{"id":"https://openalex.org/W2582823319","doi":"https://doi.org/10.1109/tii.2017.2657786","title":"Unsupervised Recognition and Characterization of the Reflected Laser Lines for Robotic Gas Metal Arc Welding","display_name":"Unsupervised Recognition and Characterization of the Reflected Laser Lines for Robotic Gas Metal Arc Welding","publication_year":2017,"publication_date":"2017-01-25","ids":{"openalex":"https://openalex.org/W2582823319","doi":"https://doi.org/10.1109/tii.2017.2657786","mag":"2582823319"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2017.2657786","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2017.2657786","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109348130","display_name":"Zhen Zhou Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I142078773","display_name":"Shenyang Institute of Automation","ror":"https://ror.org/00ft6nj33","country_code":"CN","type":"facility","lineage":["https://openalex.org/I142078773","https://openalex.org/I19820366"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhen Zhou Wang","raw_affiliation_strings":["State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China","institution_ids":["https://openalex.org/I142078773","https://openalex.org/I19820366"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5109348130"],"corresponding_institution_ids":["https://openalex.org/I142078773","https://openalex.org/I19820366"],"apc_list":null,"apc_paid":null,"fwci":3.2143,"has_fulltext":false,"cited_by_count":29,"citation_normalized_percentile":{"value":0.91226068,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"13","issue":"4","first_page":"1866","last_page":"1876"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.671208381652832},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.5788701772689819},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5236268639564514},{"id":"https://openalex.org/keywords/polynomial","display_name":"Polynomial","score":0.4671551585197449},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.458509236574173},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4505121409893036},{"id":"https://openalex.org/keywords/image-segmentation","display_name":"Image segmentation","score":0.44659581780433655},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.4344734847545624},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4213883578777313},{"id":"https://openalex.org/keywords/arc-lamp","display_name":"Arc lamp","score":0.41127872467041016},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4103016257286072},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.3906206786632538},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3613988757133484},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.35243508219718933},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2574920654296875},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.1828695833683014},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1317550241947174}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.671208381652832},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.5788701772689819},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5236268639564514},{"id":"https://openalex.org/C90119067","wikidata":"https://www.wikidata.org/wiki/Q43260","display_name":"Polynomial","level":2,"score":0.4671551585197449},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.458509236574173},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4505121409893036},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.44659581780433655},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.4344734847545624},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4213883578777313},{"id":"https://openalex.org/C4606981","wikidata":"https://www.wikidata.org/wiki/Q841282","display_name":"Arc lamp","level":2,"score":0.41127872467041016},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4103016257286072},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.3906206786632538},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3613988757133484},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.35243508219718933},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2574920654296875},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.1828695833683014},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1317550241947174},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tii.2017.2657786","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2017.2657786","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1598942666","https://openalex.org/W1987161559","https://openalex.org/W2031918136","https://openalex.org/W2044465660","https://openalex.org/W2044744216","https://openalex.org/W2047676345","https://openalex.org/W2056099712","https://openalex.org/W2056910174","https://openalex.org/W2078524723","https://openalex.org/W2106625221","https://openalex.org/W2117082278","https://openalex.org/W2159681926","https://openalex.org/W2162870748","https://openalex.org/W2173030052","https://openalex.org/W2193231165","https://openalex.org/W2281059034","https://openalex.org/W2283902088","https://openalex.org/W2322870089","https://openalex.org/W2479773483","https://openalex.org/W2490389189","https://openalex.org/W2603235775","https://openalex.org/W4285719527","https://openalex.org/W6721295130","https://openalex.org/W6722546186","https://openalex.org/W6735897172"],"related_works":["https://openalex.org/W2157746940","https://openalex.org/W4379231730","https://openalex.org/W4389858081","https://openalex.org/W4324315429","https://openalex.org/W2501551404","https://openalex.org/W4385583601","https://openalex.org/W4298131179","https://openalex.org/W2113201962","https://openalex.org/W2799953226","https://openalex.org/W1522196789"],"abstract_inverted_index":{"Unsupervised":[0],"recognition":[1,203,214],"of":[2,19,26,34,72,110,143,156,182,213],"the":[3,8,14,20,30,40,43,57,69,73,79,84,88,95,111,123,131,144,152,157,161,174,180,183,195,208],"reflected":[4,44,200],"laser":[5,45,59,158,162,185,201],"lines":[6,46,60],"from":[7],"arc-light-modified":[9],"background":[10,114,133],"is":[11,25,91,102,164,169,177,204],"prerequisite":[12],"for":[13,29,198],"subsequent":[15],"measurement":[16],"and":[17,32,99,104,148,187],"characterization":[18],"weld":[21,175],"pool":[22,176],"shape,":[23],"which":[24,55],"great":[27],"importance":[28],"modeling":[31],"control":[33],"robotic":[35],"arc":[36,85],"welding.":[37],"To":[38],"facilitate":[39],"unsupervised":[41,199],"recognition,":[42],"need":[47],"to":[48,61,67,121,129,171,207],"be":[49,62],"segmented":[50,58],"as":[51,53,63,65],"accurate":[52],"possible,":[54],"requires":[56],"continuous":[64],"possible":[66],"decrease":[68],"adverse":[70],"effect":[71],"noise":[74,145],"blobs.":[75],"In":[76],"this":[77],"paper,":[78],"intensity":[80],"distribution":[81],"caused":[82],"by":[83,115,136,179],"light":[86],"in":[87,211],"captured":[89],"image":[90,113],"modeled.":[92],"Based":[93],"on":[94,151],"model,":[96],"an":[97,137],"efficient":[98],"robust":[100],"approach":[101,197,210],"proposed,":[103],"it":[105],"comprises":[106],"six":[107],"parts:":[108],"reduction":[109],"uneven":[112,132],"a":[116,125,166],"difference":[117],"operation,":[118],"spline":[119],"enhancement":[120],"remove":[122],"fuzziness,":[124],"gradient":[126],"detection":[127],"filter":[128],"eliminate":[130],"further,":[134],"segmentation":[135],"effective":[138],"threshold":[139],"selection":[140],"method,":[141],"removal":[142],"blobs":[146],"adaptively,":[147],"clustering":[149],"based":[150],"online":[153],"computed":[154],"slope":[155],"line.":[159],"After":[160],"line":[163,186,202],"clustered,":[165],"second-order":[167],"polynomial":[168],"fitted":[170,189],"it.":[172],"Finally,":[173],"characterized":[178],"parameters":[181],"clustered":[184],"its":[188],"polynomial.":[190],"Experimental":[191],"results":[192],"verified":[193],"that":[194],"proposed":[196],"significantly":[205],"superior":[206],"state-of-the-art":[209],"terms":[212],"accuracy.":[215]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":6},{"year":2017,"cited_by_count":4}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}