{"id":"https://openalex.org/W2733581800","doi":"https://doi.org/10.1109/tii.2017.2723930","title":"Fault Estimation and Accommodation For Virtual Sensor Bias Fault in Image-Based Visual Servoing Using Particle Filter","display_name":"Fault Estimation and Accommodation For Virtual Sensor Bias Fault in Image-Based Visual Servoing Using Particle Filter","publication_year":2017,"publication_date":"2017-07-06","ids":{"openalex":"https://openalex.org/W2733581800","doi":"https://doi.org/10.1109/tii.2017.2723930","mag":"2733581800"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2017.2723930","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2017.2723930","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062828983","display_name":"Mien Van","orcid":"https://orcid.org/0000-0001-9616-6061"},"institutions":[{"id":"https://openalex.org/I23923803","display_name":"University of Exeter","ror":"https://ror.org/03yghzc09","country_code":"GB","type":"education","lineage":["https://openalex.org/I23923803"]},{"id":"https://openalex.org/I39555362","display_name":"University of Warwick","ror":"https://ror.org/01a77tt86","country_code":"GB","type":"education","lineage":["https://openalex.org/I39555362"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Mien Van","raw_affiliation_strings":["Warwick Manufacturing Group, University of Warwick, Coventry, U.K","currently with the College of Engineering, Mathematics and Physical Sciences, University of Exeter, Exeter, U.K"],"affiliations":[{"raw_affiliation_string":"Warwick Manufacturing Group, University of Warwick, Coventry, U.K","institution_ids":["https://openalex.org/I39555362"]},{"raw_affiliation_string":"currently with the College of Engineering, Mathematics and Physical Sciences, University of Exeter, Exeter, U.K","institution_ids":["https://openalex.org/I23923803"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008501506","display_name":"Shuzhi Sam Ge","orcid":"https://orcid.org/0000-0001-5549-312X"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Shuzhi Sam Ge","raw_affiliation_strings":["Department of Electrical and Computer Engineering and Social Robotics Laboratory, National University of Singapore, Singapore"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering and Social Robotics Laboratory, National University of Singapore, Singapore","institution_ids":["https://openalex.org/I165932596"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028702982","display_name":"Dariusz Ceglarek","orcid":"https://orcid.org/0000-0003-0788-4673"},"institutions":[{"id":"https://openalex.org/I39555362","display_name":"University of Warwick","ror":"https://ror.org/01a77tt86","country_code":"GB","type":"education","lineage":["https://openalex.org/I39555362"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Dariusz Ceglarek","raw_affiliation_strings":["Warwick Manufacturing Group, University of Warwick, Coventry, U.K"],"affiliations":[{"raw_affiliation_string":"Warwick Manufacturing Group, University of Warwick, Coventry, U.K","institution_ids":["https://openalex.org/I39555362"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5062828983"],"corresponding_institution_ids":["https://openalex.org/I23923803","https://openalex.org/I39555362"],"apc_list":null,"apc_paid":null,"fwci":3.7902,"has_fulltext":false,"cited_by_count":39,"citation_normalized_percentile":{"value":0.94128092,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"14","issue":"4","first_page":"1312","last_page":"1322"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/visual-servoing","display_name":"Visual servoing","score":0.7262741327285767},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7079716920852661},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.6579274535179138},{"id":"https://openalex.org/keywords/particle-filter","display_name":"Particle filter","score":0.5890560150146484},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5467913150787354},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5162665843963623},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4932207465171814},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.49245485663414},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4786306917667389},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4362232983112335},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.4269421398639679},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3818701505661011},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.31255626678466797},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.11098611354827881}],"concepts":[{"id":"https://openalex.org/C10912380","wikidata":"https://www.wikidata.org/wiki/Q527952","display_name":"Visual servoing","level":3,"score":0.7262741327285767},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7079716920852661},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.6579274535179138},{"id":"https://openalex.org/C52421305","wikidata":"https://www.wikidata.org/wiki/Q1151499","display_name":"Particle filter","level":3,"score":0.5890560150146484},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5467913150787354},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5162665843963623},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4932207465171814},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.49245485663414},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4786306917667389},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4362232983112335},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.4269421398639679},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3818701505661011},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.31255626678466797},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.11098611354827881},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tii.2017.2723930","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2017.2723930","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},{"id":"pmh:oai:irep.ntu.ac.uk:31224","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4306400559","display_name":"Nottingham Trent University's Institutional Repository (Nottingham Trent Repository)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I52590639","host_organization_name":"Nottingham Trent University","host_organization_lineage":["https://openalex.org/I52590639"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"Article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions","score":0.7599999904632568}],"awards":[{"id":"https://openalex.org/G3140179459","display_name":null,"funder_award_id":"EP/K019368/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"}],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W127587312","https://openalex.org/W654351113","https://openalex.org/W2036479540","https://openalex.org/W2067788234","https://openalex.org/W2071534836","https://openalex.org/W2079553629","https://openalex.org/W2091763021","https://openalex.org/W2097951398","https://openalex.org/W2122391539","https://openalex.org/W2124933191","https://openalex.org/W2131946827","https://openalex.org/W2135386771","https://openalex.org/W2137044675","https://openalex.org/W2142718141","https://openalex.org/W2147125096","https://openalex.org/W2160337655","https://openalex.org/W2166676471","https://openalex.org/W2171877226","https://openalex.org/W2241883232","https://openalex.org/W2295524408","https://openalex.org/W2296653574","https://openalex.org/W2319292949","https://openalex.org/W2343067029","https://openalex.org/W2411339950","https://openalex.org/W2463984612","https://openalex.org/W6673251523","https://openalex.org/W6684841858"],"related_works":["https://openalex.org/W2126852585","https://openalex.org/W2367086100","https://openalex.org/W2352270872","https://openalex.org/W2386520554","https://openalex.org/W1520171478","https://openalex.org/W4317830657","https://openalex.org/W3024380338","https://openalex.org/W2127866683","https://openalex.org/W2065095941","https://openalex.org/W110066474"],"abstract_inverted_index":{"This":[0],"study":[1],"develops":[2],"a":[3,38,68],"fault":[4,42,49,53,69,81,90,96,120],"estimation":[5,82,97],"and":[6,56,98,104,107,116],"accommodation":[7,70,99],"scheme":[8],"for":[9,85],"the":[10,17,20,24,62,76,80,86,89,92,108,112,118],"image-based":[11],"visual":[12,44],"servoing":[13,45],"system":[14,113],"to":[15,23,83],"eliminate":[16,117],"effects":[18,87,121],"of":[19,64,88],"faults":[21],"due":[22],"image":[25],"feature":[26],"extraction":[27],"task,":[28],"which":[29,51],"is":[30,46,58,72,100],"named":[31],"as":[32],"bias":[33,39],"virtual":[34,40],"sensor":[35,41],"fault.":[36],"First,":[37],"in":[43,91],"declared.":[47],"Then,":[48],"diagnosis,":[50],"includes":[52],"detection,":[54],"isolation,":[55],"estimation,":[57],"designed":[59],"based":[60,74],"on":[61,75],"means":[63],"particle":[65],"filter.":[66],"Finally,":[67],"law":[71],"developed":[73],"information":[77],"obtained":[78],"from":[79],"compensate":[84],"system.":[93],"The":[94],"proposed":[95],"verified":[101],"through":[102],"simulation":[103],"experimental":[105],"studies,":[106],"results":[109],"show":[110],"that":[111],"can":[114],"estimate":[115],"unknown":[119],"effectively.":[122]},"counts_by_year":[{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":11},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}