{"id":"https://openalex.org/W1845002809","doi":"https://doi.org/10.1109/tii.2015.2396853","title":"Enhanced quality-related fault detection approach based on OSC and M-PLS","display_name":"Enhanced quality-related fault detection approach based on OSC and M-PLS","publication_year":2015,"publication_date":"2015-01-01","ids":{"openalex":"https://openalex.org/W1845002809","doi":"https://doi.org/10.1109/tii.2015.2396853","mag":"1845002809"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2015.2396853","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2015.2396853","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100451760","display_name":"Guang Wang","orcid":"https://orcid.org/0000-0002-8014-6119"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Guang Wang","raw_affiliation_strings":["Research Institute of Intelligent Control and Systems, Harbin Institute of Technology, Harbin, China","Research Institute of Intelligent Control and Systems Harbin Institute of Technology Harbin China"],"affiliations":[{"raw_affiliation_string":"Research Institute of Intelligent Control and Systems, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"Research Institute of Intelligent Control and Systems Harbin Institute of Technology Harbin China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069744156","display_name":"Shen Yin","orcid":"https://orcid.org/0000-0002-3802-9269"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shen Yin","raw_affiliation_strings":["Research Institute of Intelligent Control and Systems, Harbin Institute of Technology, Harbin, China","Research Institute of Intelligent Control and Systems Harbin Institute of Technology Harbin China"],"affiliations":[{"raw_affiliation_string":"Research Institute of Intelligent Control and Systems, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"Research Institute of Intelligent Control and Systems Harbin Institute of Technology Harbin China","institution_ids":["https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5100451760"],"corresponding_institution_ids":["https://openalex.org/I204983213"],"apc_list":null,"apc_paid":null,"fwci":25.9185,"has_fulltext":false,"cited_by_count":158,"citation_normalized_percentile":{"value":0.99685969,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10640","display_name":"Spectroscopy and Chemometric Analyses","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/partial-least-squares-regression","display_name":"Partial least squares regression","score":0.6981269121170044},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.6521021127700806},{"id":"https://openalex.org/keywords/projection","display_name":"Projection (relational algebra)","score":0.6272112131118774},{"id":"https://openalex.org/keywords/linear-subspace","display_name":"Linear subspace","score":0.6127408742904663},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.531062126159668},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5130985975265503},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5097560286521912},{"id":"https://openalex.org/keywords/constant-false-alarm-rate","display_name":"Constant false alarm rate","score":0.4888727068901062},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.45175185799598694},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4512910842895508},{"id":"https://openalex.org/keywords/orthographic-projection","display_name":"Orthographic projection","score":0.44559669494628906},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4162125885486603},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3956259489059448},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3393295407295227},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.32712942361831665},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.19871816039085388}],"concepts":[{"id":"https://openalex.org/C22354355","wikidata":"https://www.wikidata.org/wiki/Q422009","display_name":"Partial least squares regression","level":2,"score":0.6981269121170044},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.6521021127700806},{"id":"https://openalex.org/C57493831","wikidata":"https://www.wikidata.org/wiki/Q3134666","display_name":"Projection (relational algebra)","level":2,"score":0.6272112131118774},{"id":"https://openalex.org/C12362212","wikidata":"https://www.wikidata.org/wiki/Q728435","display_name":"Linear subspace","level":2,"score":0.6127408742904663},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.531062126159668},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5130985975265503},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5097560286521912},{"id":"https://openalex.org/C77052588","wikidata":"https://www.wikidata.org/wiki/Q644307","display_name":"Constant