{"id":"https://openalex.org/W2017159998","doi":"https://doi.org/10.1109/tii.2013.2250294","title":"Automated Inspection of E-Shaped Magnetic Core Elements Using K-tSL-Center Clustering and Active Shape Models","display_name":"Automated Inspection of E-Shaped Magnetic Core Elements Using K-tSL-Center Clustering and Active Shape Models","publication_year":2013,"publication_date":"2013-03-12","ids":{"openalex":"https://openalex.org/W2017159998","doi":"https://doi.org/10.1109/tii.2013.2250294","mag":"2017159998"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2013.2250294","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2013.2250294","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036684787","display_name":"Huijun Gao","orcid":"https://orcid.org/0000-0001-5554-5452"},"institutions":[{"id":"https://openalex.org/I97009856","display_name":"Bohai University","ror":"https://ror.org/01kdzej58","country_code":"CN","type":"education","lineage":["https://openalex.org/I97009856"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huijun Gao","raw_affiliation_strings":["Bohai University, Jinzhou, CN","Res. Inst. ofMechatronics & Autom., Bohai Univ., Jinzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bohai University, Jinzhou, CN","institution_ids":["https://openalex.org/I97009856"]},{"raw_affiliation_string":"Res. Inst. ofMechatronics & Autom., Bohai Univ., Jinzhou, China","institution_ids":["https://openalex.org/I97009856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038748720","display_name":"Changxing Ding","orcid":"https://orcid.org/0000-0001-7232-3181"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Changxing Ding","raw_affiliation_strings":["Research Institute of Intelligent Control and Systems, Harbin Institute of Technology, Harbin, China","[Res. Inst. of Intell. Control & Syst, Harbin Inst. of Technol., Harbin, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute of Intelligent Control and Systems, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"[Res. Inst. of Intell. Control & Syst, Harbin Inst. of Technol., Harbin, China]","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102438019","display_name":"Chunwei Song","orcid":null},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chunwei Song","raw_affiliation_strings":["Research Institute of Intelligent Control and Systems, Harbin Institute of Technology, Harbin, China","[Res. Inst. of Intell. Control & Syst, Harbin Inst. of Technol., Harbin, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute of Intelligent Control and Systems, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"[Res. Inst. of Intell. Control & Syst, Harbin Inst. of Technol., Harbin, China]","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027930701","display_name":"Jiangyuan Mei","orcid":"https://orcid.org/0000-0003-0567-8745"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiangyuan Mei","raw_affiliation_strings":["Research Institute of Intelligent Control and Systems, Harbin Institute of Technology, Harbin, China","[Res. Inst. of Intell. Control & Syst, Harbin Inst. of Technol., Harbin, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute of Intelligent Control and Systems, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"[Res. Inst. of Intell. Control & Syst, Harbin Inst. of Technol., Harbin, China]","institution_ids":["https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":14.3088,"has_fulltext":false,"cited_by_count":44,"citation_normalized_percentile":{"value":0.98893259,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"9","issue":"3","first_page":"1782","last_page":"1789"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.7741146087646484},{"id":"https://openalex.org/keywords/quality-assurance","display_name":"Quality assurance","score":0.6418583393096924},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5655398368835449},{"id":"https://openalex.org/keywords/distortion","display_name":"Distortion (music)","score":0.5473697781562805},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.47784897685050964},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.45029446482658386},{"id":"https://openalex.org/keywords/automated-optical-inspection","display_name":"Automated optical inspection","score":0.41935789585113525},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30674582719802856}],"concepts":[{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.7741146087646484},{"id":"https://openalex.org/C106436119","wikidata":"https://www.wikidata.org/wiki/Q836575","display_name":"Quality