"state-space":[57],"representation.":[58],"Two":[59],"improvements":[60],"(physical":[61],"constraints":[62],"adaptive":[64],"element":[65,131],"refinement)":[66],"are":[67,85,142,180],"developed":[68],"integrated":[70],"into":[71],"the":[72,89,101,114,128,139,165,168,173,176],"model.":[74],"The":[75,105],"measurement":[76],"models":[77],"discrete":[82],"MFD":[83],"measurements":[84],"linearly":[86],"established,":[87],"reducing":[88],"field":[91,179],"reconstruction":[92,140],"linear":[95],"inverse":[96],"problem":[97],"solving":[99],"Tikhonov":[102],"regularization":[103],"method.":[104],"EC-based":[106],"numerically":[110],"illustrated":[111],"by":[112],"reconstructing":[113],"conductivity":[118],"features":[123],"aluminum":[125],"plates.":[126],"Additionally,":[127],"refinement,":[132],"constraints,":[134],"sensor":[136],"configurations":[137],"results":[141],"analyzed":[143],"numerically.":[144],"Using":[145],"an":[146,151],"experimental":[147],"prototype":[148],"consisting":[149],"air-cored":[152],"electromagnet":[153],"two-dimensional":[156],"(2-D)":[157],"array":[158],"sensors":[161],"associated":[163],"electronics,":[164],"effectiveness":[166],"accuracy":[174],"reconstructed":[177],"demonstrated":[181],"experimentally.":[182]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-08-12T21:12:35.861297","created_date":"2025-10-10T00:00:00"}