{"id":"https://openalex.org/W1971436293","doi":"https://doi.org/10.1109/tii.2014.2370532","title":"New Techniques and Tools for Application-Dependent Testing of FPGA-Based Components","display_name":"New Techniques and Tools for Application-Dependent Testing of FPGA-Based Components","publication_year":2014,"publication_date":"2014-11-13","ids":{"openalex":"https://openalex.org/W1971436293","doi":"https://doi.org/10.1109/tii.2014.2370532","mag":"1971436293"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2014.2370532","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2014.2370532","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088628660","display_name":"Alessandro Cilardo","orcid":"https://orcid.org/0000-0002-1685-8736"},"institutions":[{"id":"https://openalex.org/I71267560","display_name":"University of Naples Federico II","ror":"https://ror.org/05290cv24","country_code":"IT","type":"education","lineage":["https://openalex.org/I71267560"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Alessandro Cilardo","raw_affiliation_strings":["Department of Electrical Engineering and Information Technologies, University of Naples Federico II, Naples, Italy","[Department of Electrical Engineering and Information Technologies, University of Naples Federico II, Naples, Italy]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Information Technologies, University of Naples Federico II, Naples, Italy","institution_ids":["https://openalex.org/I71267560"]},{"raw_affiliation_string":"[Department of Electrical Engineering and Information Technologies, University of Naples Federico II, Naples, Italy]","institution_ids":["https://openalex.org/I71267560"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5088628660"],"corresponding_institution_ids":["https://openalex.org/I71267560"],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":3.502,"has_fulltext":false,"cited_by_count":33,"citation_normalized_percentile":{"value":0.92939898,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"11","issue":"1","first_page":"94","last_page":"103"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7762253284454346},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.712902307510376},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6232866048812866},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6167075037956238},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.5349171757698059},{"id":"https://openalex.org/keywords/plug-in","display_name":"Plug-in","score":0.46409884095191956},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4585987329483032},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4475018084049225},{"id":"https://openalex.org/keywords/suite","display_name":"Suite","score":0.4400988817214966},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4247153401374817},{"id":"https://openalex.org/keywords/bridging","display_name":"Bridging (networking)","score":0.41860684752464294},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.40254074335098267},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.37107163667678833},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23440715670585632},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11402326822280884},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10016599297523499},{"id":"https://openalex.org/keywords/actuator","display_name":"Actuator","score":0.09702008962631226}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7762253284454346},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.712902307510376},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6232866048812866},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6167075037956238},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.5349171757698059},{"id":"https://openalex.org/C4924752","wikidata":"https://www.wikidata.org/wiki/Q184148","display_name":"Plug-in","level":2,"score":0.46409884095191956},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4585987329483032},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4475018084049225},{"id":"https://openalex.org/C79581498","wikidata":"https://www.wikidata.org/wiki/Q1367530","display_name":"Suite","level":2,"score":0.4400988817214966},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4247153401374817},{"id":"https://openalex.org/C174348530","wikidata":"https://www.wikidata.org/wiki/Q188635","display_name":"Bridging (networking)","level":2,"score":0.41860684752464294},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.40254074335098267},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.37107163667678833},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23440715670585632},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11402326822280884},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10016599297523499},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.09702008962631226},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tii.2014.2370532","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2014.2370532","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6100000143051147,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W53227076","https://openalex.org/W132594803","https://openalex.org/W1511688816","https://openalex.org/W1573539205","https://openalex.org/W1595736606","https://openalex.org/W2003998082","https://openalex.org/W2009482268","https://openalex.org/W2019784047","https://openalex.org/W2056302270","https://openalex.org/W2068888771","https://openalex.org/W2073513347","https://openalex.org/W2081448918","https://openalex.org/W2082671050","https://openalex.org/W2083171102","https://openalex.org/W2095754963","https://openalex.org/W2100183523","https://openalex.org/W2102927569","https://openalex.org/W2111139814","https://openalex.org/W2120405975","https://openalex.org/W2136841933","https://openalex.org/W2139357225","https://openalex.org/W2147163354","https://openalex.org/W2153887537","https://openalex.org/W2163865290","https://openalex.org/W2170735577","https://openalex.org/W2765904813","https://openalex.org/W4229497965","https://openalex.org/W4239781949","https://openalex.org/W6630623413","https://openalex.org/W6635272576","https://openalex.org/W6684360715"],"related_works":["https://openalex.org/W47352601","https://openalex.org/W2981957539","https://openalex.org/W4287378204","https://openalex.org/W2545422590","https://openalex.org/W4240705470","https://openalex.org/W2945311252","https://openalex.org/W4231704780","https://openalex.org/W631546281","https://openalex.org/W4206501676","https://openalex.org/W2266220644"],"abstract_inverted_index":{"Field":[0],"programmable":[1],"gate":[2],"array":[3],"(FPGA)":[4],"devices":[5,26],"are":[6],"increasingly":[7],"being":[8],"deployed":[9],"in":[10,91],"industrial":[11],"environments,":[12],"making":[13],"reconfigurable":[14],"hardware":[15],"testing":[16,44],"and":[17,46,82,99,154,181],"reliability":[18],"an":[19,39],"active":[20],"area":[21],"of":[22,58,89,106,137,148,165,173,194,200],"investigation.":[23],"While":[24],"FPGA":[25],"can":[27,53,70],"be":[28,71],"tested":[29],"exhaustively,":[30],"the":[31,48,104,127,134,149,163,166,182,192,195,198,201],"so-called":[32],"application-dependent":[33],"test":[34,124],"(ADT)":[35],"has":[36],"emerged":[37],"as":[38,116,118],"effective":[40],"approach":[41],"ensuring":[42],"reduced":[43],"efforts":[45],"improving":[47,103],"manufacturing":[49],"yield":[50],"since":[51],"it":[52],"selectively":[54],"exclude":[55],"a":[56,62,75,87,130,158,170],"subset":[57],"faults":[59],"not":[60],"affecting":[61],"given":[63],"design.":[64],"In":[65],"addition":[66],"to":[67],"manufacturing,":[68],"ADT":[69,93,123,144,179],"used":[72],"online,":[73],"providing":[74],"solution":[76],"for":[77,121],"fast":[78],"runtime":[79],"fault":[80],"detection":[81],"diagnostics.":[83],"This":[84],"paper":[85,196],"identifies":[86],"number":[88],"issues":[90],"existing":[92],"techniques":[94,180],"which":[95],"limit":[96],"their":[97],"applicability":[98],"proposes":[100],"new":[101,119],"approaches":[102,184],"range":[105],"covered":[107],"faults,":[108,115],"with":[109],"special":[110],"emphasis":[111],"on":[112,157,176],"feedback":[113],"bridging":[114],"well":[117],"algorithms":[120],"generating":[122],"configurations.":[125],"Furthermore,":[126],"work":[128],"introduces":[129],"software":[131],"environment":[132,150],"addressing":[133],"current":[135],"lack":[136],"tools,":[138],"either":[139],"academic":[140],"or":[141],"commercial,":[142],"supporting":[143],"techniques.":[145,203],"The":[146,187],"architecture":[147],"is":[151],"highly":[152],"modular":[153],"extensively":[155],"based":[156,175],"plug-in":[159],"approach.":[160],"To":[161],"demonstrate":[162],"potential":[164],"toolset,":[167],"we":[168],"developed":[169],"complete":[171],"suite":[172],"plug-ins,":[174],"both":[177],"state-of-the-art":[178],"novel":[183],"introduced":[185],"here.":[186],"experimental":[188],"results":[189],"presented":[190],"at":[191],"end":[193],"confirm":[197],"impact":[199],"proposed":[202]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":8},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":6}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}