{"id":"https://openalex.org/W2770205876","doi":"https://doi.org/10.1109/tii.2017.2772081","title":"A New Approach to Power System Disturbance Assessment Using Wide-Area Postdisturbance Records","display_name":"A New Approach to Power System Disturbance Assessment Using Wide-Area Postdisturbance Records","publication_year":2017,"publication_date":"2017-11-13","ids":{"openalex":"https://openalex.org/W2770205876","doi":"https://doi.org/10.1109/tii.2017.2772081","mag":"2770205876"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2017.2772081","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2017.2772081","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008750797","display_name":"Manas Kumar Jena","orcid":"https://orcid.org/0000-0003-1134-1348"},"institutions":[{"id":"https://openalex.org/I68891433","display_name":"Indian Institute of Technology Delhi","ror":"https://ror.org/049tgcd06","country_code":"IN","type":"education","lineage":["https://openalex.org/I68891433"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Manas Kumar Jena","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology Delhi, New Delhi, India"],"raw_orcid":"https://orcid.org/0000-0003-1134-1348","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology Delhi, New Delhi, India","institution_ids":["https://openalex.org/I68891433"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073634264","display_name":"Bijaya Ketan Panigrahi","orcid":"https://orcid.org/0000-0003-2062-2889"},"institutions":[{"id":"https://openalex.org/I68891433","display_name":"Indian Institute of Technology Delhi","ror":"https://ror.org/049tgcd06","country_code":"IN","type":"education","lineage":["https://openalex.org/I68891433"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Bijaya Ketan Panigrahi","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology Delhi, New Delhi, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology Delhi, New Delhi, India","institution_ids":["https://openalex.org/I68891433"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057919668","display_name":"Subhransu Ranjan Samantaray","orcid":"https://orcid.org/0000-0002-7087-6214"},"institutions":[{"id":"https://openalex.org/I99729588","display_name":"Indian Institute of Technology Bhubaneswar","ror":"https://ror.org/04gx72j20","country_code":"IN","type":"education","lineage":["https://openalex.org/I99729588"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Subhransu Ranjan Samantaray","raw_affiliation_strings":["School of Electrical Sciences, Indian Institute of Technology Bhubaneswar, Bhubaneswar, India"],"raw_orcid":"https://orcid.org/0000-0002-7087-6214","affiliations":[{"raw_affiliation_string":"School of Electrical Sciences, Indian Institute of Technology Bhubaneswar, Bhubaneswar, India","institution_ids":["https://openalex.org/I99729588"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":5.3063,"has_fulltext":false,"cited_by_count":68,"citation_normalized_percentile":{"value":0.95992708,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":"14","issue":"3","first_page":"1253","last_page":"1261"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10305","display_name":"Power System Optimization and Stability","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hilbert\u2013huang-transform","display_name":"Hilbert\u2013Huang transform","score":0.7175377011299133},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6008026599884033},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.5218421816825867},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.46277058124542236},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.4244420528411865},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.41475439071655273},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.3903945982456207},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3550071716308594},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.22359636425971985},{"id":"https://openalex.org/keywords/white-noise","display_name":"White noise","score":0.13607090711593628},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08964842557907104}],"concepts":[{"id":"https://openalex.org/C25570617","wikidata":"https://www.wikidata.org/wiki/Q1006462","display_name":"Hilbert\u2013Huang transform","level":3,"score":0.7175377011299133},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6008026599884033},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.5218421816825867},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.46277058124542236},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.4244420528411865},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.41475439071655273},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.3903945982456207},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3550071716308594},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.22359636425971985},{"id":"https://openalex.org/C112633086","wikidata":"https://www.wikidata.org/wiki/Q381287","display_name":"White noise","level":2,"score":0.13607090711593628},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08964842557907104},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tii.2017.2772081","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2017.2772081","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/15","display_name":"Life in Land","score":0.6100000143051147}],"awards":[],"funders":[{"id":"https://openalex.org/F4320324473","display_name":"Indian Institute of Technology Delhi","ror":"https://ror.org/049tgcd06"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1521492382","https://openalex.org/W1560151846","https://openalex.org/W1979579834","https://openalex.org/W1998102702","https://openalex.org/W2003782690","https://openalex.org/W2007221293","https://openalex.org/W2019900743","https://openalex.org/W2019971481","https://openalex.org/W2040411595","https://openalex.org/W2056748507","https://openalex.org/W2075448888","https://openalex.org/W2108255779","https://openalex.org/W2112949599","https://openalex.org/W2119365536","https://openalex.org/W2123672270","https://openalex.org/W2137918705","https://openalex.org/W2148213050","https://openalex.org/W2151109389","https://openalex.org/W2163153386","https://openalex.org/W2343847222","https://openalex.org/W2524447200","https://openalex.org/W2560546796","https://openalex.org/W2565924576","https://openalex.org/W2620985542"],"related_works":["https://openalex.org/W3014107421","https://openalex.org/W2081563414","https://openalex.org/W2363056446","https://openalex.org/W2359718298","https://openalex.org/W2377062149","https://openalex.org/W2076661204","https://openalex.org/W2380939102","https://openalex.org/W2089603224","https://openalex.org/W2329112433","https://openalex.org/W2077021924"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"an":[3],"empirical":[4,23],"wavelet":[5],"transform":[6],"(EWT)":[7],"based":[8,18],"approach":[9],"to":[10,34,49,79,87],"perform":[11],"postmortem":[12],"analysis":[13],"of":[14,62,100,115,121,140],"wide-area":[15,90],"measurement":[16],"(WAM)":[17],"signals.":[19],"The":[20,39,51,67,95,119,133],"commonly":[21],"used":[22,76],"mode":[24,31,97],"decomposition":[25,40,73,141],"(EMD)":[26],"has":[27],"limitations":[28],"such":[29],"as":[30,47,77,84],"mixing,":[32],"sensitivity":[33],"noise,":[35],"and":[36,143],"sampling":[37],"rate.":[38],"provided":[41],"by":[42,54],"EWT":[43,56],"is":[44,106,124],"more":[45],"consistent":[46],"compared":[48],"EMD.":[50],"modes":[52],"revealed":[53],"the":[55,101,122],"help":[57],"in":[58,138],"extracting":[59],"dynamic":[60,68],"patterns":[61,69],"different":[63],"power":[64],"system":[65],"disturbances.":[66],"extracted":[70],"through":[71],"EWT-based":[72,102],"are":[74],"further":[75],"inputs":[78],"a":[80,89],"data-mining":[81],"tool":[82,105],"known":[83],"random":[85],"forest,":[86],"build":[88],"disturbance":[91],"classifier":[92],"(WADC)":[93],"model.":[94],"efficient":[96],"extraction":[98],"quality":[99,142],"signal":[103],"processing":[104],"analyzed":[107],"for":[108],"WAM":[109],"data":[110],"recorded":[111],"on":[112,126],"Northern":[113],"Grid":[114],"Indian":[116],"Power":[117],"System.":[118],"performance":[120,137],"WADC":[123],"validated":[125],"IEEE":[127],"39-bus":[128],"New":[129],"England":[130],"test":[131],"system.":[132],"results":[134],"provide":[135],"improved":[136],"terms":[139],"classification":[144],"accuracy.":[145]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":12},{"year":2021,"cited_by_count":12},{"year":2020,"cited_by_count":13},{"year":2019,"cited_by_count":9},{"year":2018,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}