false alarm rate","level":2,"score":0.4888727068901062},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.45175185799598694},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4512910842895508},{"id":"https://openalex.org/C175694140","wikidata":"https://www.wikidata.org/wiki/Q980329","display_name":"Orthographic projection","level":2,"score":0.44559669494628906},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4162125885486603},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3956259489059448},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3393295407295227},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.32712942361831665},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.19871816039085388},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tii.2015.2396853","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2015.2396853","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W108857541","https://openalex.org/W1965289315","https://openalex.org/W1965875070","https://openalex.org/W1966863755","https://openalex.org/W1970537494","https://openalex.org/W1976251851","https://openalex.org/W1983963676","https://openalex.org/W1984672166","https://openalex.org/W1989295284","https://openalex.org/W2004186751","https://openalex.org/W2009219152","https://openalex.org/W2016090370","https://openalex.org/W2042810309","https://openalex.org/W2044772846","https://openalex.org/W2045125597","https://openalex.org/W2049154504","https://openalex.org/W2064710808","https://openalex.org/W2080067489","https://openalex.org/W2103711750","https://openalex.org/W2158958729","https://openalex.org/W4232421753"],"related_works":["https://openalex.org/W2391321755","https://openalex.org/W2949110394","https://openalex.org/W2896134808","https://openalex.org/W4289378085","https://openalex.org/W2071055957","https://openalex.org/W4211228991","https://openalex.org/W2353790329","https://openalex.org/W3103861421","https://openalex.org/W2279743781","https://openalex.org/W2774527540"],"abstract_inverted_index":{"Partial":[0],"least":[1],"squares":[2],"(PLS)":[3],"is":[4],"an":[5,83],"efficient":[6],"tool":[7],"widely":[8],"used":[9],"in":[10,28,123],"multivariate":[11],"statistical":[12,128],"process":[13],"monitoring.":[14],"Since":[15],"standard":[16],"PLS":[17,113],"performs":[18],"oblique":[19],"projection":[20,42],"to":[21,43,50,62,104],"input":[22,109],"space":[23,106,110],"X,":[24],"it":[25],"has":[26,139],"limitations":[27],"distinguishing":[29],"quality-related":[30,85,125],"and":[31,95,115,126,144,156],"quality-unrelated":[32,69,127],"faults.":[33],"Several":[34],"postprocessing":[35],"modifications":[36,60],"of":[37,68,165],"PLS,":[38],"such":[39],"as":[40],"total":[41],"latent":[44],"structures":[45],"(T-PLS),":[46],"have":[47,56],"been":[48],"proposed":[49,99,137,167],"solve":[51],"this":[52,78,80],"issue.":[53],"Further":[54],"studies":[55],"found":[57],"that":[58],"these":[59],"fail":[61],"reduce":[63],"false":[64],"alarm":[65],"rates":[66],"(FARs)":[67],"faults":[70],"when":[71],"fault":[72,86],"amplitude":[73],"increases.":[74],"To":[75],"cope":[76],"with":[77,134],"problem,":[79],"paper":[81],"proposes":[82],"enhanced":[84],"detection":[87],"approach":[88,100,138],"based":[89],"on":[90],"orthogonal":[91,103,121],"signal":[92],"correction":[93],"(OSC)":[94],"modified-PLS":[96],"(M-PLS).":[97],"The":[98],"removes":[101],"variation":[102],"output":[105],"Y":[107],"from":[108],"X":[111,118],"before":[112],"modeling,":[114],"further":[116],"decomposes":[117],"into":[119],"two":[120],"subspaces":[122],"which":[124],"indicators":[129],"are":[130],"designed":[131],"separately.":[132],"Compared":[133],"T-PLS,":[135],"the":[136,157,163,166],"a":[140,145,153],"more":[141],"robust":[142],"performance":[143],"lower":[146],"computational":[147],"load.":[148],"Two":[149],"case":[150],"studies,":[151],"including":[152],"numerical":[154],"example":[155],"Tennessee":[158],"Eastman":[159],"(TE)":[160],"process,":[161],"show":[162],"effeteness":[164],"approach.":[168]},"counts_by_year":[{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":11},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":11},{"year":2020,"cited_by_count":22},{"year":2019,"cited_by_count":18},{"year":2018,"cited_by_count":23},{"year":2017,"cited_by_count":16},{"year":2016,"cited_by_count":20},{"year":2015,"cited_by_count":18}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}