{"id":"https://openalex.org/W2784952821","doi":"https://doi.org/10.1109/tii.2018.2796068","title":"Time- and Frequency-Domain Fault Detection in a VSC-Interfaced Experimental DC Test System","display_name":"Time- and Frequency-Domain Fault Detection in a VSC-Interfaced Experimental DC Test System","publication_year":2018,"publication_date":"2018-01-22","ids":{"openalex":"https://openalex.org/W2784952821","doi":"https://doi.org/10.1109/tii.2018.2796068","mag":"2784952821"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2018.2796068","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2018.2796068","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064193434","display_name":"Yew Ming Yeap","orcid":"https://orcid.org/0000-0002-7553-3675"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Yew Ming Yeap","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":"https://orcid.org/0000-0002-7553-3675","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050757487","display_name":"Nagesh Geddada","orcid":"https://orcid.org/0000-0001-6687-1691"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Nagesh Geddada","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060773538","display_name":"Kuntal Satpathi","orcid":"https://orcid.org/0000-0003-3188-2344"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Kuntal Satpathi","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":"https://orcid.org/0000-0003-3188-2344","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086713046","display_name":"Abhisek Ukil","orcid":"https://orcid.org/0000-0003-3100-7865"},"institutions":[{"id":"https://openalex.org/I154130895","display_name":"University of Auckland","ror":"https://ror.org/03b94tp07","country_code":"NZ","type":"education","lineage":["https://openalex.org/I154130895"]}],"countries":["NZ"],"is_corresponding":false,"raw_author_name":"Abhisek Ukil","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Auckland, Auckland, New Zealand"],"raw_orcid":"https://orcid.org/0000-0003-3100-7865","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Auckland, Auckland, New Zealand","institution_ids":["https://openalex.org/I154130895"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":6.0232,"has_fulltext":false,"cited_by_count":106,"citation_normalized_percentile":{"value":0.96738141,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":100},"biblio":{"volume":"14","issue":"10","first_page":"4353","last_page":"4364"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6313381791114807},{"id":"https://openalex.org/keywords/frequency-domain","display_name":"Frequency domain","score":0.6194242835044861},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.6041672229766846},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5197622179985046},{"id":"https://openalex.org/keywords/time-domain","display_name":"Time domain","score":0.5027458667755127},{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.48711609840393066},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.4727880656719208},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4635642468929291},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.4391767382621765},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.4251485764980316},{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.4177859127521515},{"id":"https://openalex.org/keywords/fault-current-limiter","display_name":"Fault current limiter","score":0.41492295265197754},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4090140163898468},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.3994327485561371},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3357246518135071},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.26175421476364136},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17707550525665283},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.17072582244873047},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10687080025672913}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6313381791114807},{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.6194242835044861},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.6041672229766846},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5197622179985046},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.5027458667755127},{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.48711609840393066},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.4727880656719208},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4635642468929291},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.4391767382621765},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.4251485764980316},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.4177859127521515},{"id":"https://openalex.org/C129187525","wikidata":"https://www.wikidata.org/wiki/Q10858078","display_name":"Fault current