assurance","level":3,"score":0.6418583393096924},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5655398368835449},{"id":"https://openalex.org/C126780896","wikidata":"https://www.wikidata.org/wiki/Q899871","display_name":"Distortion (music)","level":4,"score":0.5473697781562805},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.47784897685050964},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.45029446482658386},{"id":"https://openalex.org/C164830781","wikidata":"https://www.wikidata.org/wiki/Q787330","display_name":"Automated optical inspection","level":2,"score":0.41935789585113525},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30674582719802856},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C2778618615","wikidata":"https://www.wikidata.org/wiki/Q4008393","display_name":"External quality assessment","level":2,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tii.2013.2250294","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2013.2250294","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6000000238418579,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1941358455","https://openalex.org/W1985468640","https://openalex.org/W2011430131","https://openalex.org/W2017803656","https://openalex.org/W2020170970","https://openalex.org/W2026547571","https://openalex.org/W2030654976","https://openalex.org/W2038952578","https://openalex.org/W2049694710","https://openalex.org/W2054904291","https://openalex.org/W2065553564","https://openalex.org/W2071315556","https://openalex.org/W2090321726","https://openalex.org/W2094510831","https://openalex.org/W2097137218","https://openalex.org/W2101566415","https://openalex.org/W2118541299","https://openalex.org/W2120026449","https://openalex.org/W2124792803","https://openalex.org/W2125150158","https://openalex.org/W2133059825","https://openalex.org/W2140970590","https://openalex.org/W2153578100","https://openalex.org/W2153810084","https://openalex.org/W2158659101","https://openalex.org/W2162280586","https://openalex.org/W2164653394","https://openalex.org/W2168553594","https://openalex.org/W2951959446","https://openalex.org/W6677835545","https://openalex.org/W6680096826"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W1891287906","https://openalex.org/W2036807459","https://openalex.org/W2775347418","https://openalex.org/W2541128885","https://openalex.org/W2033534994","https://openalex.org/W2414946225","https://openalex.org/W2080322084","https://openalex.org/W1547662505","https://openalex.org/W2116241442"],"abstract_inverted_index":{"Automated":[0],"optical":[1],"inspection":[2,15],"(AOI)":[3],"has":[4],"been":[5],"widely":[6],"used":[7],"in":[8,16,25,94,108,135],"industrial":[9],"Quality":[10],"Assurance":[11],"(QA)":[12],"procedures.":[13],"Multi-task":[14],"high-speed":[17],"AOI":[18,35,117],"systems":[19],"is":[20,42,87],"becoming":[21],"a":[22,62,80],"significant":[23],"problem":[24],"the":[26,31,69,72,115,123],"design.":[27],"In":[28],"this":[29,56,59,136],"paper,":[30],"design":[32],"of":[33,71],"an":[34,102],"system":[36],"for":[37],"E-shaped":[38,103],"magnetic":[39],"core":[40],"elements":[41],"briefly":[43],"described":[44],"and":[45,76,130],"several":[46],"novel":[47],"algorithms":[48],"are":[49,98,112,126],"proposed":[50,124],"to":[51,67,89],"realize":[52],"defects":[53],"detection":[54,93],"by":[55,114],"system.":[57,118],"First,":[58],"paper":[60],"proposes":[61],"robust":[63,129],"k-tSL-center":[64],"clustering":[65],"method":[66,86],"classify":[68],"interfaces":[70],"element":[73],"into":[74],"normal":[75],"damaged":[77],"areas.":[78],"Second,":[79],"modified":[81],"Active":[82],"Shape":[83],"Model":[84],"(ASM)":[85],"adopted":[88],"perform":[90],"shape":[91],"distortion":[92],"real-time.":[95],"Performance":[96],"evaluations":[97],"carried":[99],"out":[100],"on":[101],"Magnetic":[104],"Core":[105],"Image":[106],"Database,":[107],"which":[109],"all":[110],"images":[111],"captured":[113],"designed":[116],"Experimental":[119],"results":[120],"show":[121],"that":[122],"methods":[125,134],"more":[127],"efficient,":[128],"accurate":[131],"than":[132],"state-of-the-art":[133],"application.":[137]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":7},{"year":2016,"cited_by_count":12},{"year":2015,"cited_by_count":5},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}