{"id":"https://openalex.org/W2909601466","doi":"https://doi.org/10.1109/tii.2019.2891107","title":"DC-Biased Magnetization Based Eddy Current Thermography for Subsurface Defect Detection","display_name":"DC-Biased Magnetization Based Eddy Current Thermography for Subsurface Defect Detection","publication_year":2019,"publication_date":"2019-01-09","ids":{"openalex":"https://openalex.org/W2909601466","doi":"https://doi.org/10.1109/tii.2019.2891107","mag":"2909601466"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2019.2891107","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2019.2891107","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005465247","display_name":"Jianbo Wu","orcid":"https://orcid.org/0000-0002-4732-6732"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianbo Wu","raw_affiliation_strings":["School of Manufacturing Science and Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-4732-6732","affiliations":[{"raw_affiliation_string":"School of Manufacturing Science and Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040604865","display_name":"Junzhen Zhu","orcid":"https://orcid.org/0000-0002-1519-8764"},"institutions":[{"id":"https://openalex.org/I84884186","display_name":"Newcastle University","ror":"https://ror.org/01kj2bm70","country_code":"GB","type":"education","lineage":["https://openalex.org/I84884186"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Junzhen Zhu","raw_affiliation_strings":["Department of Vehicle Engineering, Army Academy of Armored Forces, Beijing, China","School of Engineering, Newcastle University, Newcastle upon Tyne, U.K"],"raw_orcid":"https://orcid.org/0000-0002-1519-8764","affiliations":[{"raw_affiliation_string":"Department of Vehicle Engineering, Army Academy of Armored Forces, Beijing, China","institution_ids":[]},{"raw_affiliation_string":"School of Engineering, Newcastle University, Newcastle upon Tyne, U.K","institution_ids":["https://openalex.org/I84884186"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072638012","display_name":"Hui Xia","orcid":"https://orcid.org/0000-0001-9169-587X"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hui Xia","raw_affiliation_strings":["School of Manufacturing Science and Engineering, Sichuan University, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Manufacturing Science and Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048999796","display_name":"Chengyong Liu","orcid":"https://orcid.org/0000-0001-6611-1764"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chengyong Liu","raw_affiliation_strings":["School of Manufacturing Science and Engineering, Sichuan University, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Manufacturing Science and Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100668771","display_name":"Xiaoming Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoming Huang","raw_affiliation_strings":["School of Manufacturing Science and Engineering, Sichuan University, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Manufacturing Science and Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037331514","display_name":"Gui Yun Tian","orcid":"https://orcid.org/0000-0002-7563-1523"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I84884186","display_name":"Newcastle University","ror":"https://ror.org/01kj2bm70","country_code":"GB","type":"education","lineage":["https://openalex.org/I84884186"]}],"countries":["CN","GB"],"is_corresponding":false,"raw_author_name":"Gui Yun Tian","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China","School of Engineering, Newcastle University, Newcastle upon Tyne, U.K"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"School of Engineering, Newcastle University, Newcastle upon Tyne, U.K","institution_ids":["https://openalex.org/I84884186"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":6.4733,"has_fulltext":false,"cited_by_count":83,"citation_normalized_percentile":{"value":0.97506001,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":"15","issue":"12","first_page":"6252","last_page":"6259"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/magnetization","display_name":"Magnetization","score":0.7656024694442749},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7327308058738708},{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.7001298666000366},{"id":"https://openalex.org/keywords/thermography","display_name":"Thermography","score":0.5368642807006836},{"id":"https://openalex.org/keywords/penetration-depth","display_name":"Penetration depth","score":0.5347719788551331},{"id":"https://openalex.org/keywords/nondestructive-testing","display_name":"Nondestructive testing","score":0.4885433614253998},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.45831412076950073},{"id":"https://openalex.org/keywords/ferromagnetism","display_name":"Ferromagnetism","score":0.42726626992225647},{"id":"https://openalex.org/keywords/nuclear-magnetic-resonance","display_name":"Nuclear magnetic resonance","score":0.38387858867645264},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3537333905696869},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.2885485589504242},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2781621813774109},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.2620539665222168},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18920472264289856},{"id":"https://openalex.org/keywords/infrared","display_name":"Infrared","score":0.13324353098869324},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10793003439903259},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09917280077934265}],"concepts":[{"id":"https://openalex.org/C32546565","wikidata":"https://www.wikidata.org/wiki/Q856711","display_name":"Magnetization","level":3,"score":0.7656024694442749},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7327308058738708},{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.7001298666000366},{"id":"https://openalex.org/C2779222261","wikidata":"https://www.wikidata.org/wiki/Q624587","display_name":"Thermography","level":3,"score":0.5368642807006836},{"id":"https://openalex.org/C193493375","wikidata":"https://www.wikidata.org/wiki/Q1306232","display_name":"Penetration