limiter","level":4,"score":0.41492295265197754},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4090140163898468},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.3994327485561371},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3357246518135071},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.26175421476364136},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17707550525665283},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.17072582244873047},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10687080025672913},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tii.2018.2796068","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2018.2796068","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},{"id":"pmh:oai:researchspace.auckland.ac.nz:2292/42220","is_oa":false,"landing_page_url":"https://hdl.handle.net/2292/42220","pdf_url":null,"source":{"id":"https://openalex.org/S7407055463","display_name":"ResearchSpace (University of Auckland)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I154130895","host_organization_name":"University of Auckland","host_organization_lineage":["https://openalex.org/I154130895"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Journal Article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W1590929132","https://openalex.org/W1988917938","https://openalex.org/W1990114737","https://openalex.org/W2039002241","https://openalex.org/W2057947340","https://openalex.org/W2068427394","https://openalex.org/W2073877791","https://openalex.org/W2079993229","https://openalex.org/W2094314829","https://openalex.org/W2121098361","https://openalex.org/W2132984323","https://openalex.org/W2155230465","https://openalex.org/W2181508763","https://openalex.org/W2330170611","https://openalex.org/W2339766197","https://openalex.org/W2343847222","https://openalex.org/W2547718626","https://openalex.org/W2557908743","https://openalex.org/W2559400647","https://openalex.org/W2564986390","https://openalex.org/W2586856580","https://openalex.org/W2591489243","https://openalex.org/W2593784709","https://openalex.org/W2737958103","https://openalex.org/W2739755411","https://openalex.org/W2763524503","https://openalex.org/W2767599415","https://openalex.org/W2770205876","https://openalex.org/W6647658578","https://openalex.org/W6682848079","https://openalex.org/W6730822776","https://openalex.org/W6733632277","https://openalex.org/W6746021676","https://openalex.org/W7061925971"],"related_works":["https://openalex.org/W3102847316","https://openalex.org/W3094385082","https://openalex.org/W2045392317","https://openalex.org/W3011006018","https://openalex.org/W2035297892","https://openalex.org/W4205540626","https://openalex.org/W2051563071","https://openalex.org/W2784904939","https://openalex.org/W3105097254","https://openalex.org/W1539046304"],"abstract_inverted_index":{"The":[0,68,88,120,203],"rapid":[1],"discharge":[2,79,86],"of":[3,7,18,29,75,98,106,135,172,181,193,211,233],"a":[4,107,117,150],"dc-link":[5,77,100],"capacitor":[6,78,101],"the":[8,15,19,24,30,42,65,72,76,84,91,96,99,124,139,179,182,189,209,213,216,223,231,234],"voltage-source":[9],"converter":[10],"(VSC)-based":[11],"dc":[12,38,92,153,191,217],"system":[13,154],"is":[14,47,71,81,102,123,130,186,226],"primary":[16],"indication":[17],"fault":[20,31,39,45,57,118,140,164,169,183],"condition.":[21],"Apart":[22],"from":[23],"time-domain":[25,73],"analysis,":[26],"frequency-domain":[27],"analysis":[28,74,134,221],"current":[32,46,94],"could":[33],"also":[34,227],"be":[35,113],"utilized":[36],"for":[37,132],"detection,":[40],"as":[41,83],"rapidly":[43],"rising":[44],"expected":[48],"to":[49,115,168,215,229],"have":[50],"high-frequency":[51,136],"components.":[52],"This":[53],"paper":[54],"proposes":[55],"two":[56,194],"detection":[58,165,184],"methods":[59,143,185,214],"and":[60,80,95,147,175,198,205],"compares":[61],"their":[62],"performances":[63],"with":[64,222],"wavelet":[66],"transform.":[67],"first":[69],"method":[70,122,225],"termed":[82],"capacitive":[85],"technique.":[87],"relationship":[89],"between":[90],"line":[93],"behavior":[97],"measured":[103],"in":[104,138,201],"terms":[105],"correlation":[108],"coefficient,":[109],"whose":[110],"value":[111],"can":[112],"used":[114,131],"establish":[116],"basis.":[119],"second":[121],"frequency-domain-based":[125],"short-time":[126],"Fourier":[127],"transform,":[128],"which":[129],"quantitative":[133],"components":[137],"current.":[141],"These":[142],"are":[144],"extensively":[145],"analyzed":[146],"compared":[148],"using":[149],"scaled-down":[151],"VSC-based":[152],"experimental":[155,204],"test":[156],"setup.":[157],"Comparison":[158],"has":[159],"been":[160],"done":[161],"based":[162],"on":[163,188],"time,":[166],"sensitivity":[167],"parameters,":[170],"influence":[171],"sampling":[173],"frequency,":[174],"computation":[176],"speed.":[177],"Furthermore,":[178],"selectivity":[180],"studied":[187],"multiterminal":[190],"systems":[192],"different":[195],"topologies":[196],"(ring":[197],"radial),":[199],"modeled":[200],"PSCAD/EMTDC.":[202],"simulation":[206],"results":[207],"substantiate":[208],"applicability":[210],"all":[212],"system.":[218],"Brief":[219],"comparative":[220],"di/dt":[224],"presented":[228],"highlight":[230],"advantages":[232],"proposed":[235],"methods.":[236]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":12},{"year":2024,"cited_by_count":14},{"year":2023,"cited_by_count":13},{"year":2022,"cited_by_count":17},{"year":2021,"cited_by_count":14},{"year":2020,"cited_by_count":17},{"year":2019,"cited_by_count":12},{"year":2018,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}