depth","level":2,"score":0.5347719788551331},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.4885433614253998},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.45831412076950073},{"id":"https://openalex.org/C82217956","wikidata":"https://www.wikidata.org/wiki/Q184207","display_name":"Ferromagnetism","level":2,"score":0.42726626992225647},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.38387858867645264},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3537333905696869},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.2885485589504242},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2781621813774109},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.2620539665222168},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18920472264289856},{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.13324353098869324},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10793003439903259},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09917280077934265},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tii.2019.2891107","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2019.2891107","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G251942203","display_name":null,"funder_award_id":"51505308","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":41,"referenced_works":["https://openalex.org/W1498627683","https://openalex.org/W1581912461","https://openalex.org/W1585822806","https://openalex.org/W1963989948","https://openalex.org/W1964082250","https://openalex.org/W1967808943","https://openalex.org/W1976692507","https://openalex.org/W1976805286","https://openalex.org/W1980621217","https://openalex.org/W1981953799","https://openalex.org/W1984045467","https://openalex.org/W1984116038","https://openalex.org/W1993578471","https://openalex.org/W1994094048","https://openalex.org/W1997375305","https://openalex.org/W2004859539","https://openalex.org/W2015081045","https://openalex.org/W2024145012","https://openalex.org/W2042518535","https://openalex.org/W2051890630","https://openalex.org/W2052354157","https://openalex.org/W2058195136","https://openalex.org/W2059639360","https://openalex.org/W2059932971","https://openalex.org/W2062628978","https://openalex.org/W2075803687","https://openalex.org/W2079746955","https://openalex.org/W2089215923","https://openalex.org/W2275062665","https://openalex.org/W2285850247","https://openalex.org/W2324626007","https://openalex.org/W2460480128","https://openalex.org/W2475272954","https://openalex.org/W2504925967","https://openalex.org/W2556507341","https://openalex.org/W2586611611","https://openalex.org/W2786077676","https://openalex.org/W2789739201","https://openalex.org/W2795904114","https://openalex.org/W4244079469","https://openalex.org/W4298291596"],"related_works":["https://openalex.org/W2994919662","https://openalex.org/W3041672627","https://openalex.org/W2535232420","https://openalex.org/W2084261063","https://openalex.org/W346129553","https://openalex.org/W4283209813","https://openalex.org/W4226305447","https://openalex.org/W2353087477","https://openalex.org/W1979671329","https://openalex.org/W2028943086"],"abstract_inverted_index":{"Eddy":[0],"current":[1,54],"thermography":[2],"(ECT)":[3],"as":[4],"one":[5],"of":[6,36,59,65,120,174,203],"the":[7,47,51,73,89,99,103,109,114,118,127,131,145,150,154,162,168,171,181,186,194,199,210],"emerging":[8],"nondestructive":[9],"testing":[10],"and":[11,105,124,133,136,176],"evaluation":[12],"techniques":[13],"has":[14,149],"been":[15],"used":[16],"for":[17],"defects":[18],"detection":[19],"in":[20,26,32,38,43,93,113],"critical":[21],"components,":[22],"e.g.,":[23],"fatigue":[24],"cracks":[25],"turbine":[27],"blades,":[28],"bond":[29],"wire":[30],"lift-off":[31],"IGBT":[33],"modules,":[34],"lack":[35],"fusion":[37],"welded":[39],"parts,":[40],"etc.":[41],"However,":[42],"fast":[44],"inspection":[45],"using":[46],"early":[48],"thermal":[49,100,128,138,155,172,187],"response,":[50],"thin":[52],"eddy":[53],"penetration":[55],"depth":[56,75,216],"(skin":[57],"depth)":[58],"ferromagnetic":[60,94],"materials":[61],"limits":[62],"ECT's":[63],"capability":[64],"detecting":[66],"subsurface":[67,211],"defects.":[68],"In":[69],"order":[70],"to":[71,161,218],"increase":[72,98],"detectable":[74],"range,":[76],"this":[77],"paper":[78],"proposes":[79],"a":[80,214],"dc-biased":[81,121,146],"magnetization":[82,122,147,164,182,195],"based":[83],"ECT":[84],"(DCMECT)":[85],"technique.":[86],"Based":[87],"on":[88,126,153],"nonlinear":[90],"magnetic":[91],"permeability":[92,111],"material,":[95],"DCMECT":[96],"can":[97,208],"contrast":[101,139,188],"between":[102,189],"defective":[104,132,175],"sound":[106,134,177],"areas":[107,178,191],"by":[108,167],"enhanced":[110,200],"distortion":[112],"skin-depth":[115],"layer.":[116],"Specifically,":[117],"influences":[119],"direction":[123,148,165],"intensity":[125,183],"responses":[129,173],"(of":[130],"areas)":[135],"their":[137],"are":[140],"investigated.":[141],"Results":[142],"show":[143],"that":[144],"strongest":[151],"influence":[152],"response":[156],"when":[157],"it":[158],"is":[159],"parallel":[160],"ac":[163],"generated":[166],"coil.":[169],"Both":[170],"decrease":[179],"with":[180,193,213],"increasing.":[184],"Whereas,":[185],"two":[190],"increases":[192],"intensity,":[196],"which":[197],"presents":[198],"defect":[201,212],"detectability":[202],"DCMECT.":[204],"The":[205],"proposed":[206],"technique":[207],"detect":[209],"buried":[215],"up":[217],"6":[219],"mm.":[220]},"counts_by_year":[{"year":2026,"cited_by_count":7},{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":14},{"year":2022,"cited_by_count":16},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":16},{"year":2019,"cited_by_count":